JPS5779622A - Manufacture of semiconductor device - Google Patents

Manufacture of semiconductor device

Info

Publication number
JPS5779622A
JPS5779622A JP15635680A JP15635680A JPS5779622A JP S5779622 A JPS5779622 A JP S5779622A JP 15635680 A JP15635680 A JP 15635680A JP 15635680 A JP15635680 A JP 15635680A JP S5779622 A JPS5779622 A JP S5779622A
Authority
JP
Japan
Prior art keywords
film
outside electrode
semiconductor device
adhered
etching
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15635680A
Other languages
Japanese (ja)
Other versions
JPS643336B2 (en
Inventor
Kenzo Yamazaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP15635680A priority Critical patent/JPS5779622A/en
Publication of JPS5779622A publication Critical patent/JPS5779622A/en
Publication of JPS643336B2 publication Critical patent/JPS643336B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/306Chemical or electrical treatment, e.g. electrolytic etching

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Drying Of Semiconductors (AREA)
  • Weting (AREA)

Abstract

PURPOSE:To enhance close adhesion between a metal film of semiconductor device and an outside electrode by a method wherein before connection of the metal film to constitute the semiconductor device to the outside electrode is to be performed, etching with a buffer liquid containing fluoric acid, washing with water and drying are repeated to form unevenness on the surface of the metal film. CONSTITUTION:An Al film 21 containing several % of silicon to constitute a metal wiring is adhered on a semiconductor substrate 11 being formed with an element region. Moreover an insulating film 31 is adhered thereon by the vapor phase epitaxy to form a protective film. To attain connection to the outside electrode, a photo resist film 41 is formed selectively, and the silicon oxide film is etched with the buffer liquid consisting of fluoric acid and an aqueous solution of ammonium fluoride or being added thereto glacial acetic acid making the film thereof as a mask. Washing with water and drying are performed after etching is finished. When the progress of work of this manner is repeated, uneven condition of the surface of the Al film 21 can be obtained. The outside electrode is bonded finally to complete connection.
JP15635680A 1980-11-06 1980-11-06 Manufacture of semiconductor device Granted JPS5779622A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15635680A JPS5779622A (en) 1980-11-06 1980-11-06 Manufacture of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15635680A JPS5779622A (en) 1980-11-06 1980-11-06 Manufacture of semiconductor device

Publications (2)

Publication Number Publication Date
JPS5779622A true JPS5779622A (en) 1982-05-18
JPS643336B2 JPS643336B2 (en) 1989-01-20

Family

ID=15625959

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15635680A Granted JPS5779622A (en) 1980-11-06 1980-11-06 Manufacture of semiconductor device

Country Status (1)

Country Link
JP (1) JPS5779622A (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS49107478A (en) * 1973-02-15 1974-10-12

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS49107478A (en) * 1973-02-15 1974-10-12

Also Published As

Publication number Publication date
JPS643336B2 (en) 1989-01-20

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