JPS57167632A - Surface treating method for semiconductor substrate - Google Patents
Surface treating method for semiconductor substrateInfo
- Publication number
- JPS57167632A JPS57167632A JP56043806A JP4380681A JPS57167632A JP S57167632 A JPS57167632 A JP S57167632A JP 56043806 A JP56043806 A JP 56043806A JP 4380681 A JP4380681 A JP 4380681A JP S57167632 A JPS57167632 A JP S57167632A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- gas
- ions
- torr
- plasma
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Formation Of Insulating Films (AREA)
Abstract
PURPOSE:To treat the surface of the substrate without using a noxious gas by exposing the surface to the plasma of a compound containing Cl and thermally oxidizing the surface in a method making Cl<-> ions contaon into SiO2. CONSTITUTION:Parallel slat electrodes 1, 2 connected to a high-frequency power supply 3 and the Si substrate 4 arranged onto the electrode 1 are disposed into a reaction chamber. An indoor atmosphere is the mixed gas of a gas such as the O2 of 1 Torr and a gas such as the CCl2F2 of 0.01 Torr. When the high- frequency power of 13.56MHz and 500W is applied to the electrodes 1, 2 by the power supply 3, the mixed gas is changed into plasma, and Cl<-> ions are adsorbed onto the surface of the Si substrate. When the surface is exposed for approximately one min. under said condition and thermally oxidized through a normal method, SiO2 containing Cl<-> ions is formed onto the surface of the Si substrate.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56043806A JPS57167632A (en) | 1981-03-25 | 1981-03-25 | Surface treating method for semiconductor substrate |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56043806A JPS57167632A (en) | 1981-03-25 | 1981-03-25 | Surface treating method for semiconductor substrate |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS57167632A true JPS57167632A (en) | 1982-10-15 |
JPS6313341B2 JPS6313341B2 (en) | 1988-03-25 |
Family
ID=12673979
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56043806A Granted JPS57167632A (en) | 1981-03-25 | 1981-03-25 | Surface treating method for semiconductor substrate |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57167632A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59119841A (en) * | 1982-12-27 | 1984-07-11 | Fujitsu Ltd | Manufacture of semiconductor device |
-
1981
- 1981-03-25 JP JP56043806A patent/JPS57167632A/en active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59119841A (en) * | 1982-12-27 | 1984-07-11 | Fujitsu Ltd | Manufacture of semiconductor device |
Also Published As
Publication number | Publication date |
---|---|
JPS6313341B2 (en) | 1988-03-25 |
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