JPS5727553A - Adjusting method for ion source of mass-spectrometer - Google Patents

Adjusting method for ion source of mass-spectrometer

Info

Publication number
JPS5727553A
JPS5727553A JP10208980A JP10208980A JPS5727553A JP S5727553 A JPS5727553 A JP S5727553A JP 10208980 A JP10208980 A JP 10208980A JP 10208980 A JP10208980 A JP 10208980A JP S5727553 A JPS5727553 A JP S5727553A
Authority
JP
Japan
Prior art keywords
voltage
sweep
voltages
stepwise
fed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10208980A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6329787B2 (enrdf_load_stackoverflow
Inventor
Toru Asada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Jeol Ltd
Nihon Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd, Nihon Denshi KK filed Critical Jeol Ltd
Priority to JP10208980A priority Critical patent/JPS5727553A/ja
Publication of JPS5727553A publication Critical patent/JPS5727553A/ja
Publication of JPS6329787B2 publication Critical patent/JPS6329787B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP10208980A 1980-07-25 1980-07-25 Adjusting method for ion source of mass-spectrometer Granted JPS5727553A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10208980A JPS5727553A (en) 1980-07-25 1980-07-25 Adjusting method for ion source of mass-spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10208980A JPS5727553A (en) 1980-07-25 1980-07-25 Adjusting method for ion source of mass-spectrometer

Publications (2)

Publication Number Publication Date
JPS5727553A true JPS5727553A (en) 1982-02-13
JPS6329787B2 JPS6329787B2 (enrdf_load_stackoverflow) 1988-06-15

Family

ID=14318042

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10208980A Granted JPS5727553A (en) 1980-07-25 1980-07-25 Adjusting method for ion source of mass-spectrometer

Country Status (1)

Country Link
JP (1) JPS5727553A (enrdf_load_stackoverflow)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5532483A (en) * 1994-03-17 1996-07-02 Hitachi, Ltd. Mass spectrometer and ion source
JP2011151008A (ja) * 2010-01-19 2011-08-04 Agilent Technologies Inc 質量分析計のイオン源を交換するためのシステム及び方法
WO2013065173A1 (ja) * 2011-11-04 2013-05-10 株式会社島津製作所 質量分析装置
WO2013140558A1 (ja) * 2012-03-22 2013-09-26 株式会社島津製作所 質量分析装置

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5532483A (en) * 1994-03-17 1996-07-02 Hitachi, Ltd. Mass spectrometer and ion source
JP2011151008A (ja) * 2010-01-19 2011-08-04 Agilent Technologies Inc 質量分析計のイオン源を交換するためのシステム及び方法
WO2013065173A1 (ja) * 2011-11-04 2013-05-10 株式会社島津製作所 質量分析装置
CN104025248A (zh) * 2011-11-04 2014-09-03 株式会社岛津制作所 质量分析装置
US8927927B2 (en) 2011-11-04 2015-01-06 Shimadzu Corporation Mass spectrometer
JPWO2013065173A1 (ja) * 2011-11-04 2015-04-02 株式会社島津製作所 質量分析装置
WO2013140558A1 (ja) * 2012-03-22 2013-09-26 株式会社島津製作所 質量分析装置

Also Published As

Publication number Publication date
JPS6329787B2 (enrdf_load_stackoverflow) 1988-06-15

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