JPS524257A - Physical factor measuring system - Google Patents

Physical factor measuring system

Info

Publication number
JPS524257A
JPS524257A JP8063275A JP8063275A JPS524257A JP S524257 A JPS524257 A JP S524257A JP 8063275 A JP8063275 A JP 8063275A JP 8063275 A JP8063275 A JP 8063275A JP S524257 A JPS524257 A JP S524257A
Authority
JP
Japan
Prior art keywords
light
measuring system
physical factor
factor measuring
thickness
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8063275A
Other languages
Japanese (ja)
Other versions
JPS566482B2 (en
Inventor
Nobuyoshi Tanaka
Naoki Ayada
Mitsuo Takeda
Susumu Matsumura
Kazuya Matsumoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP8063275A priority Critical patent/JPS524257A/en
Publication of JPS524257A publication Critical patent/JPS524257A/en
Publication of JPS566482B2 publication Critical patent/JPS566482B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

PURPOSE: A light beam with a thickness of the wave length illuminates the measured object. The reflection light and basic piece reflection light located in the light path divided by the light divider of the multi wave cross meter are used to measure the thickness or reflection factor. In this system, the light length does not need to be widely changed even for thick objects.
COPYRIGHT: (C)1977,JPO&Japio
JP8063275A 1975-06-28 1975-06-28 Physical factor measuring system Granted JPS524257A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8063275A JPS524257A (en) 1975-06-28 1975-06-28 Physical factor measuring system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8063275A JPS524257A (en) 1975-06-28 1975-06-28 Physical factor measuring system

Publications (2)

Publication Number Publication Date
JPS524257A true JPS524257A (en) 1977-01-13
JPS566482B2 JPS566482B2 (en) 1981-02-12

Family

ID=13723727

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8063275A Granted JPS524257A (en) 1975-06-28 1975-06-28 Physical factor measuring system

Country Status (1)

Country Link
JP (1) JPS524257A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53108051A (en) * 1977-03-03 1978-09-20 Vni Pk I Chiefunorogiichiesuki Plasma multiiarc welding method by dc current arc subject to heating all the time
JPH0373825A (en) * 1989-03-30 1991-03-28 Yokogawa Electric Corp Instrument for measuring refractive index of fluid

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53108051A (en) * 1977-03-03 1978-09-20 Vni Pk I Chiefunorogiichiesuki Plasma multiiarc welding method by dc current arc subject to heating all the time
JPH0373825A (en) * 1989-03-30 1991-03-28 Yokogawa Electric Corp Instrument for measuring refractive index of fluid

Also Published As

Publication number Publication date
JPS566482B2 (en) 1981-02-12

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