JPS58223047A - 螢光x線分析方法 - Google Patents
螢光x線分析方法Info
- Publication number
- JPS58223047A JPS58223047A JP10570982A JP10570982A JPS58223047A JP S58223047 A JPS58223047 A JP S58223047A JP 10570982 A JP10570982 A JP 10570982A JP 10570982 A JP10570982 A JP 10570982A JP S58223047 A JPS58223047 A JP S58223047A
- Authority
- JP
- Japan
- Prior art keywords
- fluorescent
- ray
- plating film
- angle
- rays
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10570982A JPS58223047A (ja) | 1982-06-18 | 1982-06-18 | 螢光x線分析方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10570982A JPS58223047A (ja) | 1982-06-18 | 1982-06-18 | 螢光x線分析方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS58223047A true JPS58223047A (ja) | 1983-12-24 |
JPH0541940B2 JPH0541940B2 (enrdf_load_html_response) | 1993-06-25 |
Family
ID=14414867
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10570982A Granted JPS58223047A (ja) | 1982-06-18 | 1982-06-18 | 螢光x線分析方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS58223047A (enrdf_load_html_response) |
Cited By (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60236052A (ja) * | 1984-05-10 | 1985-11-22 | Rigaku Denki Kogyo Kk | 被膜の厚みと組成の同時分析法 |
JPS60250237A (ja) * | 1984-05-28 | 1985-12-10 | Rigaku Denki Kogyo Kk | 固体中における元素の濃度分布測定装置 |
JPS60263841A (ja) * | 1984-06-12 | 1985-12-27 | Rigaku Denki Kk | 薄膜試料x線回折装置 |
JPS6117052A (ja) * | 1984-07-02 | 1986-01-25 | Rigaku Denki Kogyo Kk | 螢光x線分析装置 |
JPS6188128A (ja) * | 1984-10-05 | 1986-05-06 | Kawasaki Steel Corp | 合金被膜の膜厚及び組成測定方法 |
JPS61210932A (ja) * | 1985-03-15 | 1986-09-19 | Sumitomo Metal Ind Ltd | 積層体の螢光x線分析方法及び装置 |
US4764945A (en) * | 1984-10-05 | 1988-08-16 | Kawasaki Steel Corp. | Method of measuring layer thickness and composition of alloy plating |
US4959848A (en) * | 1987-12-16 | 1990-09-25 | Axic Inc. | Apparatus for the measurement of the thickness and concentration of elements in thin films by means of X-ray analysis |
JPH0335149A (ja) * | 1989-06-30 | 1991-02-15 | Nkk Corp | メッキ鋼板のメッキ付着量およびメッキ被膜組成の測定方法およびその測定装置 |
US5081658A (en) * | 1989-03-30 | 1992-01-14 | Nkk Corporation | Method of measuring plating amount and plating film composition of plated steel plate and apparatus therefor |
US5113421A (en) * | 1988-05-13 | 1992-05-12 | Data Measurement Corporation | Method and apparatus for measuring the thickness of a coating on a substrate |
DE19931298B4 (de) * | 1998-07-16 | 2007-05-03 | Panalytical B.V. | Verfahren zur Analyse dünner Schichten mit Röntgenfluoreszenz |
US7356114B2 (en) | 2005-09-14 | 2008-04-08 | Rigaku Industrial Corporation | X-ray fluorescence spectrometer |
WO2012008513A1 (ja) * | 2010-07-15 | 2012-01-19 | 株式会社堀場製作所 | 蛍光x線検出方法及び蛍光x線検出装置 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5636045A (en) * | 1979-08-31 | 1981-04-09 | Sumitomo Metal Ind Ltd | Quantity determination method for sticking quantity of plating metal and quantity of component in ni-zn alloy-plated steel plate |
-
1982
- 1982-06-18 JP JP10570982A patent/JPS58223047A/ja active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5636045A (en) * | 1979-08-31 | 1981-04-09 | Sumitomo Metal Ind Ltd | Quantity determination method for sticking quantity of plating metal and quantity of component in ni-zn alloy-plated steel plate |
Cited By (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60236052A (ja) * | 1984-05-10 | 1985-11-22 | Rigaku Denki Kogyo Kk | 被膜の厚みと組成の同時分析法 |
JPS60250237A (ja) * | 1984-05-28 | 1985-12-10 | Rigaku Denki Kogyo Kk | 固体中における元素の濃度分布測定装置 |
JPS60263841A (ja) * | 1984-06-12 | 1985-12-27 | Rigaku Denki Kk | 薄膜試料x線回折装置 |
JPS6117052A (ja) * | 1984-07-02 | 1986-01-25 | Rigaku Denki Kogyo Kk | 螢光x線分析装置 |
US4764945A (en) * | 1984-10-05 | 1988-08-16 | Kawasaki Steel Corp. | Method of measuring layer thickness and composition of alloy plating |
JPS6188128A (ja) * | 1984-10-05 | 1986-05-06 | Kawasaki Steel Corp | 合金被膜の膜厚及び組成測定方法 |
JPS61210932A (ja) * | 1985-03-15 | 1986-09-19 | Sumitomo Metal Ind Ltd | 積層体の螢光x線分析方法及び装置 |
US4959848A (en) * | 1987-12-16 | 1990-09-25 | Axic Inc. | Apparatus for the measurement of the thickness and concentration of elements in thin films by means of X-ray analysis |
US5113421A (en) * | 1988-05-13 | 1992-05-12 | Data Measurement Corporation | Method and apparatus for measuring the thickness of a coating on a substrate |
US5081658A (en) * | 1989-03-30 | 1992-01-14 | Nkk Corporation | Method of measuring plating amount and plating film composition of plated steel plate and apparatus therefor |
JPH0335149A (ja) * | 1989-06-30 | 1991-02-15 | Nkk Corp | メッキ鋼板のメッキ付着量およびメッキ被膜組成の測定方法およびその測定装置 |
DE19931298B4 (de) * | 1998-07-16 | 2007-05-03 | Panalytical B.V. | Verfahren zur Analyse dünner Schichten mit Röntgenfluoreszenz |
US7356114B2 (en) | 2005-09-14 | 2008-04-08 | Rigaku Industrial Corporation | X-ray fluorescence spectrometer |
WO2012008513A1 (ja) * | 2010-07-15 | 2012-01-19 | 株式会社堀場製作所 | 蛍光x線検出方法及び蛍光x線検出装置 |
Also Published As
Publication number | Publication date |
---|---|
JPH0541940B2 (enrdf_load_html_response) | 1993-06-25 |
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