JPS59207496A - 半導体メモリ不良ビット救済解析装置 - Google Patents

半導体メモリ不良ビット救済解析装置

Info

Publication number
JPS59207496A
JPS59207496A JP58080897A JP8089783A JPS59207496A JP S59207496 A JPS59207496 A JP S59207496A JP 58080897 A JP58080897 A JP 58080897A JP 8089783 A JP8089783 A JP 8089783A JP S59207496 A JPS59207496 A JP S59207496A
Authority
JP
Japan
Prior art keywords
fail
data
line
memory
matrix
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58080897A
Other languages
English (en)
Japanese (ja)
Other versions
JPH03720B2 (enrdf_load_stackoverflow
Inventor
Ikuo Kawaguchi
川口　郁夫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP58080897A priority Critical patent/JPS59207496A/ja
Priority to EP84105285A priority patent/EP0125633B1/en
Priority to DE8484105285T priority patent/DE3482901D1/de
Priority to US06/609,445 priority patent/US4628509A/en
Publication of JPS59207496A publication Critical patent/JPS59207496A/ja
Publication of JPH03720B2 publication Critical patent/JPH03720B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/72—Masking faults in memories by using spares or by reconfiguring with optimized replacement algorithms

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
JP58080897A 1983-05-11 1983-05-11 半導体メモリ不良ビット救済解析装置 Granted JPS59207496A (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP58080897A JPS59207496A (ja) 1983-05-11 1983-05-11 半導体メモリ不良ビット救済解析装置
EP84105285A EP0125633B1 (en) 1983-05-11 1984-05-10 Testing apparatus for redundant memory
DE8484105285T DE3482901D1 (de) 1983-05-11 1984-05-10 Pruefgeraet fuer redundanzspeicher.
US06/609,445 US4628509A (en) 1983-05-11 1984-05-11 Testing apparatus for redundant memory

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58080897A JPS59207496A (ja) 1983-05-11 1983-05-11 半導体メモリ不良ビット救済解析装置

Publications (2)

Publication Number Publication Date
JPS59207496A true JPS59207496A (ja) 1984-11-24
JPH03720B2 JPH03720B2 (enrdf_load_stackoverflow) 1991-01-08

Family

ID=13731149

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58080897A Granted JPS59207496A (ja) 1983-05-11 1983-05-11 半導体メモリ不良ビット救済解析装置

Country Status (1)

Country Link
JP (1) JPS59207496A (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0391200A (ja) * 1989-08-30 1991-04-16 Internatl Business Mach Corp <Ibm> メモリ障害情報を捕捉し圧縮する装置及び方法
JP2001216797A (ja) * 2000-01-28 2001-08-10 Samsung Electronics Co Ltd 内蔵メモリのための自己復旧回路を具備する集積回路半導体装置及びメモリ復旧方法
US7000156B2 (en) 2002-05-22 2006-02-14 Mitsubishi Denki Kabushiki Kaisha Devices for storing and accumulating defect information, semiconductor device and device for testing the same

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5634198A (en) * 1979-08-27 1981-04-06 Nippon Telegr & Teleph Corp <Ntt> Releaving method of deficient bit of semiconductor memory
JPS57130295A (en) * 1981-02-03 1982-08-12 Nec Corp Inspecting device for ic memory

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5634198A (en) * 1979-08-27 1981-04-06 Nippon Telegr & Teleph Corp <Ntt> Releaving method of deficient bit of semiconductor memory
JPS57130295A (en) * 1981-02-03 1982-08-12 Nec Corp Inspecting device for ic memory

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0391200A (ja) * 1989-08-30 1991-04-16 Internatl Business Mach Corp <Ibm> メモリ障害情報を捕捉し圧縮する装置及び方法
JP2001216797A (ja) * 2000-01-28 2001-08-10 Samsung Electronics Co Ltd 内蔵メモリのための自己復旧回路を具備する集積回路半導体装置及びメモリ復旧方法
US7000156B2 (en) 2002-05-22 2006-02-14 Mitsubishi Denki Kabushiki Kaisha Devices for storing and accumulating defect information, semiconductor device and device for testing the same

Also Published As

Publication number Publication date
JPH03720B2 (enrdf_load_stackoverflow) 1991-01-08

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