JPS57108704A - Measuring method of thickness of film coated on metallic plate - Google Patents

Measuring method of thickness of film coated on metallic plate

Info

Publication number
JPS57108704A
JPS57108704A JP18609180A JP18609180A JPS57108704A JP S57108704 A JPS57108704 A JP S57108704A JP 18609180 A JP18609180 A JP 18609180A JP 18609180 A JP18609180 A JP 18609180A JP S57108704 A JPS57108704 A JP S57108704A
Authority
JP
Japan
Prior art keywords
film
thickness
infrared beam
coated
condenser
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18609180A
Other languages
Japanese (ja)
Inventor
Hideaki Yamashita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JFE Steel Corp
Original Assignee
Kawasaki Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kawasaki Steel Corp filed Critical Kawasaki Steel Corp
Priority to JP18609180A priority Critical patent/JPS57108704A/en
Publication of JPS57108704A publication Critical patent/JPS57108704A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating

Abstract

PURPOSE:To measure the thickness of a coated film in a simple and accurate way, by irradiating the laser to the film coated on a metallic plate and measuring the absorbed amount of the laser. CONSTITUTION:An infrared beam 1a of a 3.39mu wavelength given from an Ne- He gas laser source 1 that radiates the infrared beam of a certain level of intensity is irradiated to a coated film 4a on a metallic plate 4 through an upper edge hole of a condenser 3 via a half mirror 2. Thus the beam 1a is reflected on the plate 4 and then reflected again on the plate 4 via a condenser 3a. This action is repeated, and meanwhile the beam 1a is absorbed into the film 4a. Finally an infrared beam 1b is absorbed through the upper edge hole of the condenser 3 and then the mirror 2, and the amount of this absorption is detected by an infrared beam detector 5. The result of measurement is calculated 6 and displayed at a meter 7. A linear relation is substantially obtained between the thickness of a coated film and the absorption factor of the infrared beam. A calibration table is previously produced for the relation between the thickness of film and the amount of absorption by means of two coating standard metallic plates having different thicknesses of the coated films. As a result, the measurement is possible with high accuracy of about + or -3%.
JP18609180A 1980-12-26 1980-12-26 Measuring method of thickness of film coated on metallic plate Pending JPS57108704A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18609180A JPS57108704A (en) 1980-12-26 1980-12-26 Measuring method of thickness of film coated on metallic plate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18609180A JPS57108704A (en) 1980-12-26 1980-12-26 Measuring method of thickness of film coated on metallic plate

Publications (1)

Publication Number Publication Date
JPS57108704A true JPS57108704A (en) 1982-07-06

Family

ID=16182204

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18609180A Pending JPS57108704A (en) 1980-12-26 1980-12-26 Measuring method of thickness of film coated on metallic plate

Country Status (1)

Country Link
JP (1) JPS57108704A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6057203A (en) * 1983-09-09 1985-04-03 Onoda Cement Co Ltd Method and device for measuring thickness of plate-like material
EP0536080A2 (en) * 1991-10-04 1993-04-07 S.C.R. Engineers Ltd. Method for measuring liquid flow
US5281819A (en) * 1991-06-06 1994-01-25 Aluminum Company Of America Apparatus for nondestructively determining coating thickness on a metal object and associated method
CN103869743A (en) * 2013-05-21 2014-06-18 北京朗新明环保科技有限公司 Film paving monitoring device for powder resin covering filter

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6057203A (en) * 1983-09-09 1985-04-03 Onoda Cement Co Ltd Method and device for measuring thickness of plate-like material
US5281819A (en) * 1991-06-06 1994-01-25 Aluminum Company Of America Apparatus for nondestructively determining coating thickness on a metal object and associated method
EP0536080A2 (en) * 1991-10-04 1993-04-07 S.C.R. Engineers Ltd. Method for measuring liquid flow
EP0536080A3 (en) * 1991-10-04 1994-10-12 Scr Eng Ltd Method for measuring liquid flow.
CN103869743A (en) * 2013-05-21 2014-06-18 北京朗新明环保科技有限公司 Film paving monitoring device for powder resin covering filter

Similar Documents

Publication Publication Date Title
US3413474A (en) Coating thickness determination by means of measuring black-body radiation resultant from infrared irradiation
EP0075190A3 (en) Apparatus and method for measuring thickness
JPH095038A (en) Chromate treatment steel plate and chromate film thickness measuring method and apparatus
JPS57108704A (en) Measuring method of thickness of film coated on metallic plate
US3427110A (en) Method for inspecting objects having parallel faces
JPS57100323A (en) Method for spectrochemical analysis of steel by using laser beam
JPH09113231A (en) Instrument for measuring quantity of oil applied to surface
JPS6473239A (en) Gas concentration measurement for laser type gas sensor
JPS57103004A (en) Method for measuring film thickness of surface
JPS57197410A (en) Measuring method of adhered amount of high polymer film on metallic plate
JPH01124703A (en) Method and device for noncontact measurement of film characteristic
CN105115897A (en) Water body parameter measurement device and strong absorption liquid absorption coefficient measurement method
Whillock et al. Comparison of the stopping cross-sections of ethylene and polyethylene using alpha particles in the energy range 1.5-4.2 MeV
JPS5599045A (en) Surface reflection measuring apparatus
JPH0387605A (en) Method and device for measuring film thickness
Robertson et al. Photometry of X-ray crystal diffraction diagrams
JPS5646404A (en) Measuring device of optical film thickness
JPS56111405A (en) Method and device for measuring thickness of transparent film
JPS5529726A (en) Water content measuring method dependent upon infrared ray
JPS56130606A (en) Optical measuring device for thickness of transparent material
JPS6391505A (en) Method and apparatus for measuring thickness of metallic plate
JPS5512483A (en) Right angle measurement
SU1245881A1 (en) Method of measuring thickness of coating
JPS5533626A (en) Analysis of quantity of coating of of fundamental surface plate or not with the use of fluorescent x ray
JPS6441836A (en) Reflected light measuring apparatus