JPS6421925A - Resist removing method - Google Patents

Resist removing method

Info

Publication number
JPS6421925A
JPS6421925A JP17700387A JP17700387A JPS6421925A JP S6421925 A JPS6421925 A JP S6421925A JP 17700387 A JP17700387 A JP 17700387A JP 17700387 A JP17700387 A JP 17700387A JP S6421925 A JPS6421925 A JP S6421925A
Authority
JP
Japan
Prior art keywords
resist
substrate
gas
electric field
projected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17700387A
Other languages
Japanese (ja)
Inventor
Masayoshi Saito
Norio Hasegawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP17700387A priority Critical patent/JPS6421925A/en
Publication of JPS6421925A publication Critical patent/JPS6421925A/en
Pending legal-status Critical Current

Links

Landscapes

  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)
  • Drying Of Semiconductors (AREA)

Abstract

PURPOSE:To exclude the problem of contamination due to movable ions, by heating resist on a substrate, supplying a gas including oxygen, projecting ultraviolet rays on the resist or the gas, and applying a DC electric field directed toward the resist applied surface from the center of the substrate. CONSTITUTION:Resist 1, which is applied on a substrate 1, is heated. A gas including oxygen is made to flow in a space, in which the substrate 2 is placed. Ultraviolet rays are projected at least on the resist 1 or said gas. A DC electric field directed toward the resist applied surface from the center of the substrate is applied. For example, the Si substrate 2 having SiO2 of 20nm, on which the photoresist film 1 is applied to a thickness of 1mum, is arranged in a quartz chamber 3. Electrodes 4 and 5 are provided. The electric field of 1V/cm is applied. A heater is enclosed in the electrode 4. Oxygen including 5% ozone is made to flow at the substrate temperature of 200 deg.C. Light from a high luminance ultraviolet-ray lamp is projected. Thus the resist is removed. Since the mixing of movable ions can be prevented in this way, a MOS element, whose movable ion density is 5X10<9> pieces/cm<2> or less can be obtained.
JP17700387A 1987-07-17 1987-07-17 Resist removing method Pending JPS6421925A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17700387A JPS6421925A (en) 1987-07-17 1987-07-17 Resist removing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17700387A JPS6421925A (en) 1987-07-17 1987-07-17 Resist removing method

Publications (1)

Publication Number Publication Date
JPS6421925A true JPS6421925A (en) 1989-01-25

Family

ID=16023473

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17700387A Pending JPS6421925A (en) 1987-07-17 1987-07-17 Resist removing method

Country Status (1)

Country Link
JP (1) JPS6421925A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02127648A (en) * 1988-11-08 1990-05-16 Matsushita Electric Ind Co Ltd Production of master disk for optical disk
JPH04230018A (en) * 1990-12-27 1992-08-19 Orc Mfg Co Ltd Photo-ashing device of photoresist
JP2007287645A (en) * 2006-03-22 2007-11-01 Furukawa Electric Co Ltd:The Grommet
CN110275389A (en) * 2018-03-16 2019-09-24 三星电子株式会社 The method for manufacturing integrated circuit device

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02127648A (en) * 1988-11-08 1990-05-16 Matsushita Electric Ind Co Ltd Production of master disk for optical disk
JPH04230018A (en) * 1990-12-27 1992-08-19 Orc Mfg Co Ltd Photo-ashing device of photoresist
JP2007287645A (en) * 2006-03-22 2007-11-01 Furukawa Electric Co Ltd:The Grommet
CN110275389A (en) * 2018-03-16 2019-09-24 三星电子株式会社 The method for manufacturing integrated circuit device

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