JPS58211669A - 表面電位計の較正方法 - Google Patents

表面電位計の較正方法

Info

Publication number
JPS58211669A
JPS58211669A JP57094017A JP9401782A JPS58211669A JP S58211669 A JPS58211669 A JP S58211669A JP 57094017 A JP57094017 A JP 57094017A JP 9401782 A JP9401782 A JP 9401782A JP S58211669 A JPS58211669 A JP S58211669A
Authority
JP
Japan
Prior art keywords
potential
photoreceptor
electrometer
calibrating
surface potential
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57094017A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0456262B2 (enrdf_load_stackoverflow
Inventor
Akihiko Takeuchi
昭彦 竹内
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP57094017A priority Critical patent/JPS58211669A/ja
Publication of JPS58211669A publication Critical patent/JPS58211669A/ja
Publication of JPH0456262B2 publication Critical patent/JPH0456262B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Control Or Security For Electrophotography (AREA)
JP57094017A 1982-06-03 1982-06-03 表面電位計の較正方法 Granted JPS58211669A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57094017A JPS58211669A (ja) 1982-06-03 1982-06-03 表面電位計の較正方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57094017A JPS58211669A (ja) 1982-06-03 1982-06-03 表面電位計の較正方法

Publications (2)

Publication Number Publication Date
JPS58211669A true JPS58211669A (ja) 1983-12-09
JPH0456262B2 JPH0456262B2 (enrdf_load_stackoverflow) 1992-09-07

Family

ID=14098736

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57094017A Granted JPS58211669A (ja) 1982-06-03 1982-06-03 表面電位計の較正方法

Country Status (1)

Country Link
JP (1) JPS58211669A (enrdf_load_stackoverflow)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4336690A1 (de) * 1993-10-27 1995-05-04 Henning Dipl Phys Dr Frunder Einrichtung zum Messen von elektrischen Potentialkontrasten (Potentialunterschieden)
JP2004301555A (ja) * 2003-03-28 2004-10-28 Canon Inc 揺動体装置を用いた電位測定装置、および画像形成装置
JP2005351627A (ja) * 2004-06-08 2005-12-22 Canon Inc 電位測定装置および画像形成装置
JP2006003131A (ja) * 2004-06-15 2006-01-05 Canon Inc 電位センサ
JP2006105939A (ja) * 2004-10-08 2006-04-20 Canon Inc 電位測定装置及び画像形成装置
US7741850B2 (en) 2004-07-12 2010-06-22 Canon Kabushiki Kaisha Electric potential measuring apparatus, and image forming apparatus
CN103983936A (zh) * 2014-05-29 2014-08-13 国家电网公司 一种新型单三相电能表一体化校验装置

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3398721B2 (ja) 1999-05-20 2003-04-21 アムコー テクノロジー コリア インコーポレーティド 半導体パッケージ及びその製造方法
JP2001077301A (ja) 1999-08-24 2001-03-23 Amkor Technology Korea Inc 半導体パッケージ及びその製造方法
US7633144B1 (en) 2006-05-24 2009-12-15 Amkor Technology, Inc. Semiconductor package

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5437760A (en) * 1977-08-30 1979-03-20 Ricoh Co Ltd Photoreceptor surface potential detector
JPS5660444A (en) * 1979-10-23 1981-05-25 Fuji Photo Film Co Ltd Electrophotographic receptor
JPS56150762A (en) * 1980-04-24 1981-11-21 Copyer Co Ltd Control method for surface potential of photoreceptor of electrophotographic copier

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5437760A (en) * 1977-08-30 1979-03-20 Ricoh Co Ltd Photoreceptor surface potential detector
JPS5660444A (en) * 1979-10-23 1981-05-25 Fuji Photo Film Co Ltd Electrophotographic receptor
JPS56150762A (en) * 1980-04-24 1981-11-21 Copyer Co Ltd Control method for surface potential of photoreceptor of electrophotographic copier

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4336690A1 (de) * 1993-10-27 1995-05-04 Henning Dipl Phys Dr Frunder Einrichtung zum Messen von elektrischen Potentialkontrasten (Potentialunterschieden)
DE4336690C2 (de) * 1993-10-27 1999-04-15 Henning Dipl Phys Dr Frunder Vorrichtung zum Messen von elektrischen Potentialunterschieden an elektrografischen Aufzeichnungsmaterialien
JP2004301555A (ja) * 2003-03-28 2004-10-28 Canon Inc 揺動体装置を用いた電位測定装置、および画像形成装置
JP2005351627A (ja) * 2004-06-08 2005-12-22 Canon Inc 電位測定装置および画像形成装置
JP2006003131A (ja) * 2004-06-15 2006-01-05 Canon Inc 電位センサ
US7741850B2 (en) 2004-07-12 2010-06-22 Canon Kabushiki Kaisha Electric potential measuring apparatus, and image forming apparatus
JP2006105939A (ja) * 2004-10-08 2006-04-20 Canon Inc 電位測定装置及び画像形成装置
CN103983936A (zh) * 2014-05-29 2014-08-13 国家电网公司 一种新型单三相电能表一体化校验装置
CN103983936B (zh) * 2014-05-29 2016-04-20 国家电网公司 一种单三相电能表一体化校验装置

Also Published As

Publication number Publication date
JPH0456262B2 (enrdf_load_stackoverflow) 1992-09-07

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