JPS5797630A - Manufacture of semiconductor device - Google Patents
Manufacture of semiconductor deviceInfo
- Publication number
- JPS5797630A JPS5797630A JP55173256A JP17325680A JPS5797630A JP S5797630 A JPS5797630 A JP S5797630A JP 55173256 A JP55173256 A JP 55173256A JP 17325680 A JP17325680 A JP 17325680A JP S5797630 A JPS5797630 A JP S5797630A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- wafer
- impurity
- semiconductor device
- irradiated
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H10W72/30—
-
- H10W72/073—
-
- H10W72/07337—
Landscapes
- Die Bonding (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55173256A JPS5797630A (en) | 1980-12-10 | 1980-12-10 | Manufacture of semiconductor device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55173256A JPS5797630A (en) | 1980-12-10 | 1980-12-10 | Manufacture of semiconductor device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5797630A true JPS5797630A (en) | 1982-06-17 |
| JPS6119102B2 JPS6119102B2 (enExample) | 1986-05-15 |
Family
ID=15957065
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP55173256A Granted JPS5797630A (en) | 1980-12-10 | 1980-12-10 | Manufacture of semiconductor device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5797630A (enExample) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63211635A (ja) * | 1987-02-26 | 1988-09-02 | Nec Corp | 半導体装置 |
| US6498366B1 (en) | 1990-02-14 | 2002-12-24 | Denso Corporation | Semiconductor device that exhibits decreased contact resistance between substrate and drain electrode |
| JP2005277116A (ja) * | 2004-03-25 | 2005-10-06 | Elpida Memory Inc | 半導体装置及びその製造方法 |
-
1980
- 1980-12-10 JP JP55173256A patent/JPS5797630A/ja active Granted
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63211635A (ja) * | 1987-02-26 | 1988-09-02 | Nec Corp | 半導体装置 |
| US6498366B1 (en) | 1990-02-14 | 2002-12-24 | Denso Corporation | Semiconductor device that exhibits decreased contact resistance between substrate and drain electrode |
| US6649478B2 (en) | 1990-02-14 | 2003-11-18 | Denso Corporation | Semiconductor device and method of manufacturing same |
| US20040237327A1 (en) * | 1990-02-14 | 2004-12-02 | Yoshifumi Okabe | Semiconductor device and method of manufacturing same |
| US6903417B2 (en) | 1990-02-14 | 2005-06-07 | Denso Corporation | Power semiconductor device |
| US7064033B2 (en) | 1990-02-14 | 2006-06-20 | Denso Corporation | Semiconductor device and method of manufacturing same |
| JP2005277116A (ja) * | 2004-03-25 | 2005-10-06 | Elpida Memory Inc | 半導体装置及びその製造方法 |
| US7666761B2 (en) | 2004-03-25 | 2010-02-23 | Elpida Memory, Inc. | Semiconductor device and manufacturing method thereof |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6119102B2 (enExample) | 1986-05-15 |
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