JPS5527955A - Electronic parts inspecting device - Google Patents
Electronic parts inspecting deviceInfo
- Publication number
- JPS5527955A JPS5527955A JP10110778A JP10110778A JPS5527955A JP S5527955 A JPS5527955 A JP S5527955A JP 10110778 A JP10110778 A JP 10110778A JP 10110778 A JP10110778 A JP 10110778A JP S5527955 A JPS5527955 A JP S5527955A
- Authority
- JP
- Japan
- Prior art keywords
- electronic parts
- guide groove
- slider
- feeder
- block member
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Relating To Insulation (AREA)
Abstract
PURPOSE: To combine various types of devices with a block member provided with parts guide grooves thereby to automatically carry out inspection of electronic parts.
CONSTITUTION: A block member 22 in which first through third guide grooves 23, 24 and 27 are inclined and arranged at its upper surface, and there are attached a feeder 21, a slider 25, a push-up body 31, photosensers P1 and P2, a measuring apparatus 41 attached with a measuring contact 36, a shutter 34, and a classifying and accommodating part 39. According to this arrangement, electronic parts 100 carried by the feeder 21 slip down into the guide groove 26 of the slider 25 via a first guide groove 23 so that the outer shell resin part precedes and come into abutment with the wall surface of a third guide groove 27 to stand still. When through holes 28 and 29 of the slider 25 and block member 22 are blocked, the photosenser P1 senses and the feeder 21 comes to a stop, and the slider 25 slides and electronic parts 100 are shifted. When the guide groove 26 coincides with the second guide groove 24, the electronic parts 100 slip down into the second guide groove 24 and block the hole 33, the push-up body 31 rises up by the response of the photosenser P2 and is urged against a measurement contact 36, the characteristics of electronic parts being inspected by a measuring apparatus 41, and thereafter accommodated in a classification accommodating part 39 by the opening of the shutter 34 by the classification signal.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10110778A JPS5937785B2 (en) | 1978-08-18 | 1978-08-18 | Electronic component inspection equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10110778A JPS5937785B2 (en) | 1978-08-18 | 1978-08-18 | Electronic component inspection equipment |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5527955A true JPS5527955A (en) | 1980-02-28 |
JPS5937785B2 JPS5937785B2 (en) | 1984-09-12 |
Family
ID=14291842
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10110778A Expired JPS5937785B2 (en) | 1978-08-18 | 1978-08-18 | Electronic component inspection equipment |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5937785B2 (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4564110A (en) * | 1984-06-22 | 1986-01-14 | At&T Technologies, Inc. | Apparatus for positioning gravity fed components in an electrical test facility |
US4694964A (en) * | 1983-11-07 | 1987-09-22 | Ekkehard Ueberreiter | Device for conveying components particularly integrated chips, from an input magazine to an output magazine |
US5348164A (en) * | 1993-04-13 | 1994-09-20 | Micron Semiconductor, Inc. | Method and apparatus for testing integrated circuits |
CN105182133A (en) * | 2015-09-16 | 2015-12-23 | 东莞联宝光电科技有限公司 | Automatic testing device of transformer |
-
1978
- 1978-08-18 JP JP10110778A patent/JPS5937785B2/en not_active Expired
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4694964A (en) * | 1983-11-07 | 1987-09-22 | Ekkehard Ueberreiter | Device for conveying components particularly integrated chips, from an input magazine to an output magazine |
US4564110A (en) * | 1984-06-22 | 1986-01-14 | At&T Technologies, Inc. | Apparatus for positioning gravity fed components in an electrical test facility |
US5348164A (en) * | 1993-04-13 | 1994-09-20 | Micron Semiconductor, Inc. | Method and apparatus for testing integrated circuits |
USRE38894E1 (en) * | 1993-04-13 | 2005-11-29 | Micron Tehnology, Inc. | Method and apparatus for testing integrated circuits |
CN105182133A (en) * | 2015-09-16 | 2015-12-23 | 东莞联宝光电科技有限公司 | Automatic testing device of transformer |
Also Published As
Publication number | Publication date |
---|---|
JPS5937785B2 (en) | 1984-09-12 |
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