JPH0368054U - - Google Patents
Info
- Publication number
- JPH0368054U JPH0368054U JP13020089U JP13020089U JPH0368054U JP H0368054 U JPH0368054 U JP H0368054U JP 13020089 U JP13020089 U JP 13020089U JP 13020089 U JP13020089 U JP 13020089U JP H0368054 U JPH0368054 U JP H0368054U
- Authority
- JP
- Japan
- Prior art keywords
- eddy current
- flaw detection
- current flaw
- detection probe
- magnetic circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000001514 detection method Methods 0.000 claims description 9
- 239000000523 sample Substances 0.000 claims description 6
- 230000005415 magnetization Effects 0.000 claims description 5
- 239000000463 material Substances 0.000 claims description 3
- 230000035699 permeability Effects 0.000 claims 2
- 230000008878 coupling Effects 0.000 claims 1
- 238000010168 coupling process Methods 0.000 claims 1
- 238000005859 coupling reaction Methods 0.000 claims 1
Landscapes
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Description
第1図は本考案の一実施例である渦流探傷装置
の構成を説明する縦断面図である。
{14……ベース部材、46……支持フレーム
}(連結部材)、20……直流磁化コイル、28
……線材(被検査材)、{30……ケース、54
……ガイドスリーブ}(磁気回路形成部材)、5
8……渦流探傷プローブ。
FIG. 1 is a longitudinal cross-sectional view illustrating the configuration of an eddy current flaw detection device that is an embodiment of the present invention. {14...base member, 46...support frame} (connection member), 20...DC magnetization coil, 28
... Wire rod (material to be inspected), {30 ... Case, 54
...Guide sleeve} (magnetic circuit forming member), 5
8...Eddy current flaw detection probe.
Claims (1)
ーブと、該渦流探傷プローブの近傍に設けられ、
前記一中心線まわりに巻回された直流磁化コイル
とを備え、前記一中心線上を相対移動させられる
断面円形の被検査材を磁化しつつその表面疵を検
出する渦流探傷装置において、 前記一中心線方向における前記渦流探傷プロー
ブおよび前記直流磁化コイルの両側に設けられた
透磁率の高い一対の磁気回路形成部材と、 該一対の磁気回路形成部材を磁気的に連結し、
前記渦流探傷プローブおよび前記直流磁化コイル
の内側に位置する部分の前記被検査材と該一対の
磁気回路形成部材とを含んで、該直流磁化コイル
による磁気回路を形成する透磁率の高い連結部材
と を有することを特徴とする渦流探傷装置。[Claims for Utility Model Registration] An eddy current flaw detection probe that is rotationally driven around one center line, and an eddy current flaw detection probe provided near the eddy current flaw detection probe,
An eddy current flaw detection device comprising a DC magnetization coil wound around the one center line, and detecting surface flaws while magnetizing a material to be inspected having a circular cross section that is relatively moved on the one center line, a pair of magnetic circuit forming members with high magnetic permeability provided on both sides of the eddy current flaw detection probe and the DC magnetization coil in the linear direction; and magnetically coupling the pair of magnetic circuit forming members,
A connecting member with high magnetic permeability that forms a magnetic circuit by the DC magnetization coil, including the eddy current flaw detection probe, the inspected material located inside the DC magnetization coil, and the pair of magnetic circuit forming members; An eddy current flaw detection device characterized by having.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1989130200U JP2506579Y2 (en) | 1989-11-08 | 1989-11-08 | Eddy current flaw detector |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1989130200U JP2506579Y2 (en) | 1989-11-08 | 1989-11-08 | Eddy current flaw detector |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0368054U true JPH0368054U (en) | 1991-07-03 |
JP2506579Y2 JP2506579Y2 (en) | 1996-08-14 |
Family
ID=31677790
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1989130200U Expired - Lifetime JP2506579Y2 (en) | 1989-11-08 | 1989-11-08 | Eddy current flaw detector |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2506579Y2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2012506544A (en) * | 2008-10-23 | 2012-03-15 | インスティトゥート ドクター フェルスター ゲーエムベーハー ウント コー カーゲー | Inspection method and inspection apparatus for inspecting elongated object using coil |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5472581U (en) * | 1977-10-31 | 1979-05-23 | ||
JPS5972552U (en) * | 1982-11-06 | 1984-05-17 | 住友金属工業株式会社 | Magnetic saturation device for eddy current flaw detection |
-
1989
- 1989-11-08 JP JP1989130200U patent/JP2506579Y2/en not_active Expired - Lifetime
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5472581U (en) * | 1977-10-31 | 1979-05-23 | ||
JPS5972552U (en) * | 1982-11-06 | 1984-05-17 | 住友金属工業株式会社 | Magnetic saturation device for eddy current flaw detection |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2012506544A (en) * | 2008-10-23 | 2012-03-15 | インスティトゥート ドクター フェルスター ゲーエムベーハー ウント コー カーゲー | Inspection method and inspection apparatus for inspecting elongated object using coil |
EP2356439B1 (en) * | 2008-10-23 | 2015-12-16 | Institut Dr. Foerster Gmbh & Co. Kg | Test method and test device for testing elongate objects by means of a coil |
Also Published As
Publication number | Publication date |
---|---|
JP2506579Y2 (en) | 1996-08-14 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
EXPY | Cancellation because of completion of term |