JPS59211953A - 2次電子分光装置 - Google Patents
2次電子分光装置Info
- Publication number
- JPS59211953A JPS59211953A JP58086117A JP8611783A JPS59211953A JP S59211953 A JPS59211953 A JP S59211953A JP 58086117 A JP58086117 A JP 58086117A JP 8611783 A JP8611783 A JP 8611783A JP S59211953 A JPS59211953 A JP S59211953A
- Authority
- JP
- Japan
- Prior art keywords
- electrode
- secondary electron
- deceleration
- spectroscopic
- electron
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000605 extraction Methods 0.000 claims description 21
- 238000010894 electron beam technology Methods 0.000 claims description 11
- 238000004611 spectroscopical analysis Methods 0.000 claims description 10
- 238000000562 secondary electron spectroscopy Methods 0.000 claims description 3
- 238000005259 measurement Methods 0.000 description 20
- 238000010586 diagram Methods 0.000 description 7
- 230000005684 electric field Effects 0.000 description 7
- 230000003287 optical effect Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 1
- 230000005685 electric field effect Effects 0.000 description 1
- 239000000284 extract Substances 0.000 description 1
- 230000005669 field effect Effects 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 230000001629 suppression Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
- H01J49/46—Static spectrometers
- H01J49/48—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter
- H01J49/484—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter with spherical mirrors
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Electron Tubes For Measurement (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58086117A JPS59211953A (ja) | 1983-05-17 | 1983-05-17 | 2次電子分光装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58086117A JPS59211953A (ja) | 1983-05-17 | 1983-05-17 | 2次電子分光装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS59211953A true JPS59211953A (ja) | 1984-11-30 |
JPH0357570B2 JPH0357570B2 (enrdf_load_stackoverflow) | 1991-09-02 |
Family
ID=13877747
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP58086117A Granted JPS59211953A (ja) | 1983-05-17 | 1983-05-17 | 2次電子分光装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS59211953A (enrdf_load_stackoverflow) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5871542A (ja) * | 1981-09-30 | 1983-04-28 | シ−メンス・アクチエンゲゼルシヤフト | 二次電子スペクトロメ−タ |
JPS5871543A (ja) * | 1981-09-30 | 1983-04-28 | シ−メンス・アクチエンゲゼルシヤフト | 静電逆電界型スペクトロメータ |
-
1983
- 1983-05-17 JP JP58086117A patent/JPS59211953A/ja active Granted
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5871542A (ja) * | 1981-09-30 | 1983-04-28 | シ−メンス・アクチエンゲゼルシヤフト | 二次電子スペクトロメ−タ |
JPS5871543A (ja) * | 1981-09-30 | 1983-04-28 | シ−メンス・アクチエンゲゼルシヤフト | 静電逆電界型スペクトロメータ |
Also Published As
Publication number | Publication date |
---|---|
JPH0357570B2 (enrdf_load_stackoverflow) | 1991-09-02 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
TRDD | Decision of grant or rejection written | ||
EXPY | Cancellation because of completion of term |