JPS585680A - 半導体集積回路 - Google Patents

半導体集積回路

Info

Publication number
JPS585680A
JPS585680A JP56102744A JP10274481A JPS585680A JP S585680 A JPS585680 A JP S585680A JP 56102744 A JP56102744 A JP 56102744A JP 10274481 A JP10274481 A JP 10274481A JP S585680 A JPS585680 A JP S585680A
Authority
JP
Japan
Prior art keywords
circuit
semiconductor integrated
integrated circuit
inspection
terminal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56102744A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0352585B2 (enrdf_load_stackoverflow
Inventor
Tetsuo Mizutani
水谷　哲夫
Makoto Yamatani
山谷　誠
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electronics Corp
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electronics Corp, Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electronics Corp
Priority to JP56102744A priority Critical patent/JPS585680A/ja
Publication of JPS585680A publication Critical patent/JPS585680A/ja
Publication of JPH0352585B2 publication Critical patent/JPH0352585B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316—Testing of analog circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP56102744A 1981-07-01 1981-07-01 半導体集積回路 Granted JPS585680A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56102744A JPS585680A (ja) 1981-07-01 1981-07-01 半導体集積回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56102744A JPS585680A (ja) 1981-07-01 1981-07-01 半導体集積回路

Publications (2)

Publication Number Publication Date
JPS585680A true JPS585680A (ja) 1983-01-13
JPH0352585B2 JPH0352585B2 (enrdf_load_stackoverflow) 1991-08-12

Family

ID=14335732

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56102744A Granted JPS585680A (ja) 1981-07-01 1981-07-01 半導体集積回路

Country Status (1)

Country Link
JP (1) JPS585680A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03261878A (ja) * 1990-03-12 1991-11-21 Canon Inc 電子機器

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5793879U (enrdf_load_stackoverflow) * 1980-11-29 1982-06-09

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5793879U (enrdf_load_stackoverflow) * 1980-11-29 1982-06-09

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03261878A (ja) * 1990-03-12 1991-11-21 Canon Inc 電子機器

Also Published As

Publication number Publication date
JPH0352585B2 (enrdf_load_stackoverflow) 1991-08-12

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