JPS524256A - Physical factor measuring system - Google Patents
Physical factor measuring systemInfo
- Publication number
- JPS524256A JPS524256A JP8063175A JP8063175A JPS524256A JP S524256 A JPS524256 A JP S524256A JP 8063175 A JP8063175 A JP 8063175A JP 8063175 A JP8063175 A JP 8063175A JP S524256 A JPS524256 A JP S524256A
- Authority
- JP
- Japan
- Prior art keywords
- measuring system
- thickness
- physical factor
- factor measuring
- illuminates
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Abstract
PURPOSE: A light beam with a thickness of the wavelength illuminates the basic piece with thickness and reflection factor known. The reflection beam from the basic piece illuminates the measured object. In this system, thickness or reflection factor can be measured without widely changing the light path length in the case of a thick object.
COPYRIGHT: (C)1977,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8063175A JPS524256A (en) | 1975-06-28 | 1975-06-28 | Physical factor measuring system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8063175A JPS524256A (en) | 1975-06-28 | 1975-06-28 | Physical factor measuring system |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS524256A true JPS524256A (en) | 1977-01-13 |
JPS566481B2 JPS566481B2 (en) | 1981-02-12 |
Family
ID=13723696
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8063175A Granted JPS524256A (en) | 1975-06-28 | 1975-06-28 | Physical factor measuring system |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS524256A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5341205A (en) * | 1991-01-15 | 1994-08-23 | The United States Of America As Represented By The Secretary Of The Navy | Method for characterization of optical waveguide devices using partial coherence interferometry |
JP2008292296A (en) * | 2007-05-24 | 2008-12-04 | Toray Eng Co Ltd | Method for measuring film thickness of transparency film and its apparatus |
JP2008309638A (en) * | 2007-06-14 | 2008-12-25 | National Institute Of Advanced Industrial & Technology | Dimension measuring device and dimension measuring method |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20210041198A (en) | 2019-10-07 | 2021-04-15 | 주식회사 엘지화학 | Battery modules with mechanical connection structure between battery lead and busbar |
-
1975
- 1975-06-28 JP JP8063175A patent/JPS524256A/en active Granted
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5341205A (en) * | 1991-01-15 | 1994-08-23 | The United States Of America As Represented By The Secretary Of The Navy | Method for characterization of optical waveguide devices using partial coherence interferometry |
JP2008292296A (en) * | 2007-05-24 | 2008-12-04 | Toray Eng Co Ltd | Method for measuring film thickness of transparency film and its apparatus |
JP2008309638A (en) * | 2007-06-14 | 2008-12-25 | National Institute Of Advanced Industrial & Technology | Dimension measuring device and dimension measuring method |
Also Published As
Publication number | Publication date |
---|---|
JPS566481B2 (en) | 1981-02-12 |
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