JPS5772004A - Device for measuring curvature - Google Patents

Device for measuring curvature

Info

Publication number
JPS5772004A
JPS5772004A JP14848380A JP14848380A JPS5772004A JP S5772004 A JPS5772004 A JP S5772004A JP 14848380 A JP14848380 A JP 14848380A JP 14848380 A JP14848380 A JP 14848380A JP S5772004 A JPS5772004 A JP S5772004A
Authority
JP
Japan
Prior art keywords
lens
image pickup
point
focused
mirror
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14848380A
Other languages
Japanese (ja)
Inventor
Toshiyuki Iguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ricoh Co Ltd
Original Assignee
Ricoh Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ricoh Co Ltd filed Critical Ricoh Co Ltd
Priority to JP14848380A priority Critical patent/JPS5772004A/en
Publication of JPS5772004A publication Critical patent/JPS5772004A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/255Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures for measuring radius of curvature

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

PURPOSE:To rapidly measure curvatures with high accuracy by a device wherein a reflected light of the light condensed upon a measured object is focused on an image pickup element via a half-mirror, thereby the measure a displacement amount when output of the image pickup element becomes maximum once again while moving the measured object along a light path of the incident light. CONSTITUTION:A parallel beam from a laser 1 is focused on a point F by a condense lens 5 via a condense lens 2, beam expander 3 and a mirror 4. A minute lens 21 to be measured is moved along an optical axis by a feed unit 9, while a reflected light from the minute lens is focused on a solid image pickup device 8 through a half-mirror 6 and a condense lens 7. Output of the image pickup device 8 becomes maximum when the minute lens 21 locates at the point F spaced from a reference point 0 by a distance of 0 and when a distance from the reference point 0 to a position A where the reflected light from the minute lens focuses on the point F is equal to l1. The difference l1-l0 gives the radius of curvature of the minute lens 21. Thus, it becomes possible to rapidly measure curvatures with high accuracy.
JP14848380A 1980-10-23 1980-10-23 Device for measuring curvature Pending JPS5772004A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14848380A JPS5772004A (en) 1980-10-23 1980-10-23 Device for measuring curvature

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14848380A JPS5772004A (en) 1980-10-23 1980-10-23 Device for measuring curvature

Publications (1)

Publication Number Publication Date
JPS5772004A true JPS5772004A (en) 1982-05-06

Family

ID=15453761

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14848380A Pending JPS5772004A (en) 1980-10-23 1980-10-23 Device for measuring curvature

Country Status (1)

Country Link
JP (1) JPS5772004A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10138656B4 (en) * 2000-08-08 2012-06-21 Mitutoyo Corp. Surface profile measuring device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10138656B4 (en) * 2000-08-08 2012-06-21 Mitutoyo Corp. Surface profile measuring device

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