JPS5770402A - Profile measuring device - Google Patents
Profile measuring deviceInfo
- Publication number
- JPS5770402A JPS5770402A JP14794280A JP14794280A JPS5770402A JP S5770402 A JPS5770402 A JP S5770402A JP 14794280 A JP14794280 A JP 14794280A JP 14794280 A JP14794280 A JP 14794280A JP S5770402 A JPS5770402 A JP S5770402A
- Authority
- JP
- Japan
- Prior art keywords
- measured
- profile
- laser
- gate circuit
- laser beam
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Measurement Of Optical Distance (AREA)
Abstract
PURPOSE:To improve SN ratio and to make the execution of profile measurement of high accuracy possible by receiving the poulse laser beam reflected by the surface to be measured with a photodetecting system having a gate circuit operating in response to polses. CONSTITUTION:The laser beam outputted from a pulse laser oscillator irradiates the surface to be measured and the reflected beam thereof is received with an photodetection system having a gate circuit operting in accordance with pulses, whereby the profile of the surface to be measured is measured from the incident and exit angles of the laser. For example, the furnace top part 2 of a blast furnace 1 is irradiated via a reflection mirror 6a and a scanning mirro 7 having an angle encoder by the laser beam L outputted from a laser oscillator 6, and the reflected beam from the irradiation point A is received in a photodetecting system 5. At this time, a photodetector 11 receives the control of a gate circuit 12 operating with delay for a constant time from pulse generation by the signal from an electric power source circuit 15 and performs detection of good SN ratios and therefore the profile of the surface to be measured determined from the incident and exit angles is of high accuracy.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14794280A JPS5770402A (en) | 1980-10-22 | 1980-10-22 | Profile measuring device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14794280A JPS5770402A (en) | 1980-10-22 | 1980-10-22 | Profile measuring device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5770402A true JPS5770402A (en) | 1982-04-30 |
Family
ID=15441542
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14794280A Pending JPS5770402A (en) | 1980-10-22 | 1980-10-22 | Profile measuring device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5770402A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59120910A (en) * | 1982-12-28 | 1984-07-12 | Toshiba Corp | Device for measuring profile of blast furnace |
| JPS6036908A (en) * | 1983-06-22 | 1985-02-26 | エヌ・ヴイ−・オプテイ−シエ インダストリ−“ドウ アウド デイルフト” | Survey system for measuring distance between point on surface of body and reference level in noncontacting manner by using measurement method based on triangulation principle |
-
1980
- 1980-10-22 JP JP14794280A patent/JPS5770402A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59120910A (en) * | 1982-12-28 | 1984-07-12 | Toshiba Corp | Device for measuring profile of blast furnace |
| JPS6036908A (en) * | 1983-06-22 | 1985-02-26 | エヌ・ヴイ−・オプテイ−シエ インダストリ−“ドウ アウド デイルフト” | Survey system for measuring distance between point on surface of body and reference level in noncontacting manner by using measurement method based on triangulation principle |
| JPH0574764B2 (en) * | 1983-06-22 | 1993-10-19 | Optische Ind De Oude Delft Nv |
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