JPS59137855A - 質量分析装置 - Google Patents

質量分析装置

Info

Publication number
JPS59137855A
JPS59137855A JP58012342A JP1234283A JPS59137855A JP S59137855 A JPS59137855 A JP S59137855A JP 58012342 A JP58012342 A JP 58012342A JP 1234283 A JP1234283 A JP 1234283A JP S59137855 A JPS59137855 A JP S59137855A
Authority
JP
Japan
Prior art keywords
magnetic field
electric field
sweeping
sweep
curve
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58012342A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0319947B2 (de
Inventor
Hirosuke Maruyama
丸山　裕助
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Jeol Ltd
Nihon Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd, Nihon Denshi KK filed Critical Jeol Ltd
Priority to JP58012342A priority Critical patent/JPS59137855A/ja
Publication of JPS59137855A publication Critical patent/JPS59137855A/ja
Publication of JPH0319947B2 publication Critical patent/JPH0319947B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/022—Circuit arrangements, e.g. for generating deviation currents or voltages ; Components associated with high voltage supply

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP58012342A 1983-01-28 1983-01-28 質量分析装置 Granted JPS59137855A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58012342A JPS59137855A (ja) 1983-01-28 1983-01-28 質量分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58012342A JPS59137855A (ja) 1983-01-28 1983-01-28 質量分析装置

Publications (2)

Publication Number Publication Date
JPS59137855A true JPS59137855A (ja) 1984-08-08
JPH0319947B2 JPH0319947B2 (de) 1991-03-18

Family

ID=11802606

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58012342A Granted JPS59137855A (ja) 1983-01-28 1983-01-28 質量分析装置

Country Status (1)

Country Link
JP (1) JPS59137855A (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63259955A (ja) * 1987-04-15 1988-10-27 Jeol Ltd ウイ−ンフイルタを用いた二重収束質量分析装置

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4567472B2 (ja) * 2005-01-12 2010-10-20 株式会社エヌ・ティ・ティ・ドコモ 定額制ユーザのデータ通信規制方法およびデータ通信規制制御装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56128558A (en) * 1980-03-12 1981-10-08 Hitachi Ltd Double focusing mass spectrograph

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56128558A (en) * 1980-03-12 1981-10-08 Hitachi Ltd Double focusing mass spectrograph

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63259955A (ja) * 1987-04-15 1988-10-27 Jeol Ltd ウイ−ンフイルタを用いた二重収束質量分析装置

Also Published As

Publication number Publication date
JPH0319947B2 (de) 1991-03-18

Similar Documents

Publication Publication Date Title
GB1525488A (en) Method and apparatus for spectrometric analysis of fine grained minerals and other substances using an electron bea
US5021664A (en) Method and apparatus for correcting the energy resolution of ionizing radiation spectrometers
US4121292A (en) Electro-optical gaging system having dual cameras on a scanner
US5128545A (en) Method and apparatus for background correction in analysis of a specimen surface
US4808818A (en) Method of operating a mass spectrometer and a mass spectrometer for carrying out the method
JPS59137855A (ja) 質量分析装置
JP2004361367A (ja) プラズマイオン源質量分析装置を用いた同位体比分析
GB1597564A (en) Electro-optical gauging system
US3809482A (en) Signal-compensating system for measuring machines, in which photographic plates are examined by a photo-electric method
JP2616637B2 (ja) 質量分析方法
JPS6350749A (ja) 四重極形質量分析計
JP2956713B2 (ja) Ｘ線分析方法
JP4215664B2 (ja) 欠陥検出装置
JP2587883B2 (ja) 特性ｘ線の角度分解スペクトラム測定方法
JP3123860B2 (ja) 波長分散型分光器とエネルギ分散型分光器を用いた元素分析装置
JP2002340827A (ja) 電子分光装置
JPS6217651A (ja) 質量分析装置の定量デ−タ取得法
JPH01319238A (ja) Ｘ線分光分析装置
JPH0752163B2 (ja) 波長分散型ｘ線分光器による簡易定量分析法
JPS62241252A (ja) リンクドスキヤン質量分析方法
SU964450A2 (ru) Устройство дл контрол измерительных приборов с визуальным представлением выходной информации
CA1163022A (en) Apparatus for recording pulse height distribution in a fluorescent x-ray film thickness meter
JPH0782828B2 (ja) 微小部分分析装置
JPH0436949A (ja) 質量分析装置のスペクトル出力インターフエイス
JPS6021444A (ja) 質量分析装置