JPS5766645A - Manufacture of semiconductor device - Google Patents
Manufacture of semiconductor deviceInfo
- Publication number
- JPS5766645A JPS5766645A JP55141623A JP14162380A JPS5766645A JP S5766645 A JPS5766645 A JP S5766645A JP 55141623 A JP55141623 A JP 55141623A JP 14162380 A JP14162380 A JP 14162380A JP S5766645 A JPS5766645 A JP S5766645A
- Authority
- JP
- Japan
- Prior art keywords
- silicon
- gas
- layer
- sputtering
- metallic film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H10P14/69433—
Landscapes
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Formation Of Insulating Films (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55141623A JPS5766645A (en) | 1980-10-09 | 1980-10-09 | Manufacture of semiconductor device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55141623A JPS5766645A (en) | 1980-10-09 | 1980-10-09 | Manufacture of semiconductor device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5766645A true JPS5766645A (en) | 1982-04-22 |
| JPS6331933B2 JPS6331933B2 (en:Method) | 1988-06-27 |
Family
ID=15296340
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP55141623A Granted JPS5766645A (en) | 1980-10-09 | 1980-10-09 | Manufacture of semiconductor device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5766645A (en:Method) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60132345A (ja) * | 1983-12-02 | 1985-07-15 | Yokogawa Hewlett Packard Ltd | 半導体素子の製造方法 |
| JP2001514448A (ja) * | 1997-08-25 | 2001-09-11 | アドバンスト・マイクロ・ディバイシズ・インコーポレイテッド | Pecvd窒化/酸窒化膜へのリン注入による不揮発性メモリセルの電荷損失の低減 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5471577A (en) * | 1977-11-18 | 1979-06-08 | Toshiba Corp | Production of semiconductor device |
| JPS5479567A (en) * | 1977-12-07 | 1979-06-25 | Chiyou Uru Esu Ai Gijiyutsu Ke | Method of fabricating semiconductor |
-
1980
- 1980-10-09 JP JP55141623A patent/JPS5766645A/ja active Granted
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5471577A (en) * | 1977-11-18 | 1979-06-08 | Toshiba Corp | Production of semiconductor device |
| JPS5479567A (en) * | 1977-12-07 | 1979-06-25 | Chiyou Uru Esu Ai Gijiyutsu Ke | Method of fabricating semiconductor |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60132345A (ja) * | 1983-12-02 | 1985-07-15 | Yokogawa Hewlett Packard Ltd | 半導体素子の製造方法 |
| JP2001514448A (ja) * | 1997-08-25 | 2001-09-11 | アドバンスト・マイクロ・ディバイシズ・インコーポレイテッド | Pecvd窒化/酸窒化膜へのリン注入による不揮発性メモリセルの電荷損失の低減 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6331933B2 (en:Method) | 1988-06-27 |
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