JPS5749844A - Inspecting device for defect of circuit pattern on printed circuit board - Google Patents
Inspecting device for defect of circuit pattern on printed circuit boardInfo
- Publication number
- JPS5749844A JPS5749844A JP12453080A JP12453080A JPS5749844A JP S5749844 A JPS5749844 A JP S5749844A JP 12453080 A JP12453080 A JP 12453080A JP 12453080 A JP12453080 A JP 12453080A JP S5749844 A JPS5749844 A JP S5749844A
- Authority
- JP
- Japan
- Prior art keywords
- marking
- circuit board
- printed circuit
- defect
- holes
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
- G01N21/95607—Inspecting patterns on the surface of objects using a comparative method
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12453080A JPS5749844A (en) | 1980-09-10 | 1980-09-10 | Inspecting device for defect of circuit pattern on printed circuit board |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12453080A JPS5749844A (en) | 1980-09-10 | 1980-09-10 | Inspecting device for defect of circuit pattern on printed circuit board |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5749844A true JPS5749844A (en) | 1982-03-24 |
JPS6310779B2 JPS6310779B2 (ja) | 1988-03-09 |
Family
ID=14887750
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12453080A Granted JPS5749844A (en) | 1980-09-10 | 1980-09-10 | Inspecting device for defect of circuit pattern on printed circuit board |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5749844A (ja) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63293064A (ja) * | 1987-05-27 | 1988-11-30 | Ricoh Co Ltd | 物体表面に液滴を付与する方法 |
JPS63296182A (ja) * | 1987-05-27 | 1988-12-02 | Kiyoei Kk | 刻印読取装置 |
EP0669797A1 (en) * | 1994-02-24 | 1995-08-30 | Circuit Line S.P.A. | Marking system for printed circuit boards |
EP1391721B1 (en) * | 2002-08-13 | 2019-03-13 | The Boeing Company | System for identifying defects in a composite structure |
-
1980
- 1980-09-10 JP JP12453080A patent/JPS5749844A/ja active Granted
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63293064A (ja) * | 1987-05-27 | 1988-11-30 | Ricoh Co Ltd | 物体表面に液滴を付与する方法 |
JPS63296182A (ja) * | 1987-05-27 | 1988-12-02 | Kiyoei Kk | 刻印読取装置 |
EP0669797A1 (en) * | 1994-02-24 | 1995-08-30 | Circuit Line S.P.A. | Marking system for printed circuit boards |
US5523698A (en) * | 1994-02-24 | 1996-06-04 | Circuit Line S.P.A. | System for making tested printed circuit boards in circuit board testing machines |
EP1391721B1 (en) * | 2002-08-13 | 2019-03-13 | The Boeing Company | System for identifying defects in a composite structure |
Also Published As
Publication number | Publication date |
---|---|
JPS6310779B2 (ja) | 1988-03-09 |
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