JPS58172562A - プリント基板検査装置 - Google Patents

プリント基板検査装置

Info

Publication number
JPS58172562A
JPS58172562A JP57055365A JP5536582A JPS58172562A JP S58172562 A JPS58172562 A JP S58172562A JP 57055365 A JP57055365 A JP 57055365A JP 5536582 A JP5536582 A JP 5536582A JP S58172562 A JPS58172562 A JP S58172562A
Authority
JP
Japan
Prior art keywords
board
output
inspected
section
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57055365A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0257676B2 (enrdf_load_stackoverflow
Inventor
Yoshio Ooyama
義男 大山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Automob Antipollut & Saf Res Center
Hitachi Astemo Ltd
Automobile Appliance Anti Pollution and Safety Research Center
Original Assignee
Automob Antipollut & Saf Res Center
Hitachi Automotive Engineering Co Ltd
Automobile Appliance Anti Pollution and Safety Research Center
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Automob Antipollut & Saf Res Center, Hitachi Automotive Engineering Co Ltd, Automobile Appliance Anti Pollution and Safety Research Center filed Critical Automob Antipollut & Saf Res Center
Priority to JP57055365A priority Critical patent/JPS58172562A/ja
Publication of JPS58172562A publication Critical patent/JPS58172562A/ja
Publication of JPH0257676B2 publication Critical patent/JPH0257676B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
JP57055365A 1982-04-05 1982-04-05 プリント基板検査装置 Granted JPS58172562A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57055365A JPS58172562A (ja) 1982-04-05 1982-04-05 プリント基板検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57055365A JPS58172562A (ja) 1982-04-05 1982-04-05 プリント基板検査装置

Publications (2)

Publication Number Publication Date
JPS58172562A true JPS58172562A (ja) 1983-10-11
JPH0257676B2 JPH0257676B2 (enrdf_load_stackoverflow) 1990-12-05

Family

ID=12996456

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57055365A Granted JPS58172562A (ja) 1982-04-05 1982-04-05 プリント基板検査装置

Country Status (1)

Country Link
JP (1) JPS58172562A (enrdf_load_stackoverflow)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60148136A (ja) * 1984-01-12 1985-08-05 Toshiba Corp 半導体試験装置
JPH01292270A (ja) * 1988-05-19 1989-11-24 Tokyo Electron Ltd プローブ装置
US4965515A (en) * 1986-10-15 1990-10-23 Tokyo Electron Limited Apparatus and method of testing a semiconductor wafer
US4967143A (en) * 1986-09-09 1990-10-30 Fiat Auto S.P.A. System for diagnosing anomalies or breakdowns in a plurality of types of electronic control systems installed in motor vehicles
US5086270A (en) * 1988-07-08 1992-02-04 Tokyo Electron Limited Probe apparatus

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60148136A (ja) * 1984-01-12 1985-08-05 Toshiba Corp 半導体試験装置
US4967143A (en) * 1986-09-09 1990-10-30 Fiat Auto S.P.A. System for diagnosing anomalies or breakdowns in a plurality of types of electronic control systems installed in motor vehicles
US4965515A (en) * 1986-10-15 1990-10-23 Tokyo Electron Limited Apparatus and method of testing a semiconductor wafer
JPH01292270A (ja) * 1988-05-19 1989-11-24 Tokyo Electron Ltd プローブ装置
US5086270A (en) * 1988-07-08 1992-02-04 Tokyo Electron Limited Probe apparatus

Also Published As

Publication number Publication date
JPH0257676B2 (enrdf_load_stackoverflow) 1990-12-05

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