JPS5787131A - Exposing method of electron beam - Google Patents

Exposing method of electron beam

Info

Publication number
JPS5787131A
JPS5787131A JP55163785A JP16378580A JPS5787131A JP S5787131 A JPS5787131 A JP S5787131A JP 55163785 A JP55163785 A JP 55163785A JP 16378580 A JP16378580 A JP 16378580A JP S5787131 A JPS5787131 A JP S5787131A
Authority
JP
Japan
Prior art keywords
region
distance
height
gain
exposed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP55163785A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6320376B2 (enrdf_load_stackoverflow
Inventor
Teruaki Okino
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Nippon Telegraph and Telephone Corp
Original Assignee
Jeol Ltd
Nihon Denshi KK
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd, Nihon Denshi KK, Nippon Telegraph and Telephone Corp filed Critical Jeol Ltd
Priority to JP55163785A priority Critical patent/JPS5787131A/ja
Publication of JPS5787131A publication Critical patent/JPS5787131A/ja
Publication of JPS6320376B2 publication Critical patent/JPS6320376B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/304—Controlling tubes by information coming from the objects or from the beam, e.g. correction signals

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Beam Exposure (AREA)
JP55163785A 1980-11-20 1980-11-20 Exposing method of electron beam Granted JPS5787131A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55163785A JPS5787131A (en) 1980-11-20 1980-11-20 Exposing method of electron beam

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55163785A JPS5787131A (en) 1980-11-20 1980-11-20 Exposing method of electron beam

Publications (2)

Publication Number Publication Date
JPS5787131A true JPS5787131A (en) 1982-05-31
JPS6320376B2 JPS6320376B2 (enrdf_load_stackoverflow) 1988-04-27

Family

ID=15780657

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55163785A Granted JPS5787131A (en) 1980-11-20 1980-11-20 Exposing method of electron beam

Country Status (1)

Country Link
JP (1) JPS5787131A (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59150422A (ja) * 1983-01-31 1984-08-28 Fujitsu Ltd 露光処理方法
JPS60741A (ja) * 1983-06-16 1985-01-05 Toshiba Mach Co Ltd 電子線露光方法
JPH01201919A (ja) * 1988-02-05 1989-08-14 Jeol Ltd 荷電ビーム描画装置

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5498577A (en) * 1978-01-20 1979-08-03 Nippon Telegr & Teleph Corp <Ntt> Correction method for electron beam scanning position
JPS5530811A (en) * 1978-08-25 1980-03-04 Chiyou Lsi Gijutsu Kenkyu Kumiai Single field alignment method
JPS5536990A (en) * 1979-07-16 1980-03-14 Toshiba Corp Apparatus for applying electron beam
JPS55133887A (en) * 1979-04-07 1980-10-18 Hitachi Ltd Electron beam radiation apparatus

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5498577A (en) * 1978-01-20 1979-08-03 Nippon Telegr & Teleph Corp <Ntt> Correction method for electron beam scanning position
JPS5530811A (en) * 1978-08-25 1980-03-04 Chiyou Lsi Gijutsu Kenkyu Kumiai Single field alignment method
JPS55133887A (en) * 1979-04-07 1980-10-18 Hitachi Ltd Electron beam radiation apparatus
JPS5536990A (en) * 1979-07-16 1980-03-14 Toshiba Corp Apparatus for applying electron beam

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59150422A (ja) * 1983-01-31 1984-08-28 Fujitsu Ltd 露光処理方法
JPS60741A (ja) * 1983-06-16 1985-01-05 Toshiba Mach Co Ltd 電子線露光方法
JPH01201919A (ja) * 1988-02-05 1989-08-14 Jeol Ltd 荷電ビーム描画装置

Also Published As

Publication number Publication date
JPS6320376B2 (enrdf_load_stackoverflow) 1988-04-27

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