JPS57505A - Measuring device for extent of eccentricity - Google Patents

Measuring device for extent of eccentricity

Info

Publication number
JPS57505A
JPS57505A JP7460780A JP7460780A JPS57505A JP S57505 A JPS57505 A JP S57505A JP 7460780 A JP7460780 A JP 7460780A JP 7460780 A JP7460780 A JP 7460780A JP S57505 A JPS57505 A JP S57505A
Authority
JP
Japan
Prior art keywords
light beam
detector
eccentricity
extent
intercepted
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7460780A
Other languages
Japanese (ja)
Inventor
Yoshimasa Fujiwara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Electric Works Co Ltd
Original Assignee
Matsushita Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Works Ltd filed Critical Matsushita Electric Works Ltd
Priority to JP7460780A priority Critical patent/JPS57505A/en
Publication of JPS57505A publication Critical patent/JPS57505A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • G01B11/27—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
    • G01B11/272—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes using photoelectric detection means

Abstract

PURPOSE:To measure an extent of eccentricity of an object even when it has a noncircular cross section by outputting a position of the center of gravity of the remainder of light beams intercepted with two edges of the object to be measured as an electrical signal with a position detector. CONSTITUTION:Since light beam P is intercepted partly with an edge part 9a of object 9, it produces light beam p' at a detector 2 corresponding to it. Further for a light beam Q a light beam q passing through an optical system 3 is intercepted at the other edge part 9b of the object 9 to produce a light beam q' and a detecting position of the detector 2 becomes the center of gravity of the width of light flux determined by the light beams p', q'. When the object 9 is eccentric, the extent of eccentricity is detected with the detector 2.
JP7460780A 1980-05-31 1980-05-31 Measuring device for extent of eccentricity Pending JPS57505A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7460780A JPS57505A (en) 1980-05-31 1980-05-31 Measuring device for extent of eccentricity

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7460780A JPS57505A (en) 1980-05-31 1980-05-31 Measuring device for extent of eccentricity

Publications (1)

Publication Number Publication Date
JPS57505A true JPS57505A (en) 1982-01-05

Family

ID=13552020

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7460780A Pending JPS57505A (en) 1980-05-31 1980-05-31 Measuring device for extent of eccentricity

Country Status (1)

Country Link
JP (1) JPS57505A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6148024A (en) * 1984-08-14 1986-03-08 Fujitsu Ten Ltd Bidirectional matrix device
JPS6227396U (en) * 1985-07-31 1987-02-19
JPS6348403A (en) * 1986-08-19 1988-03-01 Matsushita Electric Ind Co Ltd Displacement detecting device
JPH04232407A (en) * 1990-12-28 1992-08-20 Seikosha Co Ltd Inspecting method of tool

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6148024A (en) * 1984-08-14 1986-03-08 Fujitsu Ten Ltd Bidirectional matrix device
JPH0255807B2 (en) * 1984-08-14 1990-11-28 Fujitsu Ten Ltd
JPS6227396U (en) * 1985-07-31 1987-02-19
JPS6348403A (en) * 1986-08-19 1988-03-01 Matsushita Electric Ind Co Ltd Displacement detecting device
JPH04232407A (en) * 1990-12-28 1992-08-20 Seikosha Co Ltd Inspecting method of tool

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