JPS5885998A - サンプルアンドホ−ルド回路およびスイツチコンデンサ積分回路およびサンプルアンドホ−ルド回路の自動ゼロ調節方法 - Google Patents

サンプルアンドホ−ルド回路およびスイツチコンデンサ積分回路およびサンプルアンドホ−ルド回路の自動ゼロ調節方法

Info

Publication number
JPS5885998A
JPS5885998A JP57189353A JP18935382A JPS5885998A JP S5885998 A JPS5885998 A JP S5885998A JP 57189353 A JP57189353 A JP 57189353A JP 18935382 A JP18935382 A JP 18935382A JP S5885998 A JPS5885998 A JP S5885998A
Authority
JP
Japan
Prior art keywords
amplifier
terminal
input terminal
capacitor
negative input
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57189353A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0222476B2 (enExample
Inventor
チヤ−ルズ・エイチ・ル−カス
ラニ−・エル・レ−ウイン
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Raytheon Co
Original Assignee
Hughes Aircraft Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hughes Aircraft Co filed Critical Hughes Aircraft Co
Publication of JPS5885998A publication Critical patent/JPS5885998A/ja
Publication of JPH0222476B2 publication Critical patent/JPH0222476B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C27/00Electric analogue stores, e.g. for storing instantaneous values
    • G11C27/02Sample-and-hold arrangements
    • G11C27/024Sample-and-hold arrangements using a capacitive memory element
    • G11C27/026Sample-and-hold arrangements using a capacitive memory element associated with an amplifier

Landscapes

  • Amplifiers (AREA)
  • Analogue/Digital Conversion (AREA)
JP57189353A 1981-10-30 1982-10-29 サンプルアンドホ−ルド回路およびスイツチコンデンサ積分回路およびサンプルアンドホ−ルド回路の自動ゼロ調節方法 Granted JPS5885998A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US06/316,453 US4439693A (en) 1981-10-30 1981-10-30 Sample and hold circuit with improved offset compensation
US316453 1981-10-30

Publications (2)

Publication Number Publication Date
JPS5885998A true JPS5885998A (ja) 1983-05-23
JPH0222476B2 JPH0222476B2 (enExample) 1990-05-18

Family

ID=23229113

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57189353A Granted JPS5885998A (ja) 1981-10-30 1982-10-29 サンプルアンドホ−ルド回路およびスイツチコンデンサ積分回路およびサンプルアンドホ−ルド回路の自動ゼロ調節方法

Country Status (4)

Country Link
US (1) US4439693A (enExample)
EP (1) EP0078601B1 (enExample)
JP (1) JPS5885998A (enExample)
DE (1) DE3279140D1 (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60154399A (ja) * 1984-01-24 1985-08-14 Nippon Telegr & Teleph Corp <Ntt> サンプルホ−ルド回路
JPH0334628A (ja) * 1989-06-30 1991-02-14 Yokogawa Electric Corp オーバーサンプリングa/d変換器
JP2009545188A (ja) * 2006-03-21 2009-12-17 ケンブリッジ アナログ テクノロジー,エルエルシー サンプルデータ回路のオフセット取り消し

Families Citing this family (53)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5979496A (ja) * 1982-10-29 1984-05-08 Nec Corp サンプルド・デ−タ回路
JPS6081685A (ja) * 1983-10-11 1985-05-09 Toshiba Corp オ−ト・ゼロ積分器
US4587443A (en) * 1984-08-27 1986-05-06 Signetics Corporation Auto-zero sample and hold circuit
US4642489A (en) * 1984-10-03 1987-02-10 National Semiconductor Corporation Sampled data amplitude linear phase detector
US4786831A (en) * 1984-12-17 1988-11-22 Hughes Aircraft Company Integrating capacitively coupled transimpedance amplifier
US4978872A (en) * 1984-12-17 1990-12-18 Hughes Aircraft Company Integrating capactively coupled transimpedance amplifier
US4565971A (en) * 1985-01-28 1986-01-21 Motorola, Inc. Parasitic insensitive auto-zeroed operational amplifier
CA1227247A (en) * 1985-02-05 1987-09-22 Thomas M. Dauphinee Liquid conductivity measuring circuit
NL8502071A (nl) * 1985-07-18 1987-02-16 Philips Nv Vermenigvuldigschakeling van het geschakelde capaciteiten type.
US4714843A (en) * 1985-08-30 1987-12-22 Thomson Components-Mostek Corporation Semiconductor chip power supply monitor circuit arrangement
AT386991B (de) * 1986-06-11 1988-11-10 Marek Jiri Kapazitiver naeherungsgeber fuer kraftfahrzeuge
US4691125A (en) * 1986-10-03 1987-09-01 Motorola, Inc. One hundred percent duty cycle sample-and-hold circuit
US4804863A (en) * 1986-11-12 1989-02-14 Crystal Semiconductor Corporation Method and circuitry for generating reference voltages
US4749953A (en) * 1986-12-24 1988-06-07 Zdzislaw Gulczynski Operational amplifier or comparator circuit with minimized offset voltage and drift
US4794333A (en) * 1987-02-04 1988-12-27 General Electric Company Continuous switched-capacitor dual slope watthour meter circuit with charge injection offset compensation
US4794247A (en) * 1987-09-18 1988-12-27 Santa Barbara Research Center Read-out amplifier for photovoltaic detector
US4948992A (en) * 1988-10-31 1990-08-14 International Business Machines Corporation Static method to negate offset voltages in CMOS operational amplifiers
US5027003A (en) * 1989-12-29 1991-06-25 Texas Instruments Incorporated Read/write switching circuit
US5142284A (en) * 1990-04-25 1992-08-25 Tektronix, Inc. Sample and hold with intermediate reset voltage outside of the magnitude range of the input
US5111072A (en) * 1990-08-29 1992-05-05 Ncr Corporation Sample-and-hold switch with low on resistance and reduced charge injection
US5258664A (en) * 1991-07-05 1993-11-02 Silicon Systems, Inc. Operational amplifier with self contained sample and hold and auto zero
JP3359046B2 (ja) * 1991-11-29 2002-12-24 キヤノン株式会社 音声出力装置
NL9200327A (nl) * 1992-02-21 1993-09-16 Sierra Semiconductor Bv Offset-gecompenseerde bemonsterinrichting en werkwijze voor de bediening daarvan.
JPH0645875A (ja) * 1992-07-24 1994-02-18 Nec Corp スイッチトキャパシタ回路
GB9218987D0 (en) * 1992-09-08 1992-10-21 Fujitsu Ltd Voltage storage circuits
US5479130A (en) * 1994-02-15 1995-12-26 Analog Devices, Inc. Auto-zero switched-capacitor integrator
US5600322A (en) * 1994-04-29 1997-02-04 Analog Devices, Inc. Low-voltage CMOS analog-to-digital converter
US5600275A (en) * 1994-04-29 1997-02-04 Analog Devices, Inc. Low-voltage CMOS comparator with offset cancellation
EP0757861B1 (en) * 1994-04-29 1998-12-30 Analog Devices, Inc. Charge redistribution analog-to-digital converter with system calibration
US5617093A (en) * 1994-09-30 1997-04-01 Imp, Inc. Switched capacitor analog circuits with low input capacitance
US5668551A (en) * 1995-01-18 1997-09-16 Analog Devices, Inc. Power-up calibration of charge redistribution analog-to-digital converter
US5621409A (en) * 1995-02-15 1997-04-15 Analog Devices, Inc. Analog-to-digital conversion with multiple charge balance conversions
JP3208299B2 (ja) * 1995-02-20 2001-09-10 シャープ株式会社 アクティブマトリクス方式液晶駆動回路
GB2298329B (en) * 1995-02-21 2000-02-16 Plessey Semiconductors Ltd Voltage offset compensation circuit
KR100226594B1 (ko) * 1995-09-18 1999-10-15 니시무로 타이죠 전자회로 및 이를 이용한 필터장치
US6351283B1 (en) * 1995-10-03 2002-02-26 Omnivision Technologies, Inc. Charge amplifier for MOS imaging array
US5724095A (en) * 1995-10-03 1998-03-03 Omnivision Technologies Inc. Charge amplifier for MOS imaging array and method of making same
DE19653192C2 (de) * 1996-12-19 1999-01-07 Sgs Thomson Microelectronics Monolithisch integrierte Signalverarbeitungsschaltung
GB9706943D0 (en) 1997-04-04 1997-05-21 Sharp Kk Active matrix device circuits
DE10010457A1 (de) * 2000-03-03 2001-09-20 Infineon Technologies Ag Integrierter Speicher mit Speicherzellen mit magnetoresistivem Speichereffekt
JP4336066B2 (ja) * 2001-07-11 2009-09-30 株式会社豊田中央研究所 静電容量型センサ装置
US7052180B2 (en) * 2002-01-04 2006-05-30 Kelvin Shih LED junction temperature tester
US7282991B2 (en) * 2004-07-12 2007-10-16 Broadcom Corporation On-chip amplifier/line driver compensation circuit
US7002506B1 (en) * 2004-12-23 2006-02-21 Texas Instruments Incorporated Providing pipe line ADC with acceptable bit error and power efficiency combination
US7136000B1 (en) * 2005-06-17 2006-11-14 National Semiconductor Corporation Selective offset adjustment of a track and hold circuit
US8305131B2 (en) * 2006-03-21 2012-11-06 Maxim Integrated, Inc. Passive offset and overshoot cancellation for sampled-data circuits
US8558852B2 (en) * 2006-11-30 2013-10-15 Seiko Epson Corporation Source driver, electro-optical device, and electronic instrument
CN101986559A (zh) * 2009-07-29 2011-03-16 比亚迪股份有限公司 一种模拟信号处理电路
KR102071296B1 (ko) * 2013-09-30 2020-03-02 주식회사 실리콘웍스 디스플레이 패널의 소스 드라이버
TWI527456B (zh) * 2013-11-27 2016-03-21 Univ Nat Chi Nan Array read device, dual function read device and detection circuit
CN110349535B (zh) * 2018-04-02 2021-01-12 联咏科技股份有限公司 增益放大器
CN114401007A (zh) * 2021-12-23 2022-04-26 矽力杰半导体技术(杭州)有限公司 采样保持放大器
CN118749091A (zh) * 2022-02-04 2024-10-08 梅吉特有限公司 数据集中系统

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3050673A (en) * 1960-10-14 1962-08-21 Ibm Voltage holding circuit
US3667055A (en) * 1969-06-28 1972-05-30 Iwatsu Electric Co Ltd Integrating network using at least one d-c amplifier
US4163947A (en) * 1977-09-23 1979-08-07 Analogic Corporation Current and voltage autozeroing integrator
US4151429A (en) * 1977-10-03 1979-04-24 Northern Telecom Limited Differential charge sensing circuit for MOS devices
US4306196A (en) * 1980-01-14 1981-12-15 Bell Telephone Laboratories, Incorporated Operational amplifier with offset compensation
US4365204A (en) * 1980-09-08 1982-12-21 American Microsystems, Inc. Offset compensation for switched capacitor integrators
US4404525A (en) * 1981-03-03 1983-09-13 American Microsystems, Inc. Switched capacitor gain stage with offset and switch feedthrough cancellation scheme
US4393351A (en) * 1981-07-27 1983-07-12 American Microsystems, Inc. Offset compensation for switched capacitor integrators

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60154399A (ja) * 1984-01-24 1985-08-14 Nippon Telegr & Teleph Corp <Ntt> サンプルホ−ルド回路
JPH0334628A (ja) * 1989-06-30 1991-02-14 Yokogawa Electric Corp オーバーサンプリングa/d変換器
JP2009545188A (ja) * 2006-03-21 2009-12-17 ケンブリッジ アナログ テクノロジー,エルエルシー サンプルデータ回路のオフセット取り消し

Also Published As

Publication number Publication date
EP0078601A2 (en) 1983-05-11
DE3279140D1 (en) 1988-11-24
EP0078601B1 (en) 1988-10-19
US4439693A (en) 1984-03-27
JPH0222476B2 (enExample) 1990-05-18
EP0078601A3 (en) 1985-04-17

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