JPS5752128A - Manufacture of semiconductor device - Google Patents
Manufacture of semiconductor deviceInfo
- Publication number
- JPS5752128A JPS5752128A JP12724580A JP12724580A JPS5752128A JP S5752128 A JPS5752128 A JP S5752128A JP 12724580 A JP12724580 A JP 12724580A JP 12724580 A JP12724580 A JP 12724580A JP S5752128 A JPS5752128 A JP S5752128A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- ions
- injected
- diffusion
- coated
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000004519 manufacturing process Methods 0.000 title 1
- 239000004065 semiconductor Substances 0.000 title 1
- 150000002500 ions Chemical class 0.000 abstract 8
- 239000000758 substrate Substances 0.000 abstract 8
- 238000009792 diffusion process Methods 0.000 abstract 4
- 229910021417 amorphous silicon Inorganic materials 0.000 abstract 1
- 239000011248 coating agent Substances 0.000 abstract 1
- 238000000576 coating method Methods 0.000 abstract 1
- 238000005204 segregation Methods 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/22—Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions; Interactions between two or more impurities; Redistribution of impurities
- H01L21/225—Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions; Interactions between two or more impurities; Redistribution of impurities using diffusion into or out of a solid from or into a solid phase, e.g. a doped oxide layer
- H01L21/2251—Diffusion into or out of group IV semiconductors
- H01L21/2252—Diffusion into or out of group IV semiconductors using predeposition of impurities into the semiconductor surface, e.g. from a gaseous phase
- H01L21/2253—Diffusion into or out of group IV semiconductors using predeposition of impurities into the semiconductor surface, e.g. from a gaseous phase by ion implantation
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Abstract
PURPOSE:To perform a diffusion and particularly a selective diffusion of Al, Ga ions in an Si substrate accurately and inexpensively by injecting Al or Ga ions in the Si substrate from the surface of the substrate, coating an Si layer on the surface thereof, heat treating the same, and diffusing the Al, Ga ions in the prescribed depth in the substrate. CONSTITUTION:Al, or Ga ions are injected from one main surface of an Si substrate, and an Si layer is coated on the surface. The Si this coated is amorphous Si, and the thickness is higher than 1mum. The substrate is heated to activate the injected ions, and the ions are diffused in the prescribed depth, e.g., 0.02-0.05mum in the substrate. Accordingly, the Si layer coated newly prevents the external diffusion of the injected ions and also prevents the segregation of the injected ions in the surface of the substrate, thereby facilitating the selective diffusion.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12724580A JPS5752128A (en) | 1980-09-16 | 1980-09-16 | Manufacture of semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12724580A JPS5752128A (en) | 1980-09-16 | 1980-09-16 | Manufacture of semiconductor device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5752128A true JPS5752128A (en) | 1982-03-27 |
JPS6255689B2 JPS6255689B2 (en) | 1987-11-20 |
Family
ID=14955284
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12724580A Granted JPS5752128A (en) | 1980-09-16 | 1980-09-16 | Manufacture of semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5752128A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109196622A (en) * | 2016-05-31 | 2019-01-11 | 欧洲激光系统和解决方案公司 | Deep knot electronic device and its manufacturing method |
-
1980
- 1980-09-16 JP JP12724580A patent/JPS5752128A/en active Granted
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109196622A (en) * | 2016-05-31 | 2019-01-11 | 欧洲激光系统和解决方案公司 | Deep knot electronic device and its manufacturing method |
CN109196622B (en) * | 2016-05-31 | 2024-04-02 | 欧洲激光系统和解决方案公司 | Deep junction electronic device and method of manufacturing the same |
Also Published As
Publication number | Publication date |
---|---|
JPS6255689B2 (en) | 1987-11-20 |
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