CN105182133A - Automatic testing device of transformer - Google Patents
Automatic testing device of transformer Download PDFInfo
- Publication number
- CN105182133A CN105182133A CN201510587142.7A CN201510587142A CN105182133A CN 105182133 A CN105182133 A CN 105182133A CN 201510587142 A CN201510587142 A CN 201510587142A CN 105182133 A CN105182133 A CN 105182133A
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- driving mechanism
- block
- hole slot
- deflector chute
- inductor
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Abstract
Disclosed in the invention is an automatic testing device of a transformer. The automatic testing device comprises a rack, a high-voltage testing device, and an integrated testing device. The rack includes a pedestal, a horizontal bench and a tilting bench. The high-voltage testing device consists of a high-voltage tester, a high-voltage testing head, and a sixth driving mechanism; the high-voltage tester is arranged on the pedestal; the high-voltage testing head is arranged right above a material guiding slot movably up and down and is arranged at the side of a first stop block; the high-voltage testing head and the high-voltage tester are connected; and the sixth driving mechanism drives the high-voltage testing head to move up and down. The integrated testing device includes an integrated tester, an integrated testing head, and a seventh driving mechanism. With cooperation of all devices and mechanisms, high-voltage testing and integrated testing of the transformer can be completed automatically and rapidly; inferior-quality products can be collected and categorized automatically; manpower wasting can be effectively reduced; the working efficiency can be substantially improved; and the economical benefits of the enterprises can be enhanced. Moreover, the automatic testing device has advantages of simple and compact structure, low cost, and convenient operation.
Description
Technical field
The present invention relates to transformer production art, refer in particular to a kind of transformer automatic test device.
Background technology
Transformer (Transformer) utilizes the principle of electromagnetic induction to change the device of alternating voltage, and main member is primary coil, secondary coil and iron core (magnetic core).Major function has: voltage transformation, current transformation, impedance transformation, isolation, voltage stabilizing (magnetic saturation transformer) etc.Can be divided into by purposes: power transformer and special transformer (electric furnace change, rectification change, power frequency testing transformer, pressure regulator, mining change, audio-frequency transformer (AFT), I.F.T., high-frequency transformer, impact transformer, instrument transformer, electronic transformer, reactor, mutual inductor etc.).
At present, small-sized transformer usually needs to carry out Hi-pot test and integration test after completing making, only has and is only up-to-standard transformer by the transformer of Hi-pot test and integration test simultaneously.In prior art, all adopt for the Hi-pot test of transformer and integration test and manipulate measuring head manually and carry out, it is labor intensive not only, and efficiency is low.Therefore, be necessary to study a kind of equipment can testing transformer fast.
Summary of the invention
In view of this, the present invention is directed to the disappearance of prior art existence, its fundamental purpose is to provide a kind of transformer automatic test device, and it effectively can solve existing employing manual type test transformer and there is labor intensive, inefficient problem.
For achieving the above object, the present invention adopts following technical scheme:
A kind of transformer automatic test device, includes frame, high-voltage testing device and comprehensive test device;
This frame includes pedestal, horizontal stand and tilting table, this horizontal stand and tilting table are all arranged on pedestal, the surface of tilting table is arranged with deflector chute, deflector chute tilted upward extends, the upper end of deflector chute connects horizontal stand, the bottom of this tilting table is provided with substandard products disposable box, and tilting table is arranged at intervals with the first hole slot and the second hole slot, this first hole slot and the second hole slot are all communicated with between deflector chute and substandard products disposable box, the first baffle plate is provided with in this first hole slot, this first baffle plate drives back and forth movable by one first driving mechanism and opens or shutoff first hole slot, this the second hole slot is positioned at the downside of the first hole slot, second baffle is provided with in second hole slot, this second baffle drives back and forth movable by one second driving mechanism and opens or shutoff second hole slot, the first block is provided with in this deflector chute, second block and press block, this the first block is positioned at the upside of the first hole slot, first block is driven by the 3rd driving mechanism and stretches into or shift out deflector chute back and forth, this second block is between the first hole slot and the second hole slot, second block is driven by four-wheel drive mechanism and stretches into or shift out deflector chute back and forth, this press block is positioned at the upside of the first block, this press block is driven by the 5th driving mechanism and stretches into or shift out deflector chute back and forth,
This high-voltage testing device includes high voltage testing device, Hi-pot test head and the 6th driving mechanism, this high voltage testing device is arranged on pedestal, this Hi-pot test head can be arranged at directly over deflector chute up and downly and to be positioned at the side of the first block, Hi-pot test head is connected with high voltage testing device communication, and the 6th driving mechanism energizes high-pressure measuring head is up and down;
This comprehensive test device includes comprehensive tester, integration test head and the 7th driving mechanism, this comprehensive tester is arranged on pedestal, this integration test head can be arranged at directly over deflector chute up and downly and to be positioned at the side of the second block, integration test head is connected with comprehensive tester communication, and the 7th driving mechanism drives integration test up and down.
As a kind of preferred version, described deflector chute is coated with cover plate, this cover plate is provided with the second through hole of the first through hole for the probe insertion of Hi-pot test head and the probe insertion for integration test head.
As a kind of preferred version, described cover plate is transparent material.
As a kind of preferred version, described cover plate is provided with the first inductor and the second inductor, this first inductor is positioned at the top of the first baffle plate, and this second inductor is positioned at the top of second baffle.
As a kind of preferred version, be provided with the 3rd inductor and the 4th inductor in described deflector chute, the 3rd inductor is positioned at the side of the first block, and the 4th inductor is positioned at the side of the second block.
As a kind of preferred version, described first driving mechanism, the second driving mechanism, the 3rd driving mechanism, four-wheel drive mechanism, the 5th driving mechanism, the 6th driving mechanism and the 7th driving mechanism are cylinder.
The present invention compared with prior art has obvious advantage and beneficial effect, specifically, as shown from the above technical solution:
Each device and mechanism is utilized by coordinating, this equipment can complete Hi-pot test and integration test to transformer automatically rapidly, and automatically classification collection is carried out to substandard products, instead of the pure artificial mode of tradition, effectively reduce manpower and expend, substantially increase work efficiency, thus be beneficial to the raising of Business Economic Benefit, this simple and compact equipment structure, cost is low, easy to operate.
For more clearly setting forth architectural feature of the present invention and effect, below in conjunction with accompanying drawing and specific embodiment, the present invention is described in detail.
Accompanying drawing explanation
Fig. 1 is the structural representation of the preferred embodiment of the present invention;
Fig. 2 is the close-up schematic view in the preferred embodiment course of work of the present invention.
Accompanying drawing identifier declaration:
10, frame 11, pedestal
12, horizontal stand 13, tilting table
14, cover plate 101, deflector chute
102, the first hole slot 103, second hole slot
104, the first through hole 105, second through hole
20, high-voltage testing device 21, high voltage testing device
22, Hi-pot test 221, probe
23, the 6th driving mechanism 30, comprehensive test device
31, comprehensive tester 32, integration test head
321, probe 33, the 7th driving mechanism
41, substandard products disposable box 42, first baffle plate
43, the first driving mechanism 44, second baffle
45, the second driving mechanism 46, first block
47, the second block 48, press block
49, the 3rd driving mechanism 51, four-wheel drive mechanism
52, the 5th driving mechanism 53, first inductor
54, the second inductor 55, the 3rd inductor
56, the 4th inductor 60, transformer.
Embodiment
Please refer to shown in Fig. 1 to Fig. 2, that show the concrete structure of the preferred embodiment of the present invention, include frame 10, high-voltage testing device 20 and comprehensive test device 30.
This frame 10 includes pedestal 11, horizontal stand 12 and tilting table 13, this horizontal stand 12 and tilting table 13 are all arranged on pedestal 11, the surface of tilting table 13 is arranged with deflector chute 101, deflector chute 101 tilted upward extends, the upper end of deflector chute 101 connects horizontal stand 12, the bottom of this tilting table 13 is provided with substandard products disposable box 41, and tilting table 13 is arranged at intervals with the first hole slot 102 and the second hole slot 103, this first hole slot 102 and the second hole slot 103 are all communicated with between deflector chute 101 and substandard products disposable box 41, the first baffle plate 42 is provided with in this first hole slot 102, this first baffle plate 42 drives back and forth movable by one first driving mechanism 43 and opens or shutoff first hole slot 102, this second hole slot 103 is positioned at the downside of the first hole slot 102, second baffle 44 is provided with in second hole slot 103, this second baffle 44 drives back and forth movable by one second driving mechanism 45 and opens or shutoff second hole slot 103, the first block 46 is provided with in this deflector chute 101, second block 47 and press block 48, this first block 46 is positioned at the upside of the first hole slot 102, first block 46 is driven by the 3rd driving mechanism 49 and stretches into or shift out deflector chute 101 back and forth, this second block 47 is between the first hole slot 102 and the second hole slot 103, second block 47 is driven by four-wheel drive mechanism 51 and stretches into or shift out deflector chute 101 back and forth, this press block 48 is positioned at the upside of the first block 46, this press block 48 is driven by the 5th driving mechanism 52 and stretches into back and forth or shift out deflector chute 101.
This high-voltage testing device 20 includes high voltage testing device 21, Hi-pot test 22 and the 6th driving mechanism 23, this high voltage testing device 21 is arranged on pedestal 11, this Hi-pot test 22 can be arranged at directly over deflector chute 101 up and downly and to be positioned at the side of the first block 46, Hi-pot test 22 is connected with high voltage testing device 21 communication, and the 6th driving mechanism 23 energizes high-pressure measuring head 22 is up and down.
This comprehensive test device 30 includes comprehensive tester 31, integration test 32 and the 7th driving mechanism 33, this comprehensive tester 31 is arranged on pedestal 11, this integration test 32 can be arranged at directly over deflector chute 101 up and downly and to be positioned at the side of the second block 47, integration test 32 is connected with comprehensive tester 31 communication, and the 7th driving mechanism 33 drives integration test 32 up and down.
In the present embodiment, this deflector chute 101 is coated with cover plate 14, the second through hole 105 this cover plate 14 being provided with the first through hole 104 that the probe 221 for Hi-pot test 22 inserts and inserting for the probe 321 of integration test 32, and described cover plate 14 is transparent material.And this cover plate 14 is provided with the first inductor 53 and the second inductor 54, this first inductor 53 is positioned at the top of the first baffle plate 42, and this second inductor 54 is positioned at the top of second baffle 44.And, the 3rd inductor 55 and the 4th inductor 56 is provided with in described deflector chute 101,3rd inductor 55 is positioned at the side of the first block 46, whether the 3rd inductor 55 puts in place for sensing transformer 60,4th inductor 56 is positioned at the side of the second block 47, and whether the 4th inductor 56 puts in place for sensing transformer 60.
In addition, in the present embodiment, this first driving mechanism 43, second driving mechanism 45, the 3rd driving mechanism 49, four-wheel drive mechanism 51, the 5th driving mechanism 52, the 6th driving mechanism 23 and the 7th driving mechanism 33 are cylinder.
The course of work that the present embodiment is described in detail in detail is as follows:
During work, transformer 60 is placed on horizontal stand 12, then artificial transformer 60 is sent in deflector chute 101, under gravity, multiple transformer 60 is close to and slips in deflector chute 101, be arranged in primary transformer 60 first to be blocked by the first block 46, then, moved down by the 6th driving mechanism 23 energizes high-pressure measuring head 22, on the correspondence position probe 221 of Hi-pot test 22 being inserted be arranged in the transformer 60 of first, conducting connects, now high voltage testing device 21 pairs of transformers 60 carry out Hi-pot test, after having tested, when driving press block 48 to stretch in deflector chute 101 by the 5th driving mechanism 52, deputy transformer 60 is arranged in make press block 48 push down, then, the first block 46 is driven to shift out deflector chute 101 by the 3rd driving mechanism 49, meanwhile, if be arranged in primary transformer 60 not by Hi-pot test, then drive the first baffle plate 42 movable by the first driving mechanism 43 and open the first hole slot 102, now, be arranged in primary transformer 60 movable downwards and fallen in substandard products disposable box 41 by the first hole slot 102 and collect along deflector chute 101, if be arranged in primary transformer 60 to pass through Hi-pot test, then the first baffle plate 42 keep motionless and and shutoff first hole slot 102, now, be arranged in primary transformer 60 movable to the second block 44 along deflector chute 101 downwards, continue in the process of sliding downwards at first transformer 60, 3rd driving mechanism 49 drives the first block 46 to stretch into deflector chute 101, then, press block 48 is driven to shift out deflector chute 101 by the 5th driving mechanism 52, slide to the first block 46 to make being arranged in deputy second transformer 60 and blocked by the first block 46, then, repeat above-mentioned action and Hi-pot test is carried out to second transformer 60.Meanwhile, 7th driving mechanism 33 drives integration test 32 activity downwards, on the correspondence position probe 321 of integration test 32 being inserted be arranged in the transformer 60 of first, conducting connects, now comprehensive tester 31 carries out integration test to primary transformer 60, after having tested, the second block 47 is driven to shift out deflector chute 101 by four-wheel drive mechanism 51, meanwhile, if be arranged in primary transformer 60 not by integration test, then drive second baffle 44 movable by the second driving mechanism 45 and open the second hole slot 103, now, be arranged in primary transformer 60 movable downwards and fallen in substandard products disposable box 41 by the second hole slot 103 and collect along deflector chute 101, if be arranged in primary transformer 60 to pass through integration test, then second baffle 44 keep motionless and and shutoff second hole slot 103, now, be arranged in primary transformer 60 to skid off along deflector chute 101 and complete high pressure and integration test, the product test exported from deflector chute 101 is qualified, then above-mentioned action is repeated, constantly high pressure and integration test are carried out to product.
Design focal point of the present invention is: utilize each device and mechanism by coordinating, this equipment can complete Hi-pot test and integration test to transformer automatically rapidly, and automatically classification collection is carried out to substandard products, instead of the pure artificial mode of tradition, effectively reduce manpower and expend, substantially increase work efficiency, thus be beneficial to the raising of Business Economic Benefit, this simple and compact equipment structure, cost is low, easy to operate.
The above, it is only preferred embodiment of the present invention, not technical scope of the present invention is imposed any restrictions, thus every above embodiment is done according to technical spirit of the present invention any trickle amendment, equivalent variations and modification, all still belong in the scope of technical solution of the present invention.
Claims (6)
1. a transformer automatic test device, is characterized in that: include frame, high-voltage testing device and comprehensive test device;
This frame includes pedestal, horizontal stand and tilting table, this horizontal stand and tilting table are all arranged on pedestal, the surface of tilting table is arranged with deflector chute, deflector chute tilted upward extends, the upper end of deflector chute connects horizontal stand, the bottom of this tilting table is provided with substandard products disposable box, and tilting table is arranged at intervals with the first hole slot and the second hole slot, this first hole slot and the second hole slot are all communicated with between deflector chute and substandard products disposable box, the first baffle plate is provided with in this first hole slot, this first baffle plate drives back and forth movable by one first driving mechanism and opens or shutoff first hole slot, this the second hole slot is positioned at the downside of the first hole slot, second baffle is provided with in second hole slot, this second baffle drives back and forth movable by one second driving mechanism and opens or shutoff second hole slot, the first block is provided with in this deflector chute, second block and press block, this the first block is positioned at the upside of the first hole slot, first block is driven by the 3rd driving mechanism and stretches into or shift out deflector chute back and forth, this second block is between the first hole slot and the second hole slot, second block is driven by four-wheel drive mechanism and stretches into or shift out deflector chute back and forth, this press block is positioned at the upside of the first block, this press block is driven by the 5th driving mechanism and stretches into or shift out deflector chute back and forth,
This high-voltage testing device includes high voltage testing device, Hi-pot test head and the 6th driving mechanism, this high voltage testing device is arranged on pedestal, this Hi-pot test head can be arranged at directly over deflector chute up and downly and to be positioned at the side of the first block, Hi-pot test head is connected with high voltage testing device communication, and the 6th driving mechanism energizes high-pressure measuring head is up and down;
This comprehensive test device includes comprehensive tester, integration test head and the 7th driving mechanism, this comprehensive tester is arranged on pedestal, this integration test head can be arranged at directly over deflector chute up and downly and to be positioned at the side of the second block, integration test head is connected with comprehensive tester communication, and the 7th driving mechanism drives integration test up and down.
2. transformer automatic test device according to claim 1, is characterized in that: described deflector chute is coated with cover plate, this cover plate is provided with the second through hole of the first through hole for the probe insertion of Hi-pot test head and the probe insertion for integration test head.
3. transformer automatic test device according to claim 2, is characterized in that: described cover plate is transparent material.
4. transformer automatic test device according to claim 2, is characterized in that: described cover plate is provided with the first inductor and the second inductor, this first inductor is positioned at the top of the first baffle plate, and this second inductor is positioned at the top of second baffle.
5. transformer automatic test device according to claim 1, is characterized in that: be provided with the 3rd inductor and the 4th inductor in described deflector chute, the 3rd inductor is positioned at the side of the first block, and the 4th inductor is positioned at the side of the second block.
6. transformer automatic test device according to claim 1, is characterized in that: described first driving mechanism, the second driving mechanism, the 3rd driving mechanism, four-wheel drive mechanism, the 5th driving mechanism, the 6th driving mechanism and the 7th driving mechanism are cylinder.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510587142.7A CN105182133A (en) | 2015-09-16 | 2015-09-16 | Automatic testing device of transformer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510587142.7A CN105182133A (en) | 2015-09-16 | 2015-09-16 | Automatic testing device of transformer |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN105182133A true CN105182133A (en) | 2015-12-23 |
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ID=54904348
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510587142.7A Pending CN105182133A (en) | 2015-09-16 | 2015-09-16 | Automatic testing device of transformer |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN105182133A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105823952A (en) * | 2016-05-09 | 2016-08-03 | 东莞市博展机械科技有限公司 | Transformer test machine |
| CN114273266A (en) * | 2021-12-24 | 2022-04-05 | 东莞高信电子有限公司 | Circuit detection device and method for single-layer circuit board |
Citations (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB806795A (en) * | 1955-11-23 | 1958-12-31 | Western Electric Co | Improvements in or relating to apparatus for testing transistors |
| JPS5527955A (en) * | 1978-08-18 | 1980-02-28 | Matsushita Electric Ind Co Ltd | Electronic parts inspecting device |
| US5902178A (en) * | 1996-03-27 | 1999-05-11 | Mag-Nif Incorporated | Coin sorting apparatus |
| JP3310522B2 (en) * | 1996-01-16 | 2002-08-05 | 株式会社日立エンジニアリングサービス | On-site support tool for automatic testing of static and dynamic characteristics of AVR |
| US20070005287A1 (en) * | 2005-06-24 | 2007-01-04 | Innolux Display Corp. | Automatic hi-pot test appartus and method |
| CN201285424Y (en) * | 2008-10-23 | 2009-08-05 | 巧橡科技有限公司 | Fast detaching type probe test apparatus |
| CN201449427U (en) * | 2009-07-08 | 2010-05-05 | 东莞创慈磁性元件有限公司 | Three-in-one automatic tester for transformer |
| CN101819247A (en) * | 2010-05-17 | 2010-09-01 | 曹旭阳 | Device for automatically detecting high pressure resistance and electric function of electronic component product |
| CN201654184U (en) * | 2010-04-13 | 2010-11-24 | 清远市佳的美电子科技有限公司 | Testing device for core board of electronic product |
| CN201855812U (en) * | 2010-05-17 | 2011-06-08 | 曹旭阳 | Device capable of automatically detecting high-voltage resistance and electric function of electronic assembly products |
| CN202421374U (en) * | 2011-12-27 | 2012-09-05 | 赣州市超越精密电子有限公司 | Three-in-one slope automatic test machine |
| CN102854441A (en) * | 2012-08-30 | 2013-01-02 | 青岛友结意电子有限公司 | Automatic flow line type inspection integrated equipment for connector |
| CN203037824U (en) * | 2012-09-29 | 2013-07-03 | 珠海科斯特电源有限公司 | Cell automatic test device |
| CN203037817U (en) * | 2012-12-21 | 2013-07-03 | 彩虹集团公司 | High power LED lighting testing device |
| CN203778365U (en) * | 2014-04-10 | 2014-08-20 | 厦门赛特勒磁电有限公司 | Automatic comprehensive test machine for sealed transformer |
| CN204613320U (en) * | 2015-03-17 | 2015-09-02 | 赣州市超越精密电子有限公司 | Automatic test all-in-one machine |
| CN205027832U (en) * | 2015-09-16 | 2016-02-10 | 东莞联宝光电科技有限公司 | Transformer automatic testing device |
-
2015
- 2015-09-16 CN CN201510587142.7A patent/CN105182133A/en active Pending
Patent Citations (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB806795A (en) * | 1955-11-23 | 1958-12-31 | Western Electric Co | Improvements in or relating to apparatus for testing transistors |
| JPS5527955A (en) * | 1978-08-18 | 1980-02-28 | Matsushita Electric Ind Co Ltd | Electronic parts inspecting device |
| JP3310522B2 (en) * | 1996-01-16 | 2002-08-05 | 株式会社日立エンジニアリングサービス | On-site support tool for automatic testing of static and dynamic characteristics of AVR |
| US5902178A (en) * | 1996-03-27 | 1999-05-11 | Mag-Nif Incorporated | Coin sorting apparatus |
| US20070005287A1 (en) * | 2005-06-24 | 2007-01-04 | Innolux Display Corp. | Automatic hi-pot test appartus and method |
| CN201285424Y (en) * | 2008-10-23 | 2009-08-05 | 巧橡科技有限公司 | Fast detaching type probe test apparatus |
| CN201449427U (en) * | 2009-07-08 | 2010-05-05 | 东莞创慈磁性元件有限公司 | Three-in-one automatic tester for transformer |
| CN201654184U (en) * | 2010-04-13 | 2010-11-24 | 清远市佳的美电子科技有限公司 | Testing device for core board of electronic product |
| CN101819247A (en) * | 2010-05-17 | 2010-09-01 | 曹旭阳 | Device for automatically detecting high pressure resistance and electric function of electronic component product |
| CN201855812U (en) * | 2010-05-17 | 2011-06-08 | 曹旭阳 | Device capable of automatically detecting high-voltage resistance and electric function of electronic assembly products |
| CN202421374U (en) * | 2011-12-27 | 2012-09-05 | 赣州市超越精密电子有限公司 | Three-in-one slope automatic test machine |
| CN102854441A (en) * | 2012-08-30 | 2013-01-02 | 青岛友结意电子有限公司 | Automatic flow line type inspection integrated equipment for connector |
| CN203037824U (en) * | 2012-09-29 | 2013-07-03 | 珠海科斯特电源有限公司 | Cell automatic test device |
| CN203037817U (en) * | 2012-12-21 | 2013-07-03 | 彩虹集团公司 | High power LED lighting testing device |
| CN203778365U (en) * | 2014-04-10 | 2014-08-20 | 厦门赛特勒磁电有限公司 | Automatic comprehensive test machine for sealed transformer |
| CN204613320U (en) * | 2015-03-17 | 2015-09-02 | 赣州市超越精密电子有限公司 | Automatic test all-in-one machine |
| CN205027832U (en) * | 2015-09-16 | 2016-02-10 | 东莞联宝光电科技有限公司 | Transformer automatic testing device |
Non-Patent Citations (1)
| Title |
|---|
| 高成 等: "《传感器与检测技术》", 31 August 2015, 北京：机械工业出版社 * |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105823952A (en) * | 2016-05-09 | 2016-08-03 | 东莞市博展机械科技有限公司 | Transformer test machine |
| CN114273266A (en) * | 2021-12-24 | 2022-04-05 | 东莞高信电子有限公司 | Circuit detection device and method for single-layer circuit board |
| CN114273266B (en) * | 2021-12-24 | 2024-05-24 | 东莞高信电子有限公司 | Circuit detection device and method for single-layer circuit board |
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Application publication date: 20151223 |