JPS557630A - Inspection method of depth for peening machined layer at internal surface of tube - Google Patents
Inspection method of depth for peening machined layer at internal surface of tubeInfo
- Publication number
- JPS557630A JPS557630A JP8002878A JP8002878A JPS557630A JP S557630 A JPS557630 A JP S557630A JP 8002878 A JP8002878 A JP 8002878A JP 8002878 A JP8002878 A JP 8002878A JP S557630 A JPS557630 A JP S557630A
- Authority
- JP
- Japan
- Prior art keywords
- depth
- tube
- machined
- dax
- amplifiers
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
PURPOSE: To make quantitative judgement for continuous inspection of non-destructive method, by detecting the unbalanced potential produced at the bridge circuit with eddy current.
CONSTITUTION: After balancing the bridge circuit BRG, the reference tube of machined layer depth zero and the tube known for the machined depth t1 are inserted for the coils L1 and L2 of which impedance is changed with eddy current. The output level of the DC amplifiers DAX, DAY at that time is obtained, and similarly with the tube known for the machined depth t2 and inserted for the coil L2, the output level of the amplifiers DAX and DAY is obtained. Next, as to the tube to be inspected, the inspection is conducted as the same steps as mentioned above to check whether the output level of the amplifiers DAX, DAY at that time is between both output levels for the machined depths t1 and t2 or not. Thus, the depth of machined layer can quantiatively be judged.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8002878A JPS557630A (en) | 1978-06-30 | 1978-06-30 | Inspection method of depth for peening machined layer at internal surface of tube |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8002878A JPS557630A (en) | 1978-06-30 | 1978-06-30 | Inspection method of depth for peening machined layer at internal surface of tube |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS557630A true JPS557630A (en) | 1980-01-19 |
Family
ID=13706814
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8002878A Pending JPS557630A (en) | 1978-06-30 | 1978-06-30 | Inspection method of depth for peening machined layer at internal surface of tube |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS557630A (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62132461U (en) * | 1986-02-14 | 1987-08-21 | ||
JPH03170841A (en) * | 1989-11-30 | 1991-07-24 | Nippon Yakin Kogyo Co Ltd | Non-destructive hardness measurement for conductive material |
WO2015107725A1 (en) * | 2014-01-20 | 2015-07-23 | 新東工業株式会社 | Surface characteristic examination device and surface characteristic examination method |
WO2015145833A1 (en) * | 2014-03-24 | 2015-10-01 | 新東工業株式会社 | Surface characteristic inspection method and surface characteristic inspection device |
CZ306012B6 (en) * | 2014-09-03 | 2016-06-22 | Vysoké Učení Technické V Brně | Non-destructive indicator of local subsurface non-homogeneities |
WO2018066171A1 (en) * | 2016-10-06 | 2018-04-12 | 新東工業株式会社 | Surface property inspection method and surface property inspection device |
-
1978
- 1978-06-30 JP JP8002878A patent/JPS557630A/en active Pending
Cited By (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62132461U (en) * | 1986-02-14 | 1987-08-21 | ||
JPH03170841A (en) * | 1989-11-30 | 1991-07-24 | Nippon Yakin Kogyo Co Ltd | Non-destructive hardness measurement for conductive material |
US9964520B2 (en) | 2014-01-20 | 2018-05-08 | Sintokogio, Ltd. | Surface property inspection device and method |
JP6052713B2 (en) * | 2014-01-20 | 2016-12-27 | 新東工業株式会社 | Surface property inspection method |
JP2016224073A (en) * | 2014-01-20 | 2016-12-28 | 新東工業株式会社 | Surface characteristic inspection device and surface characteristic inspection method |
WO2015107725A1 (en) * | 2014-01-20 | 2015-07-23 | 新東工業株式会社 | Surface characteristic examination device and surface characteristic examination method |
TWI641818B (en) * | 2014-01-20 | 2018-11-21 | 新東工業股份有限公司 | Surface property inspection method |
WO2015145833A1 (en) * | 2014-03-24 | 2015-10-01 | 新東工業株式会社 | Surface characteristic inspection method and surface characteristic inspection device |
JPWO2015145833A1 (en) * | 2014-03-24 | 2017-04-13 | 新東工業株式会社 | Surface characteristic inspection method and surface characteristic inspection apparatus |
US10048227B2 (en) | 2014-03-24 | 2018-08-14 | Sintokogio, Ltd. | Surface property inspection method and apparatus |
CZ306012B6 (en) * | 2014-09-03 | 2016-06-22 | Vysoké Učení Technické V Brně | Non-destructive indicator of local subsurface non-homogeneities |
WO2018066171A1 (en) * | 2016-10-06 | 2018-04-12 | 新東工業株式会社 | Surface property inspection method and surface property inspection device |
US10962503B2 (en) | 2016-10-06 | 2021-03-30 | Sintokogio, Ltd. | Surface characteristic inspection method and surface characteristic inspection device |
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