JPS57161504A - Measuring device for thickness of pipe - Google Patents

Measuring device for thickness of pipe

Info

Publication number
JPS57161504A
JPS57161504A JP4648481A JP4648481A JPS57161504A JP S57161504 A JPS57161504 A JP S57161504A JP 4648481 A JP4648481 A JP 4648481A JP 4648481 A JP4648481 A JP 4648481A JP S57161504 A JPS57161504 A JP S57161504A
Authority
JP
Japan
Prior art keywords
pipe
thetaa
deltar
transmission
axis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4648481A
Other languages
English (en)
Japanese (ja)
Other versions
JPS632325B2 (OSRAM
Inventor
Shinya Tanifuji
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP4648481A priority Critical patent/JPS57161504A/ja
Publication of JPS57161504A publication Critical patent/JPS57161504A/ja
Publication of JPS632325B2 publication Critical patent/JPS632325B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP4648481A 1981-03-31 1981-03-31 Measuring device for thickness of pipe Granted JPS57161504A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4648481A JPS57161504A (en) 1981-03-31 1981-03-31 Measuring device for thickness of pipe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4648481A JPS57161504A (en) 1981-03-31 1981-03-31 Measuring device for thickness of pipe

Publications (2)

Publication Number Publication Date
JPS57161504A true JPS57161504A (en) 1982-10-05
JPS632325B2 JPS632325B2 (OSRAM) 1988-01-18

Family

ID=12748476

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4648481A Granted JPS57161504A (en) 1981-03-31 1981-03-31 Measuring device for thickness of pipe

Country Status (1)

Country Link
JP (1) JPS57161504A (OSRAM)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5247980A (en) * 1985-08-19 1993-09-28 Okamoto Industries, Inc. Anti-skid net body attachment for an automobile tire
JP2008076072A (ja) * 2006-09-19 2008-04-03 Hitachi Engineering & Services Co Ltd 表面が被覆された円筒部材の表面錆検出方法及びその装置
JP2008076074A (ja) * 2006-09-19 2008-04-03 Hitachi Engineering & Services Co Ltd 表面が被覆された円筒部材の表面錆検査方法及びその装置
JP2011501191A (ja) * 2007-10-25 2011-01-06 ゼネラル・エレクトリック・カンパニイ 流量測定システムの取り付け寸法を測定するシステム及び方法

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5247980A (en) * 1985-08-19 1993-09-28 Okamoto Industries, Inc. Anti-skid net body attachment for an automobile tire
US5343610A (en) * 1985-08-19 1994-09-06 Okamoto Industries, Inc. Method of making an anti-skid apparatus for an automobile tire
JP2008076072A (ja) * 2006-09-19 2008-04-03 Hitachi Engineering & Services Co Ltd 表面が被覆された円筒部材の表面錆検出方法及びその装置
JP2008076074A (ja) * 2006-09-19 2008-04-03 Hitachi Engineering & Services Co Ltd 表面が被覆された円筒部材の表面錆検査方法及びその装置
JP2011501191A (ja) * 2007-10-25 2011-01-06 ゼネラル・エレクトリック・カンパニイ 流量測定システムの取り付け寸法を測定するシステム及び方法

Also Published As

Publication number Publication date
JPS632325B2 (OSRAM) 1988-01-18

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