JPS57534A - Radiation thermometer utilizing mirror surface like reflection - Google Patents

Radiation thermometer utilizing mirror surface like reflection

Info

Publication number
JPS57534A
JPS57534A JP7395580A JP7395580A JPS57534A JP S57534 A JPS57534 A JP S57534A JP 7395580 A JP7395580 A JP 7395580A JP 7395580 A JP7395580 A JP 7395580A JP S57534 A JPS57534 A JP S57534A
Authority
JP
Japan
Prior art keywords
radiation
meter
optical axis
strip
black
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7395580A
Other languages
Japanese (ja)
Other versions
JPS6049854B2 (en
Inventor
Mitsuru Aono
Toshihiko Shibata
Kunitoshi Watanabe
Toru Inouchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Priority to JP55073955A priority Critical patent/JPS6049854B2/en
Publication of JPS57534A publication Critical patent/JPS57534A/en
Publication of JPS6049854B2 publication Critical patent/JPS6049854B2/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/04Casings
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/04Casings
    • G01J5/047Mobile mounting; Scanning arrangements
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/07Arrangements for adjusting the solid angle of collected radiation, e.g. adjusting or orienting field of view, tracking position or encoding angular position
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/08Optical arrangements
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/08Optical arrangements
    • G01J5/0893Arrangements to attach devices to a pyrometer, i.e. attaching an optical interface; Spatial relative arrangement of optical elements, e.g. folded beam path
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/08Optical arrangements
    • G01J5/0896Optical arrangements using a light source, e.g. for illuminating a surface
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/52Radiation pyrometry, e.g. infrared or optical thermometry using comparison with reference sources, e.g. disappearing-filament pyrometer
    • G01J5/53Reference sources, e.g. standard lamps; Black bodies

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Radiation Pyrometers (AREA)

Abstract

PURPOSE:To perform optical axis adjustment easily even during working of a furnace by mounting a laser oscillator to a radiation meter by aligning incident radiation and optical axis. CONSTITUTION:The photodetector 16 of a radiation meter 14 measures the temp. of a strip in a high-temp. state by detecting the radiation 26 which is the sum of the radiation 24 projected from a black body radiation source 12 to a strip 10 and specularly reflected from a measurement point 10a and the radiation released by the strip per se. On the other hand, the laser light 50 from a laser oscillator 48 specularly reflects at the measurement point 10a, is projected to the black radiation source 12, reflects on the bottom part thereof and returns again to the meter 14. A mirror 22 is scanned horizontally or vertically by a motor 56, and adjusting mechanisms 28, 38, 42, 44, 46 are so operated that the peak part indicating the photodetecting output of the laser beam appears roughly at the center. Thereby, the optical axis alignment of the radiation meter and the black radiation source is accomplished easily.
JP55073955A 1980-06-02 1980-06-02 Radiation thermometry device that uses specular reflection Expired JPS6049854B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55073955A JPS6049854B2 (en) 1980-06-02 1980-06-02 Radiation thermometry device that uses specular reflection

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55073955A JPS6049854B2 (en) 1980-06-02 1980-06-02 Radiation thermometry device that uses specular reflection

Publications (2)

Publication Number Publication Date
JPS57534A true JPS57534A (en) 1982-01-05
JPS6049854B2 JPS6049854B2 (en) 1985-11-05

Family

ID=13533004

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55073955A Expired JPS6049854B2 (en) 1980-06-02 1980-06-02 Radiation thermometry device that uses specular reflection

Country Status (1)

Country Link
JP (1) JPS6049854B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4638896A (en) * 1984-05-03 1987-01-27 Armstrong Patents Co. Ltd. Shock absorbers
US4647069A (en) * 1983-01-24 1987-03-03 Nissan Motor Company, Limited Automotive suspension system with vehicle height control
US4726453A (en) * 1983-04-11 1988-02-23 F & O Elektronik Systems Gmbh & Co. Self-adjusting single- or twin-tube shock absorber

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4647069A (en) * 1983-01-24 1987-03-03 Nissan Motor Company, Limited Automotive suspension system with vehicle height control
US4726453A (en) * 1983-04-11 1988-02-23 F & O Elektronik Systems Gmbh & Co. Self-adjusting single- or twin-tube shock absorber
US4638896A (en) * 1984-05-03 1987-01-27 Armstrong Patents Co. Ltd. Shock absorbers

Also Published As

Publication number Publication date
JPS6049854B2 (en) 1985-11-05

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