JPS5721824A - Manufacture of semiconductor device - Google Patents
Manufacture of semiconductor deviceInfo
- Publication number
- JPS5721824A JPS5721824A JP9607580A JP9607580A JPS5721824A JP S5721824 A JPS5721824 A JP S5721824A JP 9607580 A JP9607580 A JP 9607580A JP 9607580 A JP9607580 A JP 9607580A JP S5721824 A JPS5721824 A JP S5721824A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- protective film
- compound semiconductor
- injected
- forming
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
- Led Devices (AREA)
- Formation Of Insulating Films (AREA)
- Junction Field-Effect Transistors (AREA)
- Semiconductor Lasers (AREA)
Abstract
PURPOSE:To improve the electric characteristics by forming compound semiconductor protective film of different etching properties on a compound semiconductor layer formed on a compound semiconductor substrate, forming an ion injected region through the protective film and heat treating it to remove rhe protective film. CONSTITUTION:A high resistance GaGs layer 2 is grown by 1mum on a semiinsulating substrate 1, and Ga0.5Al0.5As layer protective film 3 is continuously grown by 0.2mum thereon. Si ions are injected through the later 3 to the layer 2 to form an injection region 5. Then, it is heat treated to activate the ion injected layer 5 to form an active layer 5'. The layer 3 is etched and removed to form a source 6, drain 8 and gate 7 electrodes. Thus, the compound semiconductor having excellent electric properties can be obtained.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9607580A JPS5721824A (en) | 1980-07-14 | 1980-07-14 | Manufacture of semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9607580A JPS5721824A (en) | 1980-07-14 | 1980-07-14 | Manufacture of semiconductor device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5721824A true JPS5721824A (en) | 1982-02-04 |
JPS634345B2 JPS634345B2 (en) | 1988-01-28 |
Family
ID=14155276
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9607580A Granted JPS5721824A (en) | 1980-07-14 | 1980-07-14 | Manufacture of semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5721824A (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5974901U (en) * | 1982-11-11 | 1984-05-21 | 小片 進 | Garbage storage container equipped with continuous bags |
JPS59149023A (en) * | 1983-02-16 | 1984-08-25 | Nec Corp | Method for introduction of impurity into semiconductor |
JPS60250622A (en) * | 1984-05-25 | 1985-12-11 | Nec Corp | Impurity introducing method |
JPH01231317A (en) * | 1988-03-11 | 1989-09-14 | Kokusai Denshin Denwa Co Ltd <Kdd> | Manufacture of optical semiconductor element |
EP0365875A2 (en) * | 1988-10-28 | 1990-05-02 | Texas Instruments Incorporated | Capped anneal |
JPH04274320A (en) * | 1991-03-01 | 1992-09-30 | Nippon Telegr & Teleph Corp <Ntt> | Method for forming ion-implantation active layer within gaas substrate |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4736965A (en) * | 1971-04-07 | 1972-11-30 | ||
JPS50102260A (en) * | 1974-01-07 | 1975-08-13 | ||
JPS52131453A (en) * | 1976-04-28 | 1977-11-04 | Hitachi Ltd | Thermal treating method for chemical compound semiconductor |
-
1980
- 1980-07-14 JP JP9607580A patent/JPS5721824A/en active Granted
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4736965A (en) * | 1971-04-07 | 1972-11-30 | ||
JPS50102260A (en) * | 1974-01-07 | 1975-08-13 | ||
JPS52131453A (en) * | 1976-04-28 | 1977-11-04 | Hitachi Ltd | Thermal treating method for chemical compound semiconductor |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5974901U (en) * | 1982-11-11 | 1984-05-21 | 小片 進 | Garbage storage container equipped with continuous bags |
JPS59149023A (en) * | 1983-02-16 | 1984-08-25 | Nec Corp | Method for introduction of impurity into semiconductor |
JPS60250622A (en) * | 1984-05-25 | 1985-12-11 | Nec Corp | Impurity introducing method |
JPH01231317A (en) * | 1988-03-11 | 1989-09-14 | Kokusai Denshin Denwa Co Ltd <Kdd> | Manufacture of optical semiconductor element |
JP2686764B2 (en) * | 1988-03-11 | 1997-12-08 | 国際電信電話株式会社 | Method for manufacturing optical semiconductor device |
EP0365875A2 (en) * | 1988-10-28 | 1990-05-02 | Texas Instruments Incorporated | Capped anneal |
JPH04274320A (en) * | 1991-03-01 | 1992-09-30 | Nippon Telegr & Teleph Corp <Ntt> | Method for forming ion-implantation active layer within gaas substrate |
Also Published As
Publication number | Publication date |
---|---|
JPS634345B2 (en) | 1988-01-28 |
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