JPS58223047A - 螢光x線分析方法 - Google Patents

螢光x線分析方法

Info

Publication number
JPS58223047A
JPS58223047A JP10570982A JP10570982A JPS58223047A JP S58223047 A JPS58223047 A JP S58223047A JP 10570982 A JP10570982 A JP 10570982A JP 10570982 A JP10570982 A JP 10570982A JP S58223047 A JPS58223047 A JP S58223047A
Authority
JP
Japan
Prior art keywords
fluorescent
ray
plating film
angle
rays
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10570982A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0541940B2 (enrdf_load_html_response
Inventor
Yoshiro Matsumoto
松本 義朗
Masakatsu Fujino
藤野 允克
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Sumitomo Metal Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Metal Industries Ltd filed Critical Sumitomo Metal Industries Ltd
Priority to JP10570982A priority Critical patent/JPS58223047A/ja
Publication of JPS58223047A publication Critical patent/JPS58223047A/ja
Publication of JPH0541940B2 publication Critical patent/JPH0541940B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP10570982A 1982-06-18 1982-06-18 螢光x線分析方法 Granted JPS58223047A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10570982A JPS58223047A (ja) 1982-06-18 1982-06-18 螢光x線分析方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10570982A JPS58223047A (ja) 1982-06-18 1982-06-18 螢光x線分析方法

Publications (2)

Publication Number Publication Date
JPS58223047A true JPS58223047A (ja) 1983-12-24
JPH0541940B2 JPH0541940B2 (enrdf_load_html_response) 1993-06-25

Family

ID=14414867

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10570982A Granted JPS58223047A (ja) 1982-06-18 1982-06-18 螢光x線分析方法

Country Status (1)

Country Link
JP (1) JPS58223047A (enrdf_load_html_response)

Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60236052A (ja) * 1984-05-10 1985-11-22 Rigaku Denki Kogyo Kk 被膜の厚みと組成の同時分析法
JPS60250237A (ja) * 1984-05-28 1985-12-10 Rigaku Denki Kogyo Kk 固体中における元素の濃度分布測定装置
JPS60263841A (ja) * 1984-06-12 1985-12-27 Rigaku Denki Kk 薄膜試料x線回折装置
JPS6117052A (ja) * 1984-07-02 1986-01-25 Rigaku Denki Kogyo Kk 螢光x線分析装置
JPS6188128A (ja) * 1984-10-05 1986-05-06 Kawasaki Steel Corp 合金被膜の膜厚及び組成測定方法
JPS61210932A (ja) * 1985-03-15 1986-09-19 Sumitomo Metal Ind Ltd 積層体の螢光x線分析方法及び装置
US4764945A (en) * 1984-10-05 1988-08-16 Kawasaki Steel Corp. Method of measuring layer thickness and composition of alloy plating
US4959848A (en) * 1987-12-16 1990-09-25 Axic Inc. Apparatus for the measurement of the thickness and concentration of elements in thin films by means of X-ray analysis
JPH0335149A (ja) * 1989-06-30 1991-02-15 Nkk Corp メッキ鋼板のメッキ付着量およびメッキ被膜組成の測定方法およびその測定装置
US5081658A (en) * 1989-03-30 1992-01-14 Nkk Corporation Method of measuring plating amount and plating film composition of plated steel plate and apparatus therefor
US5113421A (en) * 1988-05-13 1992-05-12 Data Measurement Corporation Method and apparatus for measuring the thickness of a coating on a substrate
DE19931298B4 (de) * 1998-07-16 2007-05-03 Panalytical B.V. Verfahren zur Analyse dünner Schichten mit Röntgenfluoreszenz
US7356114B2 (en) 2005-09-14 2008-04-08 Rigaku Industrial Corporation X-ray fluorescence spectrometer
WO2012008513A1 (ja) * 2010-07-15 2012-01-19 株式会社堀場製作所 蛍光x線検出方法及び蛍光x線検出装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5636045A (en) * 1979-08-31 1981-04-09 Sumitomo Metal Ind Ltd Quantity determination method for sticking quantity of plating metal and quantity of component in ni-zn alloy-plated steel plate

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5636045A (en) * 1979-08-31 1981-04-09 Sumitomo Metal Ind Ltd Quantity determination method for sticking quantity of plating metal and quantity of component in ni-zn alloy-plated steel plate

Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60236052A (ja) * 1984-05-10 1985-11-22 Rigaku Denki Kogyo Kk 被膜の厚みと組成の同時分析法
JPS60250237A (ja) * 1984-05-28 1985-12-10 Rigaku Denki Kogyo Kk 固体中における元素の濃度分布測定装置
JPS60263841A (ja) * 1984-06-12 1985-12-27 Rigaku Denki Kk 薄膜試料x線回折装置
JPS6117052A (ja) * 1984-07-02 1986-01-25 Rigaku Denki Kogyo Kk 螢光x線分析装置
US4764945A (en) * 1984-10-05 1988-08-16 Kawasaki Steel Corp. Method of measuring layer thickness and composition of alloy plating
JPS6188128A (ja) * 1984-10-05 1986-05-06 Kawasaki Steel Corp 合金被膜の膜厚及び組成測定方法
JPS61210932A (ja) * 1985-03-15 1986-09-19 Sumitomo Metal Ind Ltd 積層体の螢光x線分析方法及び装置
US4959848A (en) * 1987-12-16 1990-09-25 Axic Inc. Apparatus for the measurement of the thickness and concentration of elements in thin films by means of X-ray analysis
US5113421A (en) * 1988-05-13 1992-05-12 Data Measurement Corporation Method and apparatus for measuring the thickness of a coating on a substrate
US5081658A (en) * 1989-03-30 1992-01-14 Nkk Corporation Method of measuring plating amount and plating film composition of plated steel plate and apparatus therefor
JPH0335149A (ja) * 1989-06-30 1991-02-15 Nkk Corp メッキ鋼板のメッキ付着量およびメッキ被膜組成の測定方法およびその測定装置
DE19931298B4 (de) * 1998-07-16 2007-05-03 Panalytical B.V. Verfahren zur Analyse dünner Schichten mit Röntgenfluoreszenz
US7356114B2 (en) 2005-09-14 2008-04-08 Rigaku Industrial Corporation X-ray fluorescence spectrometer
WO2012008513A1 (ja) * 2010-07-15 2012-01-19 株式会社堀場製作所 蛍光x線検出方法及び蛍光x線検出装置

Also Published As

Publication number Publication date
JPH0541940B2 (enrdf_load_html_response) 1993-06-25

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