JPS6454210A - Thickness measuring device - Google Patents

Thickness measuring device

Info

Publication number
JPS6454210A
JPS6454210A JP20933487A JP20933487A JPS6454210A JP S6454210 A JPS6454210 A JP S6454210A JP 20933487 A JP20933487 A JP 20933487A JP 20933487 A JP20933487 A JP 20933487A JP S6454210 A JPS6454210 A JP S6454210A
Authority
JP
Japan
Prior art keywords
plane
calculated
thickness
radioactive rays
inclination
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP20933487A
Other languages
Japanese (ja)
Inventor
Shintaro Shimada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kobe Steel Ltd
Original Assignee
Kobe Steel Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kobe Steel Ltd filed Critical Kobe Steel Ltd
Priority to JP20933487A priority Critical patent/JPS6454210A/en
Publication of JPS6454210A publication Critical patent/JPS6454210A/en
Pending legal-status Critical Current

Links

Landscapes

  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)

Abstract

PURPOSE:To make it possible to measure the thickness of an object when the plane of the object is not orthogonal to measuring radioactive rays, by calculating angles defined by a straight light connecting the source of the radioactive rays and a detector for radioactive rays and, the object, and correcting the calculated thickness of the object based on the above-calculated angles. CONSTITUTION:In order to find the inclination of the plane of an object 1 to be measured, distances between the plane of the object 1 and many points on an optionally-fixed plane are obtained by distance measuring means 4-7. From the above distances, the inclination of the plane of the object 1 is calculated by an angle calculating means 8. Thereafter, the increasing rate of the passing length of the radioactive rays is calculated in a correction calculating means 10 on the basis of the calculated inclination of the plane of the object 1. The calculated value of the thickness obtained in a thickness calculating means 9 is then corrected by the use of the increasing rate.
JP20933487A 1987-08-25 1987-08-25 Thickness measuring device Pending JPS6454210A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP20933487A JPS6454210A (en) 1987-08-25 1987-08-25 Thickness measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20933487A JPS6454210A (en) 1987-08-25 1987-08-25 Thickness measuring device

Publications (1)

Publication Number Publication Date
JPS6454210A true JPS6454210A (en) 1989-03-01

Family

ID=16571227

Family Applications (1)

Application Number Title Priority Date Filing Date
JP20933487A Pending JPS6454210A (en) 1987-08-25 1987-08-25 Thickness measuring device

Country Status (1)

Country Link
JP (1) JPS6454210A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0571452U (en) * 1992-03-09 1993-09-28 新日本製鐵株式会社 Constant velocity rotary drive transmission device
JP2016191684A (en) * 2015-03-31 2016-11-10 株式会社東芝 Thickness measurement device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0571452U (en) * 1992-03-09 1993-09-28 新日本製鐵株式会社 Constant velocity rotary drive transmission device
JP2016191684A (en) * 2015-03-31 2016-11-10 株式会社東芝 Thickness measurement device

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