JPS57168105A - Pattern checking device - Google Patents
Pattern checking deviceInfo
- Publication number
- JPS57168105A JPS57168105A JP3504581A JP3504581A JPS57168105A JP S57168105 A JPS57168105 A JP S57168105A JP 3504581 A JP3504581 A JP 3504581A JP 3504581 A JP3504581 A JP 3504581A JP S57168105 A JPS57168105 A JP S57168105A
- Authority
- JP
- Japan
- Prior art keywords
- data
- circuit
- pattern
- inputted
- quality
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3504581A JPS57168105A (en) | 1981-03-11 | 1981-03-11 | Pattern checking device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3504581A JPS57168105A (en) | 1981-03-11 | 1981-03-11 | Pattern checking device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS57168105A true JPS57168105A (en) | 1982-10-16 |
| JPS6256442B2 JPS6256442B2 (OSRAM) | 1987-11-26 |
Family
ID=12431059
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3504581A Granted JPS57168105A (en) | 1981-03-11 | 1981-03-11 | Pattern checking device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS57168105A (OSRAM) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6015504A (ja) * | 1983-07-07 | 1985-01-26 | Mitsubishi Rayon Co Ltd | フオトマスク自動検査装置 |
| JPS61277005A (ja) * | 1985-05-31 | 1986-12-08 | Nippon Denso Co Ltd | チップ部品の実装検査装置 |
| JPS6227604A (ja) * | 1985-07-29 | 1987-02-05 | Hitachi Electronics Eng Co Ltd | パタ−ン検出装置 |
| JPS6248748A (ja) * | 1985-06-21 | 1987-03-03 | Nippon Yunikaa Kk | エチレン−アクリル酸エチル共重合体とエチレン−酢酸ビニル−塩化ビニル三元共重合体との混合物を基材とした組成物 |
| JPS62150112A (ja) * | 1985-12-25 | 1987-07-04 | Hitachi Electronics Eng Co Ltd | スクライブラインのパターン検出方法 |
| JPS62299713A (ja) * | 1986-06-19 | 1987-12-26 | Tokico Ltd | ワ−ク位置ずれ検知装置 |
| JPH04194604A (ja) * | 1990-11-27 | 1992-07-14 | Dainippon Screen Mfg Co Ltd | プリント基板のライン幅検査方法 |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH068053U (ja) * | 1992-07-06 | 1994-02-01 | 次雄 牧野 | 車両における、アクセル、ブレーキ及び警報装置 |
-
1981
- 1981-03-11 JP JP3504581A patent/JPS57168105A/ja active Granted
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6015504A (ja) * | 1983-07-07 | 1985-01-26 | Mitsubishi Rayon Co Ltd | フオトマスク自動検査装置 |
| JPS61277005A (ja) * | 1985-05-31 | 1986-12-08 | Nippon Denso Co Ltd | チップ部品の実装検査装置 |
| JPS6248748A (ja) * | 1985-06-21 | 1987-03-03 | Nippon Yunikaa Kk | エチレン−アクリル酸エチル共重合体とエチレン−酢酸ビニル−塩化ビニル三元共重合体との混合物を基材とした組成物 |
| JPS6227604A (ja) * | 1985-07-29 | 1987-02-05 | Hitachi Electronics Eng Co Ltd | パタ−ン検出装置 |
| JPS62150112A (ja) * | 1985-12-25 | 1987-07-04 | Hitachi Electronics Eng Co Ltd | スクライブラインのパターン検出方法 |
| JPS62299713A (ja) * | 1986-06-19 | 1987-12-26 | Tokico Ltd | ワ−ク位置ずれ検知装置 |
| JPH04194604A (ja) * | 1990-11-27 | 1992-07-14 | Dainippon Screen Mfg Co Ltd | プリント基板のライン幅検査方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6256442B2 (OSRAM) | 1987-11-26 |
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