JPS5740933A - Lift off method - Google Patents
Lift off methodInfo
- Publication number
- JPS5740933A JPS5740933A JP55116646A JP11664680A JPS5740933A JP S5740933 A JPS5740933 A JP S5740933A JP 55116646 A JP55116646 A JP 55116646A JP 11664680 A JP11664680 A JP 11664680A JP S5740933 A JPS5740933 A JP S5740933A
- Authority
- JP
- Japan
- Prior art keywords
- film
- coated
- chrome
- resist film
- mask pattern
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/50—Mask blanks not covered by G03F1/20 - G03F1/34; Preparation thereof
Abstract
PURPOSE:To form a highly precise photomask by a method wherein a resist film having a negative pattern is formed on a substrate and after coating a thin oxide film on the whole surface, a desired film material is coated on the thin oxide film and then the resist film is removed. CONSTITUTION:A positive resist film of 5,000Angstrom thickness is applied on a transparent glass substrate 1, exposed and developed by irrdiating an electron beam and desired mask pattern and the negative pattern 2 for desired mask pattern is formed. This substrate is inserted in a plasma sputtering device and a chrome oxide film 4 of 10Angstrom is coated in oxygenous plasma. Then, changing over to an Ar gas from the oxygenous plasma, a Cr film 5 of 500Angstrom is coated on the oxidized Cr film. The resist film 2 is removed and chrome mask having a chrome film is formed. Through these procedures, a CrOX film is used as a buffer layer for thermal and mechanical stress and the highly precise mask pattern without exforiation and cracks can be formed.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55116646A JPS5740933A (en) | 1980-08-25 | 1980-08-25 | Lift off method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55116646A JPS5740933A (en) | 1980-08-25 | 1980-08-25 | Lift off method |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5740933A true JPS5740933A (en) | 1982-03-06 |
Family
ID=14692367
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP55116646A Pending JPS5740933A (en) | 1980-08-25 | 1980-08-25 | Lift off method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5740933A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6914003B2 (en) | 2002-05-29 | 2005-07-05 | Hynix Semiconductor Inc. | Method for manufacturing magnetic random access memory |
-
1980
- 1980-08-25 JP JP55116646A patent/JPS5740933A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6914003B2 (en) | 2002-05-29 | 2005-07-05 | Hynix Semiconductor Inc. | Method for manufacturing magnetic random access memory |
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