JPS5598375A - Ic test device - Google Patents

Ic test device

Info

Publication number
JPS5598375A
JPS5598375A JP677779A JP677779A JPS5598375A JP S5598375 A JPS5598375 A JP S5598375A JP 677779 A JP677779 A JP 677779A JP 677779 A JP677779 A JP 677779A JP S5598375 A JPS5598375 A JP S5598375A
Authority
JP
Japan
Prior art keywords
guide
guide rail
rail
thermostat
spiral
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP677779A
Other languages
Japanese (ja)
Inventor
Shinichi Koya
Kenpei Suzuki
Hiroshi Sato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Takeda Riken Industries Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp, Takeda Riken Industries Co Ltd filed Critical Advantest Corp
Priority to JP677779A priority Critical patent/JPS5598375A/en
Publication of JPS5598375A publication Critical patent/JPS5598375A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE: To prevent hooking of IC on a rail by forcibly transmitting IC by external force.
CONSTITUTION: A spiral guide 5 having an axis core having the same axis as an axis core of a rotating drum 3 at a thermostat 1 with a slight spacing held from a IC a slide surface of IC guide rail 4 and provided with a guide surface substantially intersecting at a right angle with a top surface of IC guide rail 4 is disposed and attached to a cylindrical IC press guide 6 placed outside thereof. Thus, in the internal portion of the thermostat 1, IC 7 engaged by a terminal pin so as to bridge over a prism like IC guide rail 4 is separated one by one on the IC guide rail 4 and held by the spiral guide 5 and successively fed from an upper portion to a lower portion forcibly along the IC guide rail 4 by the spiral guide 5 through the rotation of the drum 3 without being hooked.
COPYRIGHT: (C)1980,JPO&Japio
JP677779A 1979-01-22 1979-01-22 Ic test device Pending JPS5598375A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP677779A JPS5598375A (en) 1979-01-22 1979-01-22 Ic test device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP677779A JPS5598375A (en) 1979-01-22 1979-01-22 Ic test device

Publications (1)

Publication Number Publication Date
JPS5598375A true JPS5598375A (en) 1980-07-26

Family

ID=11647597

Family Applications (1)

Application Number Title Priority Date Filing Date
JP677779A Pending JPS5598375A (en) 1979-01-22 1979-01-22 Ic test device

Country Status (1)

Country Link
JP (1) JPS5598375A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5121052A (en) * 1991-01-18 1992-06-09 Motorola Inc. Automated handler for semiconductor devices
JPH0640881U (en) * 1992-10-30 1994-05-31 日本合成ゴム株式会社 TCP inspection device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5121052A (en) * 1991-01-18 1992-06-09 Motorola Inc. Automated handler for semiconductor devices
JPH0640881U (en) * 1992-10-30 1994-05-31 日本合成ゴム株式会社 TCP inspection device

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