JPS5832348A - 透過型電子顕微鏡 - Google Patents

透過型電子顕微鏡

Info

Publication number
JPS5832348A
JPS5832348A JP56130618A JP13061881A JPS5832348A JP S5832348 A JPS5832348 A JP S5832348A JP 56130618 A JP56130618 A JP 56130618A JP 13061881 A JP13061881 A JP 13061881A JP S5832348 A JPS5832348 A JP S5832348A
Authority
JP
Japan
Prior art keywords
sample
objective lens
lens
pole piece
magnetic pole
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56130618A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6329928B2 (enrdf_load_stackoverflow
Inventor
Takeshi Tomita
健 富田
Kojin Kondo
行人 近藤
Katsushige Tsuno
勝重 津野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Nippon Telegraph and Telephone Corp
Original Assignee
Jeol Ltd
Nihon Denshi KK
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd, Nihon Denshi KK, Nippon Telegraph and Telephone Corp filed Critical Jeol Ltd
Priority to JP56130618A priority Critical patent/JPS5832348A/ja
Publication of JPS5832348A publication Critical patent/JPS5832348A/ja
Publication of JPS6329928B2 publication Critical patent/JPS6329928B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/04Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H01J37/10Lenses
    • H01J37/14Lenses magnetic
    • H01J37/141Electromagnetic lenses

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
JP56130618A 1981-08-20 1981-08-20 透過型電子顕微鏡 Granted JPS5832348A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56130618A JPS5832348A (ja) 1981-08-20 1981-08-20 透過型電子顕微鏡

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56130618A JPS5832348A (ja) 1981-08-20 1981-08-20 透過型電子顕微鏡

Publications (2)

Publication Number Publication Date
JPS5832348A true JPS5832348A (ja) 1983-02-25
JPS6329928B2 JPS6329928B2 (enrdf_load_stackoverflow) 1988-06-15

Family

ID=15038527

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56130618A Granted JPS5832348A (ja) 1981-08-20 1981-08-20 透過型電子顕微鏡

Country Status (1)

Country Link
JP (1) JPS5832348A (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006344533A (ja) * 2005-06-09 2006-12-21 Kawasaki Heavy Ind Ltd X線用光電変換型イメージング管
EP2590205A3 (en) * 2011-11-02 2014-11-05 Jeol Ltd. Transmission electron microscope and method of observing TEM images

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5150650A (en) * 1974-10-30 1976-05-04 Hitachi Ltd Denshisensochino hitenshusahoseisochi

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5150650A (en) * 1974-10-30 1976-05-04 Hitachi Ltd Denshisensochino hitenshusahoseisochi

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006344533A (ja) * 2005-06-09 2006-12-21 Kawasaki Heavy Ind Ltd X線用光電変換型イメージング管
EP2590205A3 (en) * 2011-11-02 2014-11-05 Jeol Ltd. Transmission electron microscope and method of observing TEM images

Also Published As

Publication number Publication date
JPS6329928B2 (enrdf_load_stackoverflow) 1988-06-15

Similar Documents

Publication Publication Date Title
US7385197B2 (en) Electron beam apparatus and a device manufacturing method using the same apparatus
US7939801B2 (en) Electron beam observation device using pre-specimen magnetic field as image-forming lens and specimen observation method
JP2015069831A (ja) 電子顕微鏡
KR102277431B1 (ko) 듀얼 빈 필터 모노크로메이터를 사용한 전자 빔 영상화
US7612336B2 (en) Scanning electron microscope having a monochromator
US4633085A (en) Transmission-type electron microscope
JPH0337260B2 (enrdf_load_stackoverflow)
JPS5832348A (ja) 透過型電子顕微鏡
JP5452722B2 (ja) 収差補正装置およびそれを用いた荷電粒子線装置
JPS5832347A (ja) 透過型電子顕微鏡
JP2839683B2 (ja) フーコー電子顕微鏡
JP4150568B2 (ja) 電子顕微鏡
US3869611A (en) Particle-beam device of the raster type
JPS6328518Y2 (enrdf_load_stackoverflow)
JPS605503Y2 (ja) 透過型走査電子顕微鏡
JPH06283128A (ja) 電子顕微鏡
JPS586267B2 (ja) 走査電子顕微鏡
JPH0234142B2 (enrdf_load_stackoverflow)
JP2014032943A (ja) エネルギー幅の小さい電子ビームを試料に照射する走査型電子顕微鏡。
JPH07161332A (ja) 電子ビーム照射分析装置
JPH0261093B2 (enrdf_load_stackoverflow)
JP2005310512A (ja) 電子光学システム及び電子顕微鏡
JPH0689683A (ja) 電磁型レンズ
JPH0145176B2 (enrdf_load_stackoverflow)
JPS60146441A (ja) 透過型電子顕微鏡