JPS58162806A - 凹凸形状測定装置 - Google Patents
凹凸形状測定装置Info
- Publication number
- JPS58162806A JPS58162806A JP4451082A JP4451082A JPS58162806A JP S58162806 A JPS58162806 A JP S58162806A JP 4451082 A JP4451082 A JP 4451082A JP 4451082 A JP4451082 A JP 4451082A JP S58162806 A JPS58162806 A JP S58162806A
- Authority
- JP
- Japan
- Prior art keywords
- beams
- light
- light beam
- photodetector
- ratio
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000001678 irradiating effect Effects 0.000 claims abstract description 3
- 238000005259 measurement Methods 0.000 claims description 5
- 230000003287 optical effect Effects 0.000 abstract description 19
- 238000000034 method Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 2
- 241000272814 Anser sp. Species 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/22—Measuring arrangements characterised by the use of optical techniques for measuring depth
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4451082A JPS58162806A (ja) | 1982-03-23 | 1982-03-23 | 凹凸形状測定装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4451082A JPS58162806A (ja) | 1982-03-23 | 1982-03-23 | 凹凸形状測定装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS58162806A true JPS58162806A (ja) | 1983-09-27 |
JPS6312524B2 JPS6312524B2 (enrdf_load_stackoverflow) | 1988-03-19 |
Family
ID=12693544
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4451082A Granted JPS58162806A (ja) | 1982-03-23 | 1982-03-23 | 凹凸形状測定装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS58162806A (enrdf_load_stackoverflow) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60237308A (ja) * | 1984-05-11 | 1985-11-26 | Toshiba Corp | 深さ測定装置 |
WO2008156053A1 (ja) * | 2007-06-20 | 2008-12-24 | Nikon Corporation | パターンのピッチ測定装置及び方法並びに表面検査装置及び方法 |
-
1982
- 1982-03-23 JP JP4451082A patent/JPS58162806A/ja active Granted
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60237308A (ja) * | 1984-05-11 | 1985-11-26 | Toshiba Corp | 深さ測定装置 |
WO2008156053A1 (ja) * | 2007-06-20 | 2008-12-24 | Nikon Corporation | パターンのピッチ測定装置及び方法並びに表面検査装置及び方法 |
Also Published As
Publication number | Publication date |
---|---|
JPS6312524B2 (enrdf_load_stackoverflow) | 1988-03-19 |
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