JPS557630A - Inspection method of depth for peening machined layer at internal surface of tube - Google Patents

Inspection method of depth for peening machined layer at internal surface of tube

Info

Publication number
JPS557630A
JPS557630A JP8002878A JP8002878A JPS557630A JP S557630 A JPS557630 A JP S557630A JP 8002878 A JP8002878 A JP 8002878A JP 8002878 A JP8002878 A JP 8002878A JP S557630 A JPS557630 A JP S557630A
Authority
JP
Japan
Prior art keywords
depth
tube
machined
dax
amplifiers
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8002878A
Other languages
Japanese (ja)
Inventor
Hideaki Tanaka
Shigetoshi Hyodo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Sumitomo Metal Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Metal Industries Ltd filed Critical Sumitomo Metal Industries Ltd
Priority to JP8002878A priority Critical patent/JPS557630A/en
Publication of JPS557630A publication Critical patent/JPS557630A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE: To make quantitative judgement for continuous inspection of non-destructive method, by detecting the unbalanced potential produced at the bridge circuit with eddy current.
CONSTITUTION: After balancing the bridge circuit BRG, the reference tube of machined layer depth zero and the tube known for the machined depth t1 are inserted for the coils L1 and L2 of which impedance is changed with eddy current. The output level of the DC amplifiers DAX, DAY at that time is obtained, and similarly with the tube known for the machined depth t2 and inserted for the coil L2, the output level of the amplifiers DAX and DAY is obtained. Next, as to the tube to be inspected, the inspection is conducted as the same steps as mentioned above to check whether the output level of the amplifiers DAX, DAY at that time is between both output levels for the machined depths t1 and t2 or not. Thus, the depth of machined layer can quantiatively be judged.
COPYRIGHT: (C)1980,JPO&Japio
JP8002878A 1978-06-30 1978-06-30 Inspection method of depth for peening machined layer at internal surface of tube Pending JPS557630A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8002878A JPS557630A (en) 1978-06-30 1978-06-30 Inspection method of depth for peening machined layer at internal surface of tube

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8002878A JPS557630A (en) 1978-06-30 1978-06-30 Inspection method of depth for peening machined layer at internal surface of tube

Publications (1)

Publication Number Publication Date
JPS557630A true JPS557630A (en) 1980-01-19

Family

ID=13706814

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8002878A Pending JPS557630A (en) 1978-06-30 1978-06-30 Inspection method of depth for peening machined layer at internal surface of tube

Country Status (1)

Country Link
JP (1) JPS557630A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62132461U (en) * 1986-02-14 1987-08-21
JPH03170841A (en) * 1989-11-30 1991-07-24 Nippon Yakin Kogyo Co Ltd Non-destructive hardness measurement for conductive material
WO2015107725A1 (en) * 2014-01-20 2015-07-23 新東工業株式会社 Surface characteristic examination device and surface characteristic examination method
WO2015145833A1 (en) * 2014-03-24 2015-10-01 新東工業株式会社 Surface characteristic inspection method and surface characteristic inspection device
CZ306012B6 (en) * 2014-09-03 2016-06-22 Vysoké Učení Technické V Brně Non-destructive indicator of local subsurface non-homogeneities
WO2018066171A1 (en) * 2016-10-06 2018-04-12 新東工業株式会社 Surface property inspection method and surface property inspection device

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62132461U (en) * 1986-02-14 1987-08-21
JPH03170841A (en) * 1989-11-30 1991-07-24 Nippon Yakin Kogyo Co Ltd Non-destructive hardness measurement for conductive material
US9964520B2 (en) 2014-01-20 2018-05-08 Sintokogio, Ltd. Surface property inspection device and method
JP6052713B2 (en) * 2014-01-20 2016-12-27 新東工業株式会社 Surface property inspection method
JP2016224073A (en) * 2014-01-20 2016-12-28 新東工業株式会社 Surface characteristic inspection device and surface characteristic inspection method
WO2015107725A1 (en) * 2014-01-20 2015-07-23 新東工業株式会社 Surface characteristic examination device and surface characteristic examination method
TWI641818B (en) * 2014-01-20 2018-11-21 新東工業股份有限公司 Surface property inspection method
WO2015145833A1 (en) * 2014-03-24 2015-10-01 新東工業株式会社 Surface characteristic inspection method and surface characteristic inspection device
JPWO2015145833A1 (en) * 2014-03-24 2017-04-13 新東工業株式会社 Surface characteristic inspection method and surface characteristic inspection apparatus
US10048227B2 (en) 2014-03-24 2018-08-14 Sintokogio, Ltd. Surface property inspection method and apparatus
CZ306012B6 (en) * 2014-09-03 2016-06-22 Vysoké Učení Technické V Brně Non-destructive indicator of local subsurface non-homogeneities
WO2018066171A1 (en) * 2016-10-06 2018-04-12 新東工業株式会社 Surface property inspection method and surface property inspection device
US10962503B2 (en) 2016-10-06 2021-03-30 Sintokogio, Ltd. Surface characteristic inspection method and surface characteristic inspection device

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