JPS62132461U - - Google Patents
Info
- Publication number
- JPS62132461U JPS62132461U JP1983186U JP1983186U JPS62132461U JP S62132461 U JPS62132461 U JP S62132461U JP 1983186 U JP1983186 U JP 1983186U JP 1983186 U JP1983186 U JP 1983186U JP S62132461 U JPS62132461 U JP S62132461U
- Authority
- JP
- Japan
- Prior art keywords
- probe
- eddy current
- tube
- flaw detection
- support member
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 11
- 238000001514 detection method Methods 0.000 claims 3
- 229920006311 Urethane elastomer Polymers 0.000 claims 1
- 239000013013 elastic material Substances 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Description
第１図は本考案にかかる第１実施例がチユーブ
内に挿入された状態の概略構成図、第２図は第２
実施例がチユーブ内に挿入された状態の概略構成
図である。
１……チユーブ、２……渦流探傷用プローブ、
３……探触部、５，５０……探触部支持部材とし
てのセンタリング部材、６……電磁コイル。
FIG. 1 is a schematic configuration diagram of the first embodiment of the present invention inserted into a tube, and FIG.
FIG. 2 is a schematic configuration diagram of the embodiment inserted into a tube. 1...Tube, 2...Eddy current probe,
3... Probe unit, 5, 50... Centering member as a probe part support member, 6... Electromagnetic coil.
Claims (1)
構成するとともに、この探触部をチユーブに対し
相対移動させてチユーブに発生する渦電流でチユ
ーブの探傷を行う渦流探傷用プローブであつて、
前記探触部の移動方向前後には、弾性材料からな
る探触部支持部材が設けられていることを特徴と
する渦流探傷用プローブ。 (2) 実用新案登録請求の範囲第１項において、
前記探触部支持部材は、ウレタンゴムで形成され
ていることを特徴とする渦流探傷用プローブ。[Claims for Utility Model Registration] (1) A probe having an electromagnetic coil for generating eddy current is constructed, and the probe is moved relative to the tube to detect flaws in the tube using the eddy current generated in the tube. It is an eddy current flaw detection probe that performs
An eddy current flaw detection probe characterized in that a probe support member made of an elastic material is provided before and after the probe in a moving direction. (2) In paragraph 1 of the claims for utility model registration,
An eddy current flaw detection probe characterized in that the probe support member is made of urethane rubber.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1983186U JPS62132461U (en) | 1986-02-14 | 1986-02-14 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1983186U JPS62132461U (en) | 1986-02-14 | 1986-02-14 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS62132461U true JPS62132461U (en) | 1987-08-21 |
Family
ID=30814776
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1983186U Pending JPS62132461U (en) | 1986-02-14 | 1986-02-14 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS62132461U (en) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS557630A (en) * | 1978-06-30 | 1980-01-19 | Sumitomo Metal Ind Ltd | Inspection method of depth for peening machined layer at internal surface of tube |
| JPS5949955B2 (en) * | 1977-01-27 | 1984-12-05 | セイコーエプソン株式会社 | liquid crystal display device |
-
1986
- 1986-02-14 JP JP1983186U patent/JPS62132461U/ja active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5949955B2 (en) * | 1977-01-27 | 1984-12-05 | セイコーエプソン株式会社 | liquid crystal display device |
| JPS557630A (en) * | 1978-06-30 | 1980-01-19 | Sumitomo Metal Ind Ltd | Inspection method of depth for peening machined layer at internal surface of tube |
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