JPS57197410A - Measuring method of adhered amount of high polymer film on metallic plate - Google Patents

Measuring method of adhered amount of high polymer film on metallic plate

Info

Publication number
JPS57197410A
JPS57197410A JP56083171A JP8317181A JPS57197410A JP S57197410 A JPS57197410 A JP S57197410A JP 56083171 A JP56083171 A JP 56083171A JP 8317181 A JP8317181 A JP 8317181A JP S57197410 A JPS57197410 A JP S57197410A
Authority
JP
Japan
Prior art keywords
polymer film
high polymer
rays
radiant
irradiated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56083171A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6319004B2 (enExample
Inventor
Naoki Matsuura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rigaku Corp
Original Assignee
Rigaku Industrial Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rigaku Industrial Corp filed Critical Rigaku Industrial Corp
Priority to JP56083171A priority Critical patent/JPS57197410A/ja
Publication of JPS57197410A publication Critical patent/JPS57197410A/ja
Publication of JPS6319004B2 publication Critical patent/JPS6319004B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/633—Specific applications or type of materials thickness, density, surface weight (unit area)

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP56083171A 1981-05-29 1981-05-29 Measuring method of adhered amount of high polymer film on metallic plate Granted JPS57197410A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56083171A JPS57197410A (en) 1981-05-29 1981-05-29 Measuring method of adhered amount of high polymer film on metallic plate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56083171A JPS57197410A (en) 1981-05-29 1981-05-29 Measuring method of adhered amount of high polymer film on metallic plate

Publications (2)

Publication Number Publication Date
JPS57197410A true JPS57197410A (en) 1982-12-03
JPS6319004B2 JPS6319004B2 (enExample) 1988-04-21

Family

ID=13794823

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56083171A Granted JPS57197410A (en) 1981-05-29 1981-05-29 Measuring method of adhered amount of high polymer film on metallic plate

Country Status (1)

Country Link
JP (1) JPS57197410A (enExample)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58135407A (ja) * 1982-01-22 1983-08-12 Nippon X Sen Kk 被膜の厚さ測定方法
JPS6441810A (en) * 1987-08-07 1989-02-14 Nippon Kokan Kk Method for measuring applied film on metal thickness
FR2672120A1 (fr) * 1991-01-30 1992-07-31 Aerospatiale Procede et systeme a effet compton pour la localisation d'un plan separant deux milieux de densites differentes.
JP2001272360A (ja) * 2000-01-20 2001-10-05 Kawasaki Steel Corp 鋼帯に形成される内部酸化層の酸素目付量の測定方法及びその測定装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53146655A (en) * 1977-05-26 1978-12-20 Toshiba Corp Thickness abnormality detector of paper form objects

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53146655A (en) * 1977-05-26 1978-12-20 Toshiba Corp Thickness abnormality detector of paper form objects

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58135407A (ja) * 1982-01-22 1983-08-12 Nippon X Sen Kk 被膜の厚さ測定方法
JPS6441810A (en) * 1987-08-07 1989-02-14 Nippon Kokan Kk Method for measuring applied film on metal thickness
FR2672120A1 (fr) * 1991-01-30 1992-07-31 Aerospatiale Procede et systeme a effet compton pour la localisation d'un plan separant deux milieux de densites differentes.
JP2001272360A (ja) * 2000-01-20 2001-10-05 Kawasaki Steel Corp 鋼帯に形成される内部酸化層の酸素目付量の測定方法及びその測定装置

Also Published As

Publication number Publication date
JPS6319004B2 (enExample) 1988-04-21

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