JPS5753604A - Thickness gauge - Google Patents

Thickness gauge

Info

Publication number
JPS5753604A
JPS5753604A JP12853680A JP12853680A JPS5753604A JP S5753604 A JPS5753604 A JP S5753604A JP 12853680 A JP12853680 A JP 12853680A JP 12853680 A JP12853680 A JP 12853680A JP S5753604 A JPS5753604 A JP S5753604A
Authority
JP
Japan
Prior art keywords
thickness
ratio
metallic target
eddy
epsilon
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12853680A
Other languages
English (en)
Other versions
JPS624641B2 (ja
Inventor
Hitoshi Inomata
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokogawa Electric Corp
Original Assignee
Yokogawa Electric Corp
Yokogawa Hokushin Electric Corp
Yokogawa Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Electric Corp, Yokogawa Hokushin Electric Corp, Yokogawa Electric Works Ltd filed Critical Yokogawa Electric Corp
Priority to JP12853680A priority Critical patent/JPS5753604A/ja
Publication of JPS5753604A publication Critical patent/JPS5753604A/ja
Publication of JPS624641B2 publication Critical patent/JPS624641B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G01B7/10—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
JP12853680A 1980-09-18 1980-09-18 Thickness gauge Granted JPS5753604A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12853680A JPS5753604A (en) 1980-09-18 1980-09-18 Thickness gauge

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12853680A JPS5753604A (en) 1980-09-18 1980-09-18 Thickness gauge

Publications (2)

Publication Number Publication Date
JPS5753604A true JPS5753604A (en) 1982-03-30
JPS624641B2 JPS624641B2 (ja) 1987-01-31

Family

ID=14987175

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12853680A Granted JPS5753604A (en) 1980-09-18 1980-09-18 Thickness gauge

Country Status (1)

Country Link
JP (1) JPS5753604A (ja)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6013203A (ja) * 1983-06-15 1985-01-23 シ−アイエスイ−・セントロ・インフオ−マチオニ・ストウデイ・エスペリエンツエ・エスピ−エイ キユリ−温度を超える温度にある肉厚の金属材料の厚さを非接触状態で測定するための測定装置
JPS60119016A (ja) * 1983-11-30 1985-06-26 昭和電線電纜株式会社 電線、ケーブルのゴム・プラスチツク被覆の難燃化処理方法
JPS6166104A (ja) * 1984-09-07 1986-04-04 Anelva Corp 金属薄膜膜厚測定方法
JP2002148012A (ja) * 2000-11-08 2002-05-22 Ulvac Japan Ltd 膜厚測定装置及び膜厚測定方法
JP2007514067A (ja) * 2003-12-10 2007-05-31 メッツォ ペーパー インコーポレイテッド 繊維状ウェブを処理するための装置における稼働パラメータを制御する方法及びその方法を提供するための機器
JP2008304471A (ja) * 2000-03-28 2008-12-18 Toshiba Corp 膜厚測定装置、膜厚測定方法および記録媒体
JP2009545733A (ja) * 2006-08-03 2009-12-24 コミサリア ア レネルジ アトミク 分離した放射／受信機能により導電部の渦電流検査を行う方法及びデバイス

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6013203A (ja) * 1983-06-15 1985-01-23 シ−アイエスイ−・セントロ・インフオ−マチオニ・ストウデイ・エスペリエンツエ・エスピ−エイ キユリ−温度を超える温度にある肉厚の金属材料の厚さを非接触状態で測定するための測定装置
JPS60119016A (ja) * 1983-11-30 1985-06-26 昭和電線電纜株式会社 電線、ケーブルのゴム・プラスチツク被覆の難燃化処理方法
JPH0566690B2 (ja) * 1983-11-30 1993-09-22 Showa Electric Wire & Cable Co
JPS6166104A (ja) * 1984-09-07 1986-04-04 Anelva Corp 金属薄膜膜厚測定方法
JPH056641B2 (ja) * 1984-09-07 1993-01-27 Anelva Corp
JP2008304471A (ja) * 2000-03-28 2008-12-18 Toshiba Corp 膜厚測定装置、膜厚測定方法および記録媒体
JP2002148012A (ja) * 2000-11-08 2002-05-22 Ulvac Japan Ltd 膜厚測定装置及び膜厚測定方法
JP2007514067A (ja) * 2003-12-10 2007-05-31 メッツォ ペーパー インコーポレイテッド 繊維状ウェブを処理するための装置における稼働パラメータを制御する方法及びその方法を提供するための機器
JP2009545733A (ja) * 2006-08-03 2009-12-24 コミサリア ア レネルジ アトミク 分離した放射／受信機能により導電部の渦電流検査を行う方法及びデバイス

Also Published As

Publication number Publication date
JPS624641B2 (ja) 1987-01-31

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