JPS57176723A - Selectively forming method for pattern - Google Patents

Selectively forming method for pattern

Info

Publication number
JPS57176723A
JPS57176723A JP6170881A JP6170881A JPS57176723A JP S57176723 A JPS57176723 A JP S57176723A JP 6170881 A JP6170881 A JP 6170881A JP 6170881 A JP6170881 A JP 6170881A JP S57176723 A JPS57176723 A JP S57176723A
Authority
JP
Japan
Prior art keywords
pattern
film
etchant
isopropyl alcohol
approx
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6170881A
Other languages
Japanese (ja)
Inventor
Yoshimi Yamashita
Sumio Yamamoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP6170881A priority Critical patent/JPS57176723A/en
Publication of JPS57176723A publication Critical patent/JPS57176723A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26Processing photosensitive materials; Apparatus therefor
    • G03F7/40Treatment after imagewise removal, e.g. baking

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)
  • Electron Beam Exposure (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)

Abstract

PURPOSE:To omit baking and plasma ashing steps after a development by interposing a pretreating step of alcohol substituting method between a resist developing step and a pattern forming step. CONSTITUTION:A resist film is covered on a material to be formed in a pattern of a semiconductor device, an electron beam or X-ray is emitted to expose the film, the film is developed, is then rinsed with isopropyl alcohol for approx. 20sec., is then purged with nitrogen gas, the isopropyl alcohol is substituted for approx. 10sec, the film is then dipped in an etchant, and a selective pattern is formed on the material to be formed in a pattern of the semiconductor device with the film formed on the pattern as a mask. Since the isopropyl alcohol is readily draped with etchant, the etchant is preferably contacted with the material to be formed in a pattern, and no deformation of a side effect of plasma ashing takes place.
JP6170881A 1981-04-23 1981-04-23 Selectively forming method for pattern Pending JPS57176723A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6170881A JPS57176723A (en) 1981-04-23 1981-04-23 Selectively forming method for pattern

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6170881A JPS57176723A (en) 1981-04-23 1981-04-23 Selectively forming method for pattern

Publications (1)

Publication Number Publication Date
JPS57176723A true JPS57176723A (en) 1982-10-30

Family

ID=13178996

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6170881A Pending JPS57176723A (en) 1981-04-23 1981-04-23 Selectively forming method for pattern

Country Status (1)

Country Link
JP (1) JPS57176723A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH022515A (en) * 1988-06-16 1990-01-08 Matsushita Electric Ind Co Ltd Manufacture of orienting film for liquid crystal
US5227341A (en) * 1991-02-14 1993-07-13 Sony Corporation Method of manufacturing a semiconductor device using an isopropyl alcohol ashing step

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH022515A (en) * 1988-06-16 1990-01-08 Matsushita Electric Ind Co Ltd Manufacture of orienting film for liquid crystal
US5227341A (en) * 1991-02-14 1993-07-13 Sony Corporation Method of manufacturing a semiconductor device using an isopropyl alcohol ashing step

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