JPS5952878A - 半導体装置の製造方法 - Google Patents
半導体装置の製造方法Info
- Publication number
- JPS5952878A JPS5952878A JP57163462A JP16346282A JPS5952878A JP S5952878 A JPS5952878 A JP S5952878A JP 57163462 A JP57163462 A JP 57163462A JP 16346282 A JP16346282 A JP 16346282A JP S5952878 A JPS5952878 A JP S5952878A
- Authority
- JP
- Japan
- Prior art keywords
- polycrystalline silicon
- gate electrode
- mask
- gate
- silicon
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57163462A JPS5952878A (ja) | 1982-09-20 | 1982-09-20 | 半導体装置の製造方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57163462A JPS5952878A (ja) | 1982-09-20 | 1982-09-20 | 半導体装置の製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5952878A true JPS5952878A (ja) | 1984-03-27 |
| JPH0481327B2 JPH0481327B2 (cs) | 1992-12-22 |
Family
ID=15774333
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57163462A Granted JPS5952878A (ja) | 1982-09-20 | 1982-09-20 | 半導体装置の製造方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5952878A (cs) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60244074A (ja) * | 1984-05-18 | 1985-12-03 | Fujitsu Ltd | 半導体装置及びその製造方法 |
| JPS60245176A (ja) * | 1984-05-18 | 1985-12-04 | Matsushita Electric Ind Co Ltd | Mis型電界効果トランジスタの製造方法 |
| JPS6229169A (ja) * | 1985-07-30 | 1987-02-07 | Sony Corp | Mos半導体装置の製造方法 |
| JPS6342161A (ja) * | 1986-08-07 | 1988-02-23 | Toshiba Corp | Cmos型半導体装置の製造方法 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5283073A (en) * | 1975-12-29 | 1977-07-11 | Matsushita Electric Ind Co Ltd | Production of semiconductor device |
| JPS5444482A (en) * | 1977-09-14 | 1979-04-07 | Matsushita Electric Ind Co Ltd | Mos type semiconductor device and its manufacture |
| JPS57106169A (en) * | 1980-12-24 | 1982-07-01 | Fujitsu Ltd | Manufacture of semiconductor device |
-
1982
- 1982-09-20 JP JP57163462A patent/JPS5952878A/ja active Granted
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5283073A (en) * | 1975-12-29 | 1977-07-11 | Matsushita Electric Ind Co Ltd | Production of semiconductor device |
| JPS5444482A (en) * | 1977-09-14 | 1979-04-07 | Matsushita Electric Ind Co Ltd | Mos type semiconductor device and its manufacture |
| JPS57106169A (en) * | 1980-12-24 | 1982-07-01 | Fujitsu Ltd | Manufacture of semiconductor device |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60244074A (ja) * | 1984-05-18 | 1985-12-03 | Fujitsu Ltd | 半導体装置及びその製造方法 |
| JPS60245176A (ja) * | 1984-05-18 | 1985-12-04 | Matsushita Electric Ind Co Ltd | Mis型電界効果トランジスタの製造方法 |
| JPS6229169A (ja) * | 1985-07-30 | 1987-02-07 | Sony Corp | Mos半導体装置の製造方法 |
| JPS6342161A (ja) * | 1986-08-07 | 1988-02-23 | Toshiba Corp | Cmos型半導体装置の製造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0481327B2 (cs) | 1992-12-22 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US3913211A (en) | Method of MOS transistor manufacture | |
| US4268321A (en) | Method of fabricating a semiconductor device having channel stoppers | |
| US4502202A (en) | Method for fabricating overlaid device in stacked CMOS | |
| US4103415A (en) | Insulated-gate field-effect transistor with self-aligned contact hole to source or drain | |
| CA1063731A (en) | Method for making transistor structures having impurity regions separated by a short lateral distance | |
| EP0036573A2 (en) | Method for making a polysilicon conductor structure | |
| US4169270A (en) | Insulated-gate field-effect transistor with self-aligned contact hole to source or drain | |
| KR940008571B1 (ko) | 반도체장치의 제조방법 | |
| US4553314A (en) | Method for making a semiconductor device | |
| EP0023528A1 (en) | Double diffused transistor structure and method of making same | |
| JP2657588B2 (ja) | 絶縁ゲイト型半導体装置およびその作製方法 | |
| JPS5952878A (ja) | 半導体装置の製造方法 | |
| JP2720911B2 (ja) | 半導体装置用基板表面を用意する方法 | |
| US6329249B1 (en) | Method for fabricating a semiconductor device having different gate oxide layers | |
| JPH02130852A (ja) | 半導体装置 | |
| JPH0231468A (ja) | 浮遊ゲート型半導体記憶装置の製造方法 | |
| JPS59231863A (ja) | 絶縁ゲ−ト半導体装置とその製造法 | |
| KR890003216B1 (ko) | 디램셀의 제조방법 | |
| JPS6151974A (ja) | 半導体装置の製造方法 | |
| JPS5928993B2 (ja) | 半導体装置とその製造方法 | |
| KR0170338B1 (ko) | 반도체 장치의 게이트 패턴 형성방법 | |
| KR960012262B1 (ko) | 모스(mos) 트랜지스터 제조방법 | |
| JPH04360539A (ja) | 半導体装置の製造方法 | |
| JPS6092657A (ja) | 半導体装置 | |
| JPS6129151B2 (cs) |