JPH0216472B2 - - Google Patents

Info

Publication number
JPH0216472B2
JPH0216472B2 JP55148986A JP14898680A JPH0216472B2 JP H0216472 B2 JPH0216472 B2 JP H0216472B2 JP 55148986 A JP55148986 A JP 55148986A JP 14898680 A JP14898680 A JP 14898680A JP H0216472 B2 JPH0216472 B2 JP H0216472B2
Authority
JP
Japan
Prior art keywords
electrode
sample
secondary electrons
voltage
deceleration
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP55148986A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5772071A (en
Inventor
Akio Ito
Yoshiaki Goto
Toshihiro Ishizuka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP55148986A priority Critical patent/JPS5772071A/ja
Publication of JPS5772071A publication Critical patent/JPS5772071A/ja
Publication of JPH0216472B2 publication Critical patent/JPH0216472B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/305—Contactless testing using electron beams

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Tests Of Electronic Circuits (AREA)
JP55148986A 1980-10-24 1980-10-24 Voltage measuring device Granted JPS5772071A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55148986A JPS5772071A (en) 1980-10-24 1980-10-24 Voltage measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55148986A JPS5772071A (en) 1980-10-24 1980-10-24 Voltage measuring device

Publications (2)

Publication Number Publication Date
JPS5772071A JPS5772071A (en) 1982-05-06
JPH0216472B2 true JPH0216472B2 (enrdf_load_stackoverflow) 1990-04-17

Family

ID=15465133

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55148986A Granted JPS5772071A (en) 1980-10-24 1980-10-24 Voltage measuring device

Country Status (1)

Country Link
JP (1) JPS5772071A (enrdf_load_stackoverflow)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5949187B2 (ja) * 1976-09-30 1984-12-01 横浜ゴム株式会社 大型ホ−スの加硫後処理方法および装置
JPS54134570U (enrdf_load_stackoverflow) * 1978-03-10 1979-09-18

Also Published As

Publication number Publication date
JPS5772071A (en) 1982-05-06

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