JPS57170524A - Manufacture of semiconductor device - Google Patents
Manufacture of semiconductor deviceInfo
- Publication number
- JPS57170524A JPS57170524A JP5671281A JP5671281A JPS57170524A JP S57170524 A JPS57170524 A JP S57170524A JP 5671281 A JP5671281 A JP 5671281A JP 5671281 A JP5671281 A JP 5671281A JP S57170524 A JPS57170524 A JP S57170524A
- Authority
- JP
- Japan
- Prior art keywords
- film
- layer
- hole
- metallic
- metallic film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
Abstract
PURPOSE:To obtain a wiring layer of ultrafine size by covering a semiconductor substrate formed with an insulating film having a contact hole with the first metallic film, heat treating it to produce a metal-semiconductor compound film in the hole, removing the unreacted first film and burying the second metallic film in the first metallic film remaining on the bottom surface. CONSTITUTION:With an insulating film 2 as a mask the prescribed diffused layer 3 is formed on an Si substrate 1, an insulating film 4 is coverted again on the overall surface including the layer 3, a contacting hole 5 is opened at the position corresponding to the layer 3, and a Px film 6 of the first thin metallic film having a thickness of approx. 500-1,000Angstrom is covered by sputtering or depositing on the overall surface. Then, it is heat treated at 500-700 deg.C in the N2 atmosphere to produce a platinum silicide film 7, the unreacted film 7 is removed by aqua regia, and the film 7 allows to remain only on the bottom of the hole 5. Thereafter, the film is buried with an Ni film 8 of the second metallic film by plating, and an aluminum wire layer 9 which makes contact with the film is mounted.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5671281A JPS57170524A (en) | 1981-04-15 | 1981-04-15 | Manufacture of semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5671281A JPS57170524A (en) | 1981-04-15 | 1981-04-15 | Manufacture of semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57170524A true JPS57170524A (en) | 1982-10-20 |
Family
ID=13035086
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5671281A Pending JPS57170524A (en) | 1981-04-15 | 1981-04-15 | Manufacture of semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57170524A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61182245A (en) * | 1985-01-31 | 1986-08-14 | アメリカン マイクロシステムズ インコーポレイテッド | Method and element for forming thin film-like mutual connection signal surface to connect a plurality of semiconductor ics |
JPS63229840A (en) * | 1987-03-19 | 1988-09-26 | Nec Corp | Formation of multilayer interconnection |
JPH02341A (en) * | 1987-02-02 | 1990-01-05 | Seiko Epson Corp | Semiconductor device |
-
1981
- 1981-04-15 JP JP5671281A patent/JPS57170524A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61182245A (en) * | 1985-01-31 | 1986-08-14 | アメリカン マイクロシステムズ インコーポレイテッド | Method and element for forming thin film-like mutual connection signal surface to connect a plurality of semiconductor ics |
JPH02341A (en) * | 1987-02-02 | 1990-01-05 | Seiko Epson Corp | Semiconductor device |
JPS63229840A (en) * | 1987-03-19 | 1988-09-26 | Nec Corp | Formation of multilayer interconnection |
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