JPS59219060A - 電子交換試験システム - Google Patents

電子交換試験システム

Info

Publication number
JPS59219060A
JPS59219060A JP9350483A JP9350483A JPS59219060A JP S59219060 A JPS59219060 A JP S59219060A JP 9350483 A JP9350483 A JP 9350483A JP 9350483 A JP9350483 A JP 9350483A JP S59219060 A JPS59219060 A JP S59219060A
Authority
JP
Japan
Prior art keywords
test
condition data
data
procedure
result
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9350483A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0318788B2 (enExample
Inventor
Mitsusuke Matsumoto
松本　允介
Shinji Takamura
高村　信二
Shinichi Machida
町田　信一
Kenji Seike
清家　健志
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP9350483A priority Critical patent/JPS59219060A/ja
Publication of JPS59219060A publication Critical patent/JPS59219060A/ja
Publication of JPH0318788B2 publication Critical patent/JPH0318788B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M3/00—Automatic or semi-automatic exchanges
    • H04M3/22—Arrangements for supervision, monitoring or testing
    • H04M3/26—Arrangements for supervision, monitoring or testing with means for applying test signals or for measuring

Landscapes

  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Monitoring And Testing Of Exchanges (AREA)
  • Exchange Systems With Centralized Control (AREA)
JP9350483A 1983-05-27 1983-05-27 電子交換試験システム Granted JPS59219060A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9350483A JPS59219060A (ja) 1983-05-27 1983-05-27 電子交換試験システム

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9350483A JPS59219060A (ja) 1983-05-27 1983-05-27 電子交換試験システム

Publications (2)

Publication Number Publication Date
JPS59219060A true JPS59219060A (ja) 1984-12-10
JPH0318788B2 JPH0318788B2 (enExample) 1991-03-13

Family

ID=14084175

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9350483A Granted JPS59219060A (ja) 1983-05-27 1983-05-27 電子交換試験システム

Country Status (1)

Country Link
JP (1) JPS59219060A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62279760A (ja) * 1986-05-28 1987-12-04 Nec Corp 蓄積プログラム制御電子交換システムの入出力装置系信号シミユレ−タ

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5521688A (en) * 1978-08-04 1980-02-15 Nec Corp Parallel automatic test system

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5521688A (en) * 1978-08-04 1980-02-15 Nec Corp Parallel automatic test system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62279760A (ja) * 1986-05-28 1987-12-04 Nec Corp 蓄積プログラム制御電子交換システムの入出力装置系信号シミユレ−タ

Also Published As

Publication number Publication date
JPH0318788B2 (enExample) 1991-03-13

Similar Documents

Publication Publication Date Title
US4860190A (en) Computer system for controlling virtual machines
EP0217922B1 (en) An array for simulating computer functions for large computer systems
US5404477A (en) Extended memory address conversion and data transfer control system
JP2001099901A (ja) テストパタン圧縮方法とテストパタン圧縮装置及びシステム並びに記録媒体
CN115470060A (zh) 硬件板卡、测试设备、测试系统和同步测试方法
US7319947B1 (en) Method and apparatus for performing distributed simulation utilizing a simulation backplane
JPS59219060A (ja) 電子交換試験システム
US6199143B1 (en) Computing system with fast data transfer of CPU state related information
US5796753A (en) High speed test pattern transfer apparatus for semiconductor test system
WO1991004535A1 (en) Memory-module for a memory-managed computer system
JP3192890B2 (ja) 並列試験装置
JP2526265B2 (ja) 多重試験方式
Siegel et al. Parallel memory system for a partitionable SIMD/MIMD machine
JPH0697940A (ja) Ｌａｎ接続処理装置
JPH03130839A (ja) オンラインシミュレーション方式
JPH03248255A (ja) データ転送方法およびシステム
JP2927049B2 (ja) 画像処理装置
KR0154573B1 (ko) 칠 시뮬레이션 환경에서의 프로세스간 통신 방법
KR880000230B1 (ko) 테이터 처리 시스템을 위한 입출력 멀티플렉서
HAHN JR et al. Maintenance and Diagnostic Subsystem
Tuomenoksa et al. Preloading Schemes for the PASM Parallel Memory System.
EP0088839A1 (en) Input/output multiplexer
JPH02135548A (ja) プログラムのテスト処理システム
Hahn Jr et al. Safeguard Data‐Processing System: Maintenance and Diagnostic Subsystem
JPH06348786A (ja) 実チップボードの自動配線システム