JPS58222534A - 集積回路 - Google Patents

集積回路

Info

Publication number
JPS58222534A
JPS58222534A JP57104864A JP10486482A JPS58222534A JP S58222534 A JPS58222534 A JP S58222534A JP 57104864 A JP57104864 A JP 57104864A JP 10486482 A JP10486482 A JP 10486482A JP S58222534 A JPS58222534 A JP S58222534A
Authority
JP
Japan
Prior art keywords
test
speed clock
output
circuit
low
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57104864A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0366624B2 (enrdf_load_stackoverflow
Inventor
Shigeo Kamiya
神谷　茂雄
Seiichi Nishio
誠一 西尾
Misao Miyata
宮田　操
Isamu Yamazaki
勇 山崎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP57104864A priority Critical patent/JPS58222534A/ja
Publication of JPS58222534A publication Critical patent/JPS58222534A/ja
Publication of JPH0366624B2 publication Critical patent/JPH0366624B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
JP57104864A 1982-06-18 1982-06-18 集積回路 Granted JPS58222534A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57104864A JPS58222534A (ja) 1982-06-18 1982-06-18 集積回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57104864A JPS58222534A (ja) 1982-06-18 1982-06-18 集積回路

Publications (2)

Publication Number Publication Date
JPS58222534A true JPS58222534A (ja) 1983-12-24
JPH0366624B2 JPH0366624B2 (enrdf_load_stackoverflow) 1991-10-18

Family

ID=14392104

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57104864A Granted JPS58222534A (ja) 1982-06-18 1982-06-18 集積回路

Country Status (1)

Country Link
JP (1) JPS58222534A (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4697140A (en) * 1985-02-20 1987-09-29 Fujitsu Limited Semiconductor integrated circuit having a test circuit for testing an internal circuit
JPS6439039A (en) * 1987-08-05 1989-02-09 Fujitsu Ltd Semiconductor integrated circuit device with gate array and memory
JPH022962A (ja) * 1988-06-15 1990-01-08 Fujitsu Ltd 超大規模集積回路の試験容易化方法

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4697140A (en) * 1985-02-20 1987-09-29 Fujitsu Limited Semiconductor integrated circuit having a test circuit for testing an internal circuit
JPS6439039A (en) * 1987-08-05 1989-02-09 Fujitsu Ltd Semiconductor integrated circuit device with gate array and memory
JPH022962A (ja) * 1988-06-15 1990-01-08 Fujitsu Ltd 超大規模集積回路の試験容易化方法

Also Published As

Publication number Publication date
JPH0366624B2 (enrdf_load_stackoverflow) 1991-10-18

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