JPS58197740A - 集積回路用基板の製造方法 - Google Patents
集積回路用基板の製造方法Info
- Publication number
- JPS58197740A JPS58197740A JP57067474A JP6747482A JPS58197740A JP S58197740 A JPS58197740 A JP S58197740A JP 57067474 A JP57067474 A JP 57067474A JP 6747482 A JP6747482 A JP 6747482A JP S58197740 A JPS58197740 A JP S58197740A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- silicon
- single crystal
- films
- sio2
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/76—Making of isolation regions between components
- H01L21/762—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers
- H01L21/76297—Dielectric isolation using EPIC techniques, i.e. epitaxial passivated integrated circuit
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Local Oxidation Of Silicon (AREA)
- Bipolar Transistors (AREA)
- Element Separation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57067474A JPS58197740A (ja) | 1982-04-23 | 1982-04-23 | 集積回路用基板の製造方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57067474A JPS58197740A (ja) | 1982-04-23 | 1982-04-23 | 集積回路用基板の製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS58197740A true JPS58197740A (ja) | 1983-11-17 |
JPS6244411B2 JPS6244411B2 (enrdf_load_stackoverflow) | 1987-09-21 |
Family
ID=13345990
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57067474A Granted JPS58197740A (ja) | 1982-04-23 | 1982-04-23 | 集積回路用基板の製造方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS58197740A (enrdf_load_stackoverflow) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5421958A (en) * | 1993-06-07 | 1995-06-06 | The United States Of America As Represented By The Administrator Of The United States National Aeronautics And Space Administration | Selective formation of porous silicon |
US5439843A (en) * | 1992-01-31 | 1995-08-08 | Canon Kabushiki Kaisha | Method for preparing a semiconductor substrate using porous silicon |
-
1982
- 1982-04-23 JP JP57067474A patent/JPS58197740A/ja active Granted
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5439843A (en) * | 1992-01-31 | 1995-08-08 | Canon Kabushiki Kaisha | Method for preparing a semiconductor substrate using porous silicon |
US5421958A (en) * | 1993-06-07 | 1995-06-06 | The United States Of America As Represented By The Administrator Of The United States National Aeronautics And Space Administration | Selective formation of porous silicon |
Also Published As
Publication number | Publication date |
---|---|
JPS6244411B2 (enrdf_load_stackoverflow) | 1987-09-21 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US4104090A (en) | Total dielectric isolation utilizing a combination of reactive ion etching, anodic etching, and thermal oxidation | |
JPH01315159A (ja) | 誘電体分離半導体基板とその製造方法 | |
JPS6052037A (ja) | 半導体装置の製法 | |
US4398992A (en) | Defect free zero oxide encroachment process for semiconductor fabrication | |
US3974006A (en) | Method of obtaining high temperature resistant assemblies comprising isolated silicon islands bonded to a substrate | |
JPS58197740A (ja) | 集積回路用基板の製造方法 | |
US3738883A (en) | Dielectric isolation processes | |
JP2750163B2 (ja) | 誘電体分離型半導体装置の製造方法 | |
US3913121A (en) | Semiconductor structure | |
JPH0199230A (ja) | 分離領域形成方法 | |
JPS6244415B2 (enrdf_load_stackoverflow) | ||
JP2681420B2 (ja) | 誘電体基板の製造方法 | |
JPS5939044A (ja) | 絶縁分離集積回路用基板の製造方法 | |
JPS5916341A (ja) | 集積回路用基板の製造方法 | |
JPS6359531B2 (enrdf_load_stackoverflow) | ||
JPS6293954A (ja) | 誘電体分離基板の製造方法 | |
JPS60147129A (ja) | 誘電体絶縁分離基板の製造方法 | |
JPH05190658A (ja) | 誘電体分離ウエハの製造方法 | |
JPS5963738A (ja) | 誘電体分離基板の製造方法 | |
JPS5916342A (ja) | 集積回路用基板の製造方法 | |
JPS5839026A (ja) | 半導体装置及びその製造方法 | |
JPS5918657A (ja) | 集積回路用基板の製造方法 | |
JP2664458B2 (ja) | 素子分離方法 | |
JPS6298639A (ja) | 誘電体分離基板の製造方法 | |
JPS61271842A (ja) | 半導体素子の製造方法 |