JPS524257A - Physical factor measuring system - Google Patents
Physical factor measuring systemInfo
- Publication number
- JPS524257A JPS524257A JP8063275A JP8063275A JPS524257A JP S524257 A JPS524257 A JP S524257A JP 8063275 A JP8063275 A JP 8063275A JP 8063275 A JP8063275 A JP 8063275A JP S524257 A JPS524257 A JP S524257A
- Authority
- JP
- Japan
- Prior art keywords
- light
- measuring system
- physical factor
- factor measuring
- thickness
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Investigating Or Analysing Materials By Optical Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
PURPOSE: A light beam with a thickness of the wave length illuminates the measured object. The reflection light and basic piece reflection light located in the light path divided by the light divider of the multi wave cross meter are used to measure the thickness or reflection factor. In this system, the light length does not need to be widely changed even for thick objects.
COPYRIGHT: (C)1977,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8063275A JPS524257A (en) | 1975-06-28 | 1975-06-28 | Physical factor measuring system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8063275A JPS524257A (en) | 1975-06-28 | 1975-06-28 | Physical factor measuring system |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS524257A true JPS524257A (en) | 1977-01-13 |
JPS566482B2 JPS566482B2 (en) | 1981-02-12 |
Family
ID=13723727
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8063275A Granted JPS524257A (en) | 1975-06-28 | 1975-06-28 | Physical factor measuring system |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS524257A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53108051A (en) * | 1977-03-03 | 1978-09-20 | Vni Pk I Chiefunorogiichiesuki | Plasma multiiarc welding method by dc current arc subject to heating all the time |
JPH0373825A (en) * | 1989-03-30 | 1991-03-28 | Yokogawa Electric Corp | Instrument for measuring refractive index of fluid |
-
1975
- 1975-06-28 JP JP8063275A patent/JPS524257A/en active Granted
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53108051A (en) * | 1977-03-03 | 1978-09-20 | Vni Pk I Chiefunorogiichiesuki | Plasma multiiarc welding method by dc current arc subject to heating all the time |
JPH0373825A (en) * | 1989-03-30 | 1991-03-28 | Yokogawa Electric Corp | Instrument for measuring refractive index of fluid |
Also Published As
Publication number | Publication date |
---|---|
JPS566482B2 (en) | 1981-02-12 |
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