JPH0368054U - - Google Patents

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Publication number
JPH0368054U
JPH0368054U JP13020089U JP13020089U JPH0368054U JP H0368054 U JPH0368054 U JP H0368054U JP 13020089 U JP13020089 U JP 13020089U JP 13020089 U JP13020089 U JP 13020089U JP H0368054 U JPH0368054 U JP H0368054U
Authority
JP
Japan
Prior art keywords
eddy current
flaw detection
current flaw
detection probe
magnetic circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13020089U
Other languages
Japanese (ja)
Other versions
JP2506579Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1989130200U priority Critical patent/JP2506579Y2/en
Publication of JPH0368054U publication Critical patent/JPH0368054U/ja
Application granted granted Critical
Publication of JP2506579Y2 publication Critical patent/JP2506579Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

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  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本考案の一実施例である渦流探傷装置
の構成を説明する縦断面図である。 {14……ベース部材、46……支持フレーム
}(連結部材)、20……直流磁化コイル、28
……線材(被検査材)、{30……ケース、54
……ガイドスリーブ}(磁気回路形成部材)、5
8……渦流探傷プローブ。
FIG. 1 is a longitudinal cross-sectional view illustrating the configuration of an eddy current flaw detection device that is an embodiment of the present invention. {14...base member, 46...support frame} (connection member), 20...DC magnetization coil, 28
... Wire rod (material to be inspected), {30 ... Case, 54
...Guide sleeve} (magnetic circuit forming member), 5
8...Eddy current flaw detection probe.

Claims (1)

【実用新案登録請求の範囲】 一中心線まわりに回転駆動される渦流探傷プロ
ーブと、該渦流探傷プローブの近傍に設けられ、
前記一中心線まわりに巻回された直流磁化コイル
とを備え、前記一中心線上を相対移動させられる
断面円形の被検査材を磁化しつつその表面疵を検
出する渦流探傷装置において、 前記一中心線方向における前記渦流探傷プロー
ブおよび前記直流磁化コイルの両側に設けられた
透磁率の高い一対の磁気回路形成部材と、 該一対の磁気回路形成部材を磁気的に連結し、
前記渦流探傷プローブおよび前記直流磁化コイル
の内側に位置する部分の前記被検査材と該一対の
磁気回路形成部材とを含んで、該直流磁化コイル
による磁気回路を形成する透磁率の高い連結部材
と を有することを特徴とする渦流探傷装置。
[Claims for Utility Model Registration] An eddy current flaw detection probe that is rotationally driven around one center line, and an eddy current flaw detection probe provided near the eddy current flaw detection probe,
An eddy current flaw detection device comprising a DC magnetization coil wound around the one center line, and detecting surface flaws while magnetizing a material to be inspected having a circular cross section that is relatively moved on the one center line, a pair of magnetic circuit forming members with high magnetic permeability provided on both sides of the eddy current flaw detection probe and the DC magnetization coil in the linear direction; and magnetically coupling the pair of magnetic circuit forming members,
A connecting member with high magnetic permeability that forms a magnetic circuit by the DC magnetization coil, including the eddy current flaw detection probe, the inspected material located inside the DC magnetization coil, and the pair of magnetic circuit forming members; An eddy current flaw detection device characterized by having.
JP1989130200U 1989-11-08 1989-11-08 Eddy current flaw detector Expired - Lifetime JP2506579Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1989130200U JP2506579Y2 (en) 1989-11-08 1989-11-08 Eddy current flaw detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1989130200U JP2506579Y2 (en) 1989-11-08 1989-11-08 Eddy current flaw detector

Publications (2)

Publication Number Publication Date
JPH0368054U true JPH0368054U (en) 1991-07-03
JP2506579Y2 JP2506579Y2 (en) 1996-08-14

Family

ID=31677790

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1989130200U Expired - Lifetime JP2506579Y2 (en) 1989-11-08 1989-11-08 Eddy current flaw detector

Country Status (1)

Country Link
JP (1) JP2506579Y2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012506544A (en) * 2008-10-23 2012-03-15 インスティトゥート ドクター フェルスター ゲーエムベーハー ウント コー カーゲー Inspection method and inspection apparatus for inspecting elongated object using coil

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5472581U (en) * 1977-10-31 1979-05-23
JPS5972552U (en) * 1982-11-06 1984-05-17 住友金属工業株式会社 Magnetic saturation device for eddy current flaw detection

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5472581U (en) * 1977-10-31 1979-05-23
JPS5972552U (en) * 1982-11-06 1984-05-17 住友金属工業株式会社 Magnetic saturation device for eddy current flaw detection

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012506544A (en) * 2008-10-23 2012-03-15 インスティトゥート ドクター フェルスター ゲーエムベーハー ウント コー カーゲー Inspection method and inspection apparatus for inspecting elongated object using coil
EP2356439B1 (en) * 2008-10-23 2015-12-16 Institut Dr. Foerster Gmbh & Co. Kg Test method and test device for testing elongate objects by means of a coil

Also Published As

Publication number Publication date
JP2506579Y2 (en) 1996-08-14

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