JPS5749242A - Wire bonding device - Google Patents
Wire bonding deviceInfo
- Publication number
- JPS5749242A JPS5749242A JP55125154A JP12515480A JPS5749242A JP S5749242 A JPS5749242 A JP S5749242A JP 55125154 A JP55125154 A JP 55125154A JP 12515480 A JP12515480 A JP 12515480A JP S5749242 A JPS5749242 A JP S5749242A
- Authority
- JP
- Japan
- Prior art keywords
- distance
- positions
- malfunction
- displacement
- prevent
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Wire Bonding (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55125154A JPS5749242A (en) | 1980-09-09 | 1980-09-09 | Wire bonding device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55125154A JPS5749242A (en) | 1980-09-09 | 1980-09-09 | Wire bonding device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5749242A true JPS5749242A (en) | 1982-03-23 |
JPS6117140B2 JPS6117140B2 (ja) | 1986-05-06 |
Family
ID=14903203
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP55125154A Granted JPS5749242A (en) | 1980-09-09 | 1980-09-09 | Wire bonding device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5749242A (ja) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61102747A (ja) * | 1984-10-26 | 1986-05-21 | Marine Instr Co Ltd | ワイヤ−ボンダ−の認識パタ−ン変更方法 |
JPH0385738A (ja) * | 1989-08-30 | 1991-04-10 | Mitsubishi Electric Corp | 半導体装置の認識装置およびその認識方法 |
KR100460047B1 (ko) * | 2001-09-21 | 2004-12-04 | 주식회사 칩팩코리아 | 반도체패키지의 본딩검사방법 |
CN100367482C (zh) * | 2002-09-09 | 2008-02-06 | 半导体元件工业有限责任公司 | 直接芯片连接的结构和方法 |
-
1980
- 1980-09-09 JP JP55125154A patent/JPS5749242A/ja active Granted
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61102747A (ja) * | 1984-10-26 | 1986-05-21 | Marine Instr Co Ltd | ワイヤ−ボンダ−の認識パタ−ン変更方法 |
JPH0236066B2 (ja) * | 1984-10-26 | 1990-08-15 | Kaijo Denki Kk | |
JPH0385738A (ja) * | 1989-08-30 | 1991-04-10 | Mitsubishi Electric Corp | 半導体装置の認識装置およびその認識方法 |
KR100460047B1 (ko) * | 2001-09-21 | 2004-12-04 | 주식회사 칩팩코리아 | 반도체패키지의 본딩검사방법 |
CN100367482C (zh) * | 2002-09-09 | 2008-02-06 | 半导体元件工业有限责任公司 | 直接芯片连接的结构和方法 |
Also Published As
Publication number | Publication date |
---|---|
JPS6117140B2 (ja) | 1986-05-06 |
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