JPS58200170A - 消費電流測定回路 - Google Patents

消費電流測定回路

Info

Publication number
JPS58200170A
JPS58200170A JP57081606A JP8160682A JPS58200170A JP S58200170 A JPS58200170 A JP S58200170A JP 57081606 A JP57081606 A JP 57081606A JP 8160682 A JP8160682 A JP 8160682A JP S58200170 A JPS58200170 A JP S58200170A
Authority
JP
Japan
Prior art keywords
current
circuit
load
output
load current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57081606A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0366622B2 (enrdf_load_stackoverflow
Inventor
Iwao Uchiyama
内山　巖
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Oki Electric Industry Co Ltd
Original Assignee
Oki Electric Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oki Electric Industry Co Ltd filed Critical Oki Electric Industry Co Ltd
Priority to JP57081606A priority Critical patent/JPS58200170A/ja
Publication of JPS58200170A publication Critical patent/JPS58200170A/ja
Publication of JPH0366622B2 publication Critical patent/JPH0366622B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R21/00—Arrangements for measuring electric power or power factor

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Tests Of Electronic Circuits (AREA)
JP57081606A 1982-05-17 1982-05-17 消費電流測定回路 Granted JPS58200170A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57081606A JPS58200170A (ja) 1982-05-17 1982-05-17 消費電流測定回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57081606A JPS58200170A (ja) 1982-05-17 1982-05-17 消費電流測定回路

Publications (2)

Publication Number Publication Date
JPS58200170A true JPS58200170A (ja) 1983-11-21
JPH0366622B2 JPH0366622B2 (enrdf_load_stackoverflow) 1991-10-18

Family

ID=13750971

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57081606A Granted JPS58200170A (ja) 1982-05-17 1982-05-17 消費電流測定回路

Country Status (1)

Country Link
JP (1) JPS58200170A (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02143172A (ja) * 1988-11-25 1990-06-01 Nec Corp ロジックアナライザ
EP1550878A1 (en) * 2003-12-31 2005-07-06 Teradyne, Inc. Parallel source/capture architecture for automatic test equipment

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02143172A (ja) * 1988-11-25 1990-06-01 Nec Corp ロジックアナライザ
EP1550878A1 (en) * 2003-12-31 2005-07-06 Teradyne, Inc. Parallel source/capture architecture for automatic test equipment
US7230553B2 (en) 2003-12-31 2007-06-12 Teradyne, Inc. Parallel source/capture architecture

Also Published As

Publication number Publication date
JPH0366622B2 (enrdf_load_stackoverflow) 1991-10-18

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