JPS5760868A - Cmos memory cell - Google Patents

Cmos memory cell

Info

Publication number
JPS5760868A
JPS5760868A JP55135634A JP13563480A JPS5760868A JP S5760868 A JPS5760868 A JP S5760868A JP 55135634 A JP55135634 A JP 55135634A JP 13563480 A JP13563480 A JP 13563480A JP S5760868 A JPS5760868 A JP S5760868A
Authority
JP
Japan
Prior art keywords
drain
channel
gate
oxide film
openings
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP55135634A
Other languages
Japanese (ja)
Other versions
JPH0435903B2 (en
Inventor
Shinji Morozumi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Suwa Seikosha KK
Original Assignee
Seiko Epson Corp
Suwa Seikosha KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp, Suwa Seikosha KK filed Critical Seiko Epson Corp
Priority to JP55135634A priority Critical patent/JPS5760868A/en
Publication of JPS5760868A publication Critical patent/JPS5760868A/en
Publication of JPH0435903B2 publication Critical patent/JPH0435903B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B10/00Static random access memory [SRAM] devices

Abstract

PURPOSE:To reduce cell size and to increase memory capacity, by a method wherein gate electrodes of a CMOS inverter are made common and N-channel and P- channel FETs are arranged under and above the gate electrodes respectively and each drain is connected. CONSTITUTION:A gate oxide film is made in a border 18 by selective oxidization for openings 10, 11 and poly Si layers 19-21, 27 are made and a source and a drain 31-33 are made by P-ion implantation. Next, an oxide film 36 is stacked to provide openings on the layers 19, 20 and a gate oxide film is made on the surface by thermal oxidization. Next, openings 12-14 are provided to stack poly Si 22, 23 and selective P<+> diffusion is applied.Furthermore, openings 15, 16 are provided after piling up an oxide film 35 and Al-Si layers 24-26 are made. As a result, an N- channel FET of a source 31, a drain 32, and a gate 20 connected to a power source VSS and a P-channel FET of a source 35, a channel 34, a drain 36, and a gate 20 connected to a power source VDD will be obtained and a CMOS inverter connecting each drain through diodes will be finished and N and P channel FETs are in solid arrangement which permits small size and memory capacity is increased an compared with the same size ones.
JP55135634A 1980-09-29 1980-09-29 Cmos memory cell Granted JPS5760868A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55135634A JPS5760868A (en) 1980-09-29 1980-09-29 Cmos memory cell

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55135634A JPS5760868A (en) 1980-09-29 1980-09-29 Cmos memory cell

Related Child Applications (9)

Application Number Title Priority Date Filing Date
JP1090318A Division JPH0221656A (en) 1989-04-10 1989-04-10 Cmos memory cell
JP1090316A Division JPH0214566A (en) 1989-04-10 1989-04-10 Cmos memory cell
JP1090314A Division JPH0214564A (en) 1989-04-10 1989-04-10 Cmos memory cell
JP1090317A Division JPH0221655A (en) 1989-04-10 1989-04-10 Cmos memory cell
JP1090315A Division JPH0214565A (en) 1989-04-10 1989-04-10 Cmos memory cell
JP3008520A Division JP2562383B2 (en) 1991-01-28 1991-01-28 Thin film transistor
JP3008517A Division JPH04211165A (en) 1991-01-28 1991-01-28 Random access memory
JP3008519A Division JP2602125B2 (en) 1991-01-28 1991-01-28 Method for manufacturing thin film transistor
JP3008518A Division JPH04211166A (en) 1991-01-28 1991-01-28 Semiconductor device

Publications (2)

Publication Number Publication Date
JPS5760868A true JPS5760868A (en) 1982-04-13
JPH0435903B2 JPH0435903B2 (en) 1992-06-12

Family

ID=15156387

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55135634A Granted JPS5760868A (en) 1980-09-29 1980-09-29 Cmos memory cell

Country Status (1)

Country Link
JP (1) JPS5760868A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01102955A (en) * 1987-10-15 1989-04-20 Nec Corp Mos semiconductor memory circuit device

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS503787A (en) * 1973-05-16 1975-01-16
JPS5036351A (en) * 1973-08-04 1975-04-05
JPS5562771A (en) * 1978-11-02 1980-05-12 Toshiba Corp Integrated circuit device
JPS5691470A (en) * 1979-12-25 1981-07-24 Toshiba Corp Semiconductor

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS503787A (en) * 1973-05-16 1975-01-16
JPS5036351A (en) * 1973-08-04 1975-04-05
JPS5562771A (en) * 1978-11-02 1980-05-12 Toshiba Corp Integrated circuit device
JPS5691470A (en) * 1979-12-25 1981-07-24 Toshiba Corp Semiconductor

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01102955A (en) * 1987-10-15 1989-04-20 Nec Corp Mos semiconductor memory circuit device
JPH0714009B2 (en) * 1987-10-15 1995-02-15 日本電気株式会社 MOS type semiconductor memory circuit device

Also Published As

Publication number Publication date
JPH0435903B2 (en) 1992-06-12

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