JPS5748230A - Electron ray exposure - Google Patents
Electron ray exposureInfo
- Publication number
- JPS5748230A JPS5748230A JP12285480A JP12285480A JPS5748230A JP S5748230 A JPS5748230 A JP S5748230A JP 12285480 A JP12285480 A JP 12285480A JP 12285480 A JP12285480 A JP 12285480A JP S5748230 A JPS5748230 A JP S5748230A
- Authority
- JP
- Japan
- Prior art keywords
- electron rays
- exposure
- chip
- zonal
- field
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003068 static effect Effects 0.000 abstract 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
- H01J37/3174—Particle-beam lithography, e.g. electron beam lithography
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Physics & Mathematics (AREA)
- Crystallography & Structural Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Electron Beam Exposure (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12285480A JPS5748230A (en) | 1980-09-04 | 1980-09-04 | Electron ray exposure |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12285480A JPS5748230A (en) | 1980-09-04 | 1980-09-04 | Electron ray exposure |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5748230A true JPS5748230A (en) | 1982-03-19 |
JPS631741B2 JPS631741B2 (enrdf_load_stackoverflow) | 1988-01-13 |
Family
ID=14846280
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12285480A Granted JPS5748230A (en) | 1980-09-04 | 1980-09-04 | Electron ray exposure |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5748230A (enrdf_load_stackoverflow) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60130121A (ja) * | 1983-12-16 | 1985-07-11 | Toshiba Mach Co Ltd | 電子ビ−ム露光方法 |
JP2014138183A (ja) * | 2013-01-18 | 2014-07-28 | Nuflare Technology Inc | 荷電粒子ビーム描画方法および荷電粒子ビーム描画装置 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS52120686A (en) * | 1977-04-21 | 1977-10-11 | Jeol Ltd | Electronic ray exposure method |
JPS5359374A (en) * | 1976-11-09 | 1978-05-29 | Fujitsu Ltd | Electron beam exposure unit |
JPS5572033A (en) * | 1978-11-27 | 1980-05-30 | Toshiba Corp | Electron beam exposure device |
-
1980
- 1980-09-04 JP JP12285480A patent/JPS5748230A/ja active Granted
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5359374A (en) * | 1976-11-09 | 1978-05-29 | Fujitsu Ltd | Electron beam exposure unit |
JPS52120686A (en) * | 1977-04-21 | 1977-10-11 | Jeol Ltd | Electronic ray exposure method |
JPS5572033A (en) * | 1978-11-27 | 1980-05-30 | Toshiba Corp | Electron beam exposure device |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60130121A (ja) * | 1983-12-16 | 1985-07-11 | Toshiba Mach Co Ltd | 電子ビ−ム露光方法 |
JP2014138183A (ja) * | 2013-01-18 | 2014-07-28 | Nuflare Technology Inc | 荷電粒子ビーム描画方法および荷電粒子ビーム描画装置 |
Also Published As
Publication number | Publication date |
---|---|
JPS631741B2 (enrdf_load_stackoverflow) | 1988-01-13 |
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